T. Ishii
- Electrical and Electronic Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Biomedical Engineering
- Surfaces, Coatings and Films top 10%
- Radiation top 10%
- Co-authors
- Toshiaki TamamuraTetsuya SuemitsuHirokazu TakenouchiYasuhisa ŌmuraK. IzumiSatοru NakashimaT. EnokiHiroshi Nozawa
- Topics
- Semiconductor materials and devices (13 papers)Photonic and Optical Devices (12 papers)Advancements in Photolithography Techniques (8 papers)
- Cited by
- Electrical and Electronic EngineeringStructural BiologyAtomic and Molecular Physics, and Optics
- Journals
- Applied Physics LettersIEEE Transactions on Electron DevicesJapanese Journal of Applied Physics
- Partner nations
- JapanUnited StatesNetherlands
In The Last Decade
T. Ishii
33 papers receiving 595 citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 554
- Atomic and Molecular Physics, and Optics 236
- Biomedical Engineering 115
- Surfaces, Coatings and Films 49
- Radiation 38
Countries citing papers authored by T. Ishii
This map shows the geographic impact of T. Ishii's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Ishii with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Ishii more than expected).
Fields of papers citing papers by T. Ishii
This network shows the impact of papers produced by T. Ishii. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Ishii. The network helps show where T. Ishii may publish in the future.
Co-authorship network of co-authors of T. Ishii
This figure shows the co-authorship network connecting the top 25 collaborators of T. Ishii. A scholar is included among the top collaborators of T. Ishii based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Ishii. T. Ishii is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 9 | |
| 2 | 1 | |
| 3 | 11 | |
| 4 | 1 | |
| 5 | 3 | |
| 6 | 2 | |
| 7 | 59 | |
| 8 | Gate and Recess Engineering for Ultrahigh-Speed InP-Based HEMTs | 9 |
| 9 | 11 | |
| 10 | 6 | |
| 11 | 72 | |
| 12 | 10 | |
| 13 | 45 | |
| 14 | 45 | |
| 15 | 4 | |
| 16 | 21 | |
| 17 | 41 | |
| 18 | 8 | |
| 19 | 35 | |
| 20 | 50 |
About T. Ishii
T. Ishii is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 34 papers that have together received 624 indexed citations. Recurring topics across this work include Semiconductor materials and devices (13 papers), Photonic and Optical Devices (12 papers) and Advancements in Photolithography Techniques (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (554 citations), Structural Biology (13 citations) and Atomic and Molecular Physics, and Optics (236 citations). T. Ishii has collaborated with scholars based in Japan, United States and Netherlands. Frequent co-authors include Toshiaki Tamamura, Tetsuya Suemitsu, Hirokazu Takenouchi, Yasuhisa Ōmura, K. Izumi, Satοru Nakashima, T. Enoki, Hiroshi Nozawa, Y. Ishii and Takashi Kurokawa. Their work appears in journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.