T. S. Noggle
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 5
- Nuclear Physics and Applications 4
- Computational Mechanics top 2%
- Ion-surface interactions and analysis 26
- Structural Biology top 5%
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 9
- Condensed Matter Physics top 10%
- Crystallography and Radiation Phenomena 7
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- Integrated Circuits and Semiconductor Failure Analysis 8
- Silicon and Solar Cell Technologies 6
- Semiconductor materials and devices 6
T. S. Noggle
50 papers receiving 977 citations
Peers
Comparison fields: 5 of 53
- Radiation 231
- Computational Mechanics 528
- Structural Biology 32
- Surfaces, Coatings and Films 145
- Condensed Matter Physics 165
Countries citing papers authored by T. S. Noggle
This map shows the geographic impact of T. S. Noggle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. S. Noggle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. S. Noggle more than expected).
Fields of papers citing papers by T. S. Noggle
This network shows the impact of papers produced by T. S. Noggle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. S. Noggle. The network helps show where T. S. Noggle may publish in the future.
Co-authorship network
The 25 scholars most cited alongside T. S. Noggle, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1987 | 31 | |
| 2 | 1987 | 26 | |
| 3 | 1986 | 54 | |
| 4 | 1984 | 9 | |
| 5 | 1984 | 7 | |
| 6 | 1983 | 52 | |
| 7 | 1979 | 25 | |
| 8 | 1978 | 3 | |
| 9 | 1976 | 3 | |
| 10 | 1976 | 8 | |
| 11 | 1975 | 53 | |
| 12 | 1972 | 15 | |
| 13 | 1969 | 85 | |
| 14 | 1965 | 19 | |
| 15 | 1961 | 6 | |
| 16 | 1960 | 4 | |
| 17 | 1960 | 60 | |
| 18 | 1960 | 8 | |
| 19 | MECHANISM OF ANNEALING IN NEUTRON IRRADIATED METALS | 1957 | 1 |
| 20 | 1953 | 35 |
About T. S. Noggle
T. S. Noggle is a scholar working on Structural Biology, Computational Mechanics and Surfaces, Coatings and Films, having authored 50 papers that have together received 1.1k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (26 papers), Electron and X-Ray Spectroscopy Techniques (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Crystallography and Radiation Phenomena (7 papers), Silicon and Solar Cell Technologies (6 papers), Semiconductor materials and devices (6 papers), X-ray Spectroscopy and Fluorescence Analysis (5 papers) and Nuclear Physics and Applications (4 papers). The work is most often cited by research in Radiation (231 citations), Computational Mechanics (528 citations) and Structural Biology (32 citations). T. S. Noggle has collaborated with scholars based in United States, Germany and Japan. Frequent co-authors include B. R. Appleton, J.O. Stiegler, C. D. Moak, S. Datz, Dennis M. Mills, C. W. White, B. C. Larson, T. H. Blewitt, R. R. Coltman and H. O. Lutz. Their work appears in journals such as Journal of Applied Physics, Physical Review Letters, Review of Scientific Instruments, Journal of Nuclear Materials and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.