Shuhei Mitani

482 total citations
25 papers, 388 citations indexed

About

Shuhei Mitani is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Shuhei Mitani has authored 25 papers receiving a total of 388 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 8 papers in Electronic, Optical and Magnetic Materials and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Shuhei Mitani's work include Silicon Carbide Semiconductor Technologies (23 papers), Semiconductor materials and devices (20 papers) and Copper Interconnects and Reliability (8 papers). Shuhei Mitani is often cited by papers focused on Silicon Carbide Semiconductor Technologies (23 papers), Semiconductor materials and devices (20 papers) and Copper Interconnects and Reliability (8 papers). Shuhei Mitani collaborates with scholars based in Japan and United States. Shuhei Mitani's co-authors include Yuki Nakano, Heiji Watanabe, Takuji Hosoi, Takayoshi Shimura, Takashi Nakamura, Shinji Tanaka, Eibhlin Goggins, Takashi Nakamura, Ryota Nakamura and Kazuhiro Tsuruta and has published in prestigious journals such as Applied Physics Letters, Psychoneuroendocrinology and Clinical Science.

In The Last Decade

Shuhei Mitani

25 papers receiving 381 citations

Peers

Shuhei Mitani

EEE

EOMM

AMPO

NEURO

Manabu Takei Japan

Xingfang Liu China

R. Weggel United States

Dhritiman Bhattacharya United States

P. Bogdanski France

Jong‐Min Kim South Korea

Bo-Rong Lin Taiwan

Deborah Jaffey United States

Jung-Hwan Oh South Korea

Manabu Takei Japan

Shuhei Mitani

409 ×1.2

EEE

45 ×0.6

EOMM

75 ×1.5

AMPO

4 ×0.1

NEURO

17 ×0.5

Citations per year, relative to Shuhei Mitani Shuhei Mitani (= 1×) peers Manabu Takei

Countries citing papers authored by Shuhei Mitani

Since Specialization

Citations

This map shows the geographic impact of Shuhei Mitani's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shuhei Mitani with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shuhei Mitani more than expected).

Fields of papers citing papers by Shuhei Mitani

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shuhei Mitani. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shuhei Mitani. The network helps show where Shuhei Mitani may publish in the future.

Co-authorship network of co-authors of Shuhei Mitani

This figure shows the co-authorship network connecting the top 25 collaborators of Shuhei Mitani. A scholar is included among the top collaborators of Shuhei Mitani based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shuhei Mitani. Shuhei Mitani is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Goggins, Eibhlin, Shuhei Mitani, & Shinji Tanaka. (2022). Clinical perspectives on vagus nerve stimulation: present and future. Clinical Science. 136(9). 695–709. 48 indexed citations

Mitani, Shuhei, et al.. (2019). Suppression of Bipolar Degradation in Deep-P Encapsulated 4H-SiC Trench MOSFETs up to Ultra-High Current Density. 35–38. 12 indexed citations

Mitani, Shuhei, et al.. (2018). Deep-P encapsulated 4H-SiC trench MOSFETs with ultra low RonQgd. 44–47. 19 indexed citations

Mitani, Shuhei, Izuki Amano, & Yusuke Takatsuru. (2017). High prolactin concentration during lactation period induced disorders of maternal behavioral in offspring. Psychoneuroendocrinology. 88. 129–135. 3 indexed citations

Hosoi, Takuji, Shuhei Mitani, Yuki Nakano, et al.. (2013). Dielectric Properties of Thermally Grown SiO2 on 4H-SiC(0001) Substrates. Materials science forum. 740-742. 605–608. 4 indexed citations

Watanabe, Heiji, Shuhei Mitani, Yuki Nakano, et al.. (2013). Novel Approach for Improving Interface Quality of 4H-SiC MOS Devices with UV Irradiation and Subsequent Thermal Annealing. Materials science forum. 740-742. 741–744. 12 indexed citations

Hosoi, Takuji, Shuhei Mitani, Yuki Nakano, et al.. (2012). Investigation of unusual mobile ion effects in thermally grown SiO₂ on 4H-SiC(0001) at high temperatures. Applied Physics Letters. 100(25). 252103–252103. 46 indexed citations

Hosoi, Takuji, Yusaku Kashiwagi, Ryota Nakamura, et al.. (2012). Performance and reliability improvement in SiC power MOSFETs by implementing AlON high-k gate dielectrics. 7.4.1–7.4.4. 29 indexed citations

Mitani, Shuhei, Yuki Nakano, Takashi Nakamura, et al.. (2012). Impact of UV Irradiation on Thermally Grown 4H-SiC MOS Devices. Materials science forum. 717-720. 765–768. 8 indexed citations

10.

Nakano, Yuki, Ryota Nakamura, Hiroyuki Sakairi, Shuhei Mitani, & Takashi Nakamura. (2012). 690V, 1.00 mΩcm2 4H-SiC Double-Trench MOSFETs. Materials science forum. 717-720. 1069–1072. 32 indexed citations

11.

Watanabe, Heiji, Akitaka Yoshigoe, Yuden Teraoka, et al.. (2011). (Invited) Impact of Stacked AlON/SiO₂ Gate Dielectrics for SiC Power Devices. ECS Transactions. 35(2). 265–274. 6 indexed citations

12.

Hosoi, Takuji, Shuhei Mitani, Yuki Nakano, et al.. (2011). Reduction of Charge Trapping Sites in Al2O3/SiO2 Stacked Gate Dielectrics by Incorporating Nitrogen for Highly Reliable 4H-SiC MIS Devices. Materials science forum. 679-680. 496–499. 8 indexed citations

13.

Watanabe, Heiji, Takuji Hosoi, Akitaka Yoshigoe, et al.. (2011). (Invited) Gate Stack Technologies for SiC Power MOSFETs. ECS Transactions. 41(3). 77–90. 6 indexed citations

14.

Watanabe, Heiji, Akitaka Yoshigoe, Yuden Teraoka, et al.. (2011). Impact of Stacked AlON/SiO₂ Gate Dielectrics for SiC Power Devices. ECS Meeting Abstracts. MA2011-01(16). 1141–1141. 1 indexed citations

15.

Watanabe, Heiji, James Harries, Akitaka Yoshigoe, et al.. (2011). Energy Band Structure of SiO2/4H-SiC Interfaces and its Modulation Induced by Intrinsic and Extrinsic Interface Charge Transfer. Materials science forum. 679-680. 386–389. 27 indexed citations

16.

Hosoi, Takuji, Shuhei Mitani, Yuki Nakano, et al.. (2010). Direct Observation of Dielectric Breakdown Spot in Thermal Oxides on 4H-SiC(0001) Using Conductive Atomic Force Microscopy. Materials science forum. 645-648. 821–824. 7 indexed citations

17.

Watanabe, Y., Shuhei Mitani, Yuki Nakano, et al.. (2010). Improved Electrical Properties of SiC-MOS Interfaces by Thermal Oxidation of Plasma Nitrided 4H-SiC(0001) Surfaces. Materials science forum. 645-648. 507–510. 4 indexed citations

18.

Hosoi, Takuji, Y. Watanabe, Shuhei Mitani, et al.. (2010). Improved Characteristics of 4H-SiC MISFET with AlON/Nitrided SiO2 Stacked Gate Dielectrics. Materials science forum. 645-648. 991–994. 11 indexed citations

19.

Hosoi, Takuji, Makoto Harada, Y. Watanabe, et al.. (2009). AlON/SiO2 Stacked Gate Dielectrics for 4H-SiC MIS Devices. Materials science forum. 615-617. 541–544. 19 indexed citations

20.

Watanabe, Heiji, Y. Watanabe, Makoto Harada, et al.. (2009). Impact of a Treatment Combining Nitrogen Plasma Exposure and Forming Gas Annealing on Defect Passivation of SiO2/SiC Interfaces. Materials science forum. 615-617. 525–528. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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