S.T. de Zwart
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 14
- Media Technology top 2%
- Advanced Optical Imaging Technologies 8
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- Advanced Chemical Physics Studies 5
- Computational Mechanics top 5%
- Ion-surface interactions and analysis 8
- Surface Roughness and Optical Measurements 4
- Radiation top 5%
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- Semiconductor materials and devices 8
- Plasma Diagnostics and Applications 5
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- Visual perception and processing mechanisms 3
- Co-authors
- Bene PoelsemaGeorge ComşaA.L. BoersT. BallerJ. DielemanJ.C.S. KoolsOscar H. WillemsenT. Dekker
- Journals
- Journal of the Society for Information Display (5 papers)Applied Surface Science (3 papers)Journal of Applied Physics (3 papers)
- Partner nations
- NetherlandsFinlandGermany
In The Last Decade
S.T. de Zwart
39 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 58
- Surfaces, Coatings and Films 225
- Media Technology 148
- Atomic and Molecular Physics, and Optics 503
- Computational Mechanics 268
- Radiation 111
Countries citing papers authored by S.T. de Zwart
This map shows the geographic impact of S.T. de Zwart's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.T. de Zwart with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.T. de Zwart more than expected).
Fields of papers citing papers by S.T. de Zwart
This network shows the impact of papers produced by S.T. de Zwart. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.T. de Zwart. The network helps show where S.T. de Zwart may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S.T. de Zwart, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 17 | |
| 2 | 2008 | 65 | |
| 3 | 2007 | 23 | |
| 4 | 2006 | 3 | |
| 5 | 2006 | 24 | |
| 6 | 2005 | 25 | |
| 7 | 2005 | 1 | |
| 8 | 2003 | 18 | |
| 9 | 2002 | 2 | |
| 10 | 2002 | 66 | |
| 11 | 1997 | 13 | |
| 12 | 1996 | 8 | |
| 13 | 1996 | 18 | |
| 14 | 1996 | 12 | |
| 15 | 1996 | 8 | |
| 16 | 1989 | 79 | |
| 17 | 1988 | 3 | |
| 18 | 1986 | 57 | |
| 19 | 1985 | 2 | |
| 20 | 1982 | 114 |
About S.T. de Zwart
S.T. de Zwart is a scholar working on Surfaces, Coatings and Films, Media Technology and Human-Computer Interaction, having authored 40 papers that have together received 1.1k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (14 papers), Ion-surface interactions and analysis (8 papers), Advanced Optical Imaging Technologies (8 papers), Semiconductor materials and devices (8 papers), Advanced Chemical Physics Studies (5 papers), Plasma Diagnostics and Applications (5 papers), Surface Roughness and Optical Measurements (4 papers) and Visual perception and processing mechanisms (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (225 citations), Media Technology (148 citations) and Atomic and Molecular Physics, and Optics (503 citations). S.T. de Zwart has collaborated with scholars based in Netherlands, Finland and Germany. Frequent co-authors include Bene Poelsema, George Comşa, A.L. Boers, T. Baller, J. Dieleman, J.C.S. Kools, Oscar H. Willemsen, T. Dekker, A.G. Drentje and B.H.W. Hendriks. Their work appears in journals such as Journal of the Society for Information Display, Applied Surface Science, Journal of Applied Physics, Physical Review Letters and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.