Stephen B. Soffer
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- Copper Interconnects and Reliability 6
- Magnetic Properties and Applications 2
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- Surface and Thin Film Phenomena 3
- Magnetic properties of thin films 2
- Gyrotron and Vacuum Electronics Research 1
- Force Microscopy Techniques and Applications 1
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- Semiconductor materials and devices 3
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- Advanced Surface Polishing Techniques 1
- Co-authors
- Emerson M. PughR. L. Huguenin
- Cited by
- Electronic, Optical and Magnetic MaterialsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Journals
- Journal of Applied Physics (2 papers)Journal of Low Temperature Physics (2 papers)Journal of Physics and Chemistry of Solids (1 paper)
- Partner nations
- SwitzerlandRussia
In The Last Decade
Stephen B. Soffer
10 papers receiving 428 citations
Peers
Comparison fields: 5 of 35
- Electronic, Optical and Magnetic Materials 248
- Atomic and Molecular Physics, and Optics 233
- Electrical and Electronic Engineering 254
- Condensed Matter Physics 50
- Mechanics of Materials 76
Countries citing papers authored by Stephen B. Soffer
This map shows the geographic impact of Stephen B. Soffer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephen B. Soffer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephen B. Soffer more than expected).
Fields of papers citing papers by Stephen B. Soffer
This network shows the impact of papers produced by Stephen B. Soffer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephen B. Soffer. The network helps show where Stephen B. Soffer may publish in the future.
Co-authorship network
The 2 scholars most cited alongside Stephen B. Soffer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1981 | 4 | |
| 2 | 1975 | 28 | |
| 3 | 1973 | 4 | |
| 4 | 1972 | 3 | |
| 5 | 1971 | 2 | |
| 6 | 1970 | 8 | |
| 7 | 1968 | 6 | |
| 8 | 1967 | 374 | |
| 9 | 1965 | 21 | |
| 10 | 1965 | 10 |
About Stephen B. Soffer
Stephen B. Soffer is a scholar working on Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Statistics, Probability and Uncertainty and Condensed Matter Physics, having authored 10 papers that have together received 460 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (6 papers), Surface and Thin Film Phenomena (3 papers), Semiconductor materials and devices (3 papers), Magnetic properties of thin films (2 papers), Magnetic Properties and Applications (2 papers), Gyrotron and Vacuum Electronics Research (1 paper), Force Microscopy Techniques and Applications (1 paper) and Advanced Surface Polishing Techniques (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (248 citations), Atomic and Molecular Physics, and Optics (233 citations), Electrical and Electronic Engineering (254 citations), Condensed Matter Physics (50 citations) and Mechanics of Materials (76 citations). Stephen B. Soffer has collaborated with scholars based in Switzerland and Russia. Frequent co-authors include Emerson M. Pugh and R. L. Huguenin. Their work appears in journals such as Journal of Applied Physics, Journal of Low Temperature Physics, Journal of Physics and Chemistry of Solids, Journal of Quality Technology and Physical review. B, Solid state.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.