G. Oversluizen

894 citations
49 papers · 720 indexed · h-index 16
Topics
Plasma Diagnostics and Applications (18 papers)Thin-Film Transistor Technologies (14 papers)Semiconductor materials and devices (11 papers)
Partner nations
NetherlandsJapanFinland

In The Last Decade

G. Oversluizen

47 papers receiving 691 citations

Peers

G. Oversluizen
Comparison fields: 5 of 83
  • Electrical and Electronic Engineering 525
  • Materials Chemistry 228
  • Radiology, Nuclear Medicine and Imaging 198
  • Condensed Matter Physics 108
  • Inorganic Chemistry 84
Replace Xufeng Wang with:
Xufeng Wang United States
Akihiro Ando Japan
Wayne M. Moreau United States
C. Khan Malek France
Hangbo Zhou Singapore
Mark A. Hartney United States
A. Yu. Nikiforov United States
G. Oversluizen relative to Xufeng Wang United States Xufeng Wang's profile →
Citations per field
00.5×7.9×
Xufeng Wang · 1×
Citations per year

Countries citing papers authored by G. Oversluizen

Since Specialization
Citations

This map shows the geographic impact of G. Oversluizen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Oversluizen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Oversluizen more than expected).

Fields of papers citing papers by G. Oversluizen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Oversluizen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Oversluizen. The network helps show where G. Oversluizen may publish in the future.

Co-authorship network of co-authors of G. Oversluizen

This figure shows the co-authorship network connecting the top 25 collaborators of G. Oversluizen. A scholar is included among the top collaborators of G. Oversluizen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Oversluizen. G. Oversluizen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 1
2 47
3 2
4 17
5 17
6 2
7 4
8 2
9 18
10
Low voltage drive of high Xe-content, high-efficiency PDPs
4
11 36
12 3
13 2
14 3
15 21
16 12
17 2
18 0
19 61
20 28

About G. Oversluizen

G. Oversluizen is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Ceramics and Composites, having authored 49 papers that have together received 720 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (18 papers), Thin-Film Transistor Technologies (14 papers) and Semiconductor materials and devices (11 papers). The work is most often cited by research in Condensed Matter Physics (108 citations), Electrical and Electronic Engineering (525 citations) and Radiology, Nuclear Medicine and Imaging (198 citations). G. Oversluizen has collaborated with scholars based in Netherlands, Japan and Finland. Frequent co-authors include T. Dekker, R. Metselaar, M. F. Gillies, J. Schoonman, M. Klein, Kees Wapenaar, S.T. de Zwart, Tomokazu Shiga, T.J. Vink and Carsten Sticht. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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