Shi Pu

974 total citations
27 papers, 736 citations indexed

About

Shi Pu is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Shi Pu has authored 27 papers receiving a total of 736 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 4 papers in Condensed Matter Physics and 1 paper in Atomic and Molecular Physics, and Optics. Recurrent topics in Shi Pu's work include Silicon Carbide Semiconductor Technologies (25 papers), Semiconductor materials and devices (19 papers) and Advancements in Semiconductor Devices and Circuit Design (18 papers). Shi Pu is often cited by papers focused on Silicon Carbide Semiconductor Technologies (25 papers), Semiconductor materials and devices (19 papers) and Advancements in Semiconductor Devices and Circuit Design (18 papers). Shi Pu collaborates with scholars based in United States, China and India. Shi Pu's co-authors include Bilal Akin, Fei Yang, Enes Uğur, Chi Xu, Bhanu Teja Vankayalapati, Shuai Zhao, Masoud Farhadi, Yujian Li, Junhong Wang and Mrinal K. Das and has published in prestigious journals such as IEEE Transactions on Industrial Electronics, IEEE Transactions on Power Electronics and IEEE Transactions on Industry Applications.

In The Last Decade

Shi Pu

26 papers receiving 715 citations

Peers

Shi Pu

EEE

CMP

AMPO

CSE

Umamaheswara Vemulapati Switzerland

Saeed Jahdi United Kingdom

Chi Xu United States

Asad Fayyaz United Kingdom

Enea Bianda Switzerland

Ralf Siemieniec Germany

C. Abbate Italy

Juan Colmenares Sweden

Gourab Sabui United States

Andrew N. Lemmon United States

Umamaheswara Vemulapati Switzerland

Shi Pu

610 ×0.9

EEE

38 ×0.5

CMP

42 ×1.0

AMPO

37 ×1.1

35 ×1.8

CSE

Citations per year, relative to Shi Pu Shi Pu (= 1×) peers Umamaheswara Vemulapati

Countries citing papers authored by Shi Pu

Since Specialization

Citations

This map shows the geographic impact of Shi Pu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shi Pu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shi Pu more than expected).

Fields of papers citing papers by Shi Pu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shi Pu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shi Pu. The network helps show where Shi Pu may publish in the future.

Co-authorship network of co-authors of Shi Pu

This figure shows the co-authorship network connecting the top 25 collaborators of Shi Pu. A scholar is included among the top collaborators of Shi Pu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shi Pu. Shi Pu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Pu, Shi, et al.. (2022). A Comparative Study on Reliability and Ruggedness of Kelvin and Non-Kelvin Packaged SiC Mosfets. IEEE Transactions on Industry Applications. 58(3). 3863–3874. 12 indexed citations

Pu, Shi, Fei Yang, Bhanu Teja Vankayalapati, & Bilal Akin. (2021). Aging Mechanisms and Accelerated Lifetime Tests for SiC MOSFETs: An Overview. IEEE Journal of Emerging and Selected Topics in Power Electronics. 10(1). 1232–1254. 72 indexed citations

Farhadi, Masoud, Fei Yang, Shi Pu, Bhanu Teja Vankayalapati, & Bilal Akin. (2021). Temperature-Independent Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Junction Capacitances. IEEE Transactions on Power Electronics. 36(7). 8308–8324. 52 indexed citations

Vankayalapati, Bhanu Teja, Shi Pu, Fei Yang, et al.. (2021). Investigation and On-Board Detection of Gate-Open Failure in SiC MOSFETs. IEEE Transactions on Power Electronics. 37(4). 4658–4671. 13 indexed citations

Pu, Shi, Bilal Akin, & Fei Yang. (2021). Active Channel Impact on SiC MOSFET Gate Oxide Reliability. 1250–1255. 4 indexed citations

Vankayalapati, Bhanu Teja, Fei Yang, Shi Pu, Masoud Farhadi, & Bilal Akin. (2021). A Highly Scalable, Modular Test Bench Architecture for Large-Scale DC Power Cycling of SiC MOSFETs: Towards Data Enabled Reliability. IEEE Power Electronics Magazine. 8(1). 39–48. 18 indexed citations

Pu, Shi, et al.. (2021). An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors. 464–470.

Yang, Fei, et al.. (2021). Package Degradation’s Impact on SiC MOSFETs Loss: A Comparison of Kelvin and Non-Kelvin Designs. 2258–2264. 6 indexed citations

Yang, Fei, Shi Pu, Chi Xu, & Bilal Akin. (2020). Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs With Aging Compensation. IEEE Transactions on Power Electronics. 36(2). 1280–1294. 77 indexed citations

10.

Pu, Shi, Fei Yang, Bhanu Teja Vankayalapati, et al.. (2020). A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection. IEEE Transactions on Industry Applications. 56(3). 2828–2839. 49 indexed citations

11.

Uğur, Enes, Chi Xu, Fei Yang, Shi Pu, & Bilal Akin. (2020). A New Complete Condition Monitoring Method for SiC Power MOSFETs. IEEE Transactions on Industrial Electronics. 68(2). 1654–1664. 80 indexed citations

12.

Yang, Fei, Shi Pu, Chi Xu, & Bilal Akin. (2020). A System Level Approach for Online Junction Temperature Measurement of SiC MOSFETs Using Turn-On Delay Time. 1012–1017. 7 indexed citations

13.

Pu, Shi, Enes Uğur, Fei Yang, & Bilal Akin. (2019). In situ Degradation Monitoring of SiC MOSFET Based on Switching Transient Measurement. IEEE Transactions on Industrial Electronics. 67(6). 5092–5100. 56 indexed citations

14.

Pu, Shi, Fei Yang, Enes Uğur, et al.. (2019). On-Board SiC MOSFET Degradation Monitoring Through Readily Available Inverter Current/Voltage Sensors. 1–5. 8 indexed citations

15.

Uğur, Enes, Fei Yang, Shi Pu, Shuai Zhao, & Bilal Akin. (2019). Degradation Assessment and Precursor Identification for SiC MOSFETs Under High Temp Cycling. IEEE Transactions on Industry Applications. 55(3). 2858–2867. 108 indexed citations

16.

Xu, Chi, et al.. (2018). Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests. CPSS Transactions on Power Electronics and Applications. 3(4). 269–277. 32 indexed citations

17.

Xu, Chi, Enes Uğur, Fei Yang, Shi Pu, & Bilal Akin. (2018). Investigation of Performance Degradation in Enhancement-Mode GaN HEMTs under Accelerated Aging. 98–102. 13 indexed citations

18.

Pu, Shi, et al.. (2017). Investigation of EM radiation changes in SiC based converters throughout device aging. 190–194. 7 indexed citations

19.

Pu, Shi, Enes Uğur, & Bilal Akin. (2017). Real-time degradation monitoring of SiC-MOSFETs through readily available system microcontroller. 378–382. 19 indexed citations

20.

Li, Yujian, Junhong Wang, & Shi Pu. (2009). Research on the influence scope of periodic slots on leaky coaxial cables. 196–199. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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