Scott Roy

1.9k citations

67 papers · 1.2k indexed · h-index 16

Impact in

Electrical and Electronic Engineering top 5%
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Silicon Carbide Semiconductor Technologies
Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing

Papers in ⓘ

Electrical and Electronic Engineering 57
- Advancements in Semiconductor Devices and Circuit Design 49
- Semiconductor materials and devices 46
- Integrated Circuits and Semiconductor Failure Analysis 16
- Low-power high-performance VLSI design 14
- Silicon Carbide Semiconductor Technologies 8
- Advancements in Photolithography Techniques 3
Hardware and Architecture 3

Co-authors: Asen Asenov (35 shared papers)Gareth Roy (19 shared papers)A. R. Brown (14 shared papers)A. Asenov (14 shared papers)Campbell Millar (18 shared papers)Fikru Adamu-Lema (2 shared papers)J.R. Watling (2 shared papers)John R. Barker (2 shared papers)
Journals: IEEE Transactions on Electron Devices (8 papers)Journal of Computational Electronics (7 papers)IEEE Electron Device Letters (2 papers)Superlattices and Microstructures (2 papers)Microelectronics Reliability (2 papers)
Partner nations: United Kingdom United States Italy

In The Last Decade

Scott Roy

61 papers receiving 1.1k citations

Peers

Countries citing papers authored by Scott Roy

Since Specialization

Citations

This map shows the geographic impact of Scott Roy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott Roy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott Roy more than expected).

Fields of papers citing papers by Scott Roy

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scott Roy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott Roy. The network helps show where Scott Roy may publish in the future.

Co-authors

The 25 scholars most cited alongside Scott Roy, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Scott Roy Line = papers co-authored together Scott Roy links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Showing the 20 most-cited of 67 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Simulation Study of Individual and Combined Sources of Intrinsic Parameter Fluctuations in Conventional Nano-MOSFETs IEEE Transactions on Electron Devices ·Gareth Roy, A. R. Brown, Fikru Adamu-Lema, Scott Roy, Asen Asenov	2006	224
2	Si/SiGe heterostructure parameters for device simulations Semiconductor Science and Technology ·Lianfeng Yang, J.R. Watling, R.C.W. Wilkins, M. Boriçi, John R. Barker, Asen Asenov, Scott Roy	2004	127
3	Where Do the Dopants Go? Science ·Scott Roy, Asen Asenov	2005	98
4	Online Models for Content Optimization Neural Information Processing Systems ·Deepak Agarwal, Bee-Chung Chen, Pradheep Elango, Nitin Motgi, Seung-taek Park, Raghu Ramakrishnan, Scott Roy, Joe Zachariah	2008	71
5	Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation Study IEEE Transactions on Electron Devices ·Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov	2009	50
6	Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP IEEE Design & Test of Computers ·B. Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, A. Asenov	2010	49
7	Accurate Statistical Description of Random Dopant-Induced Threshold Voltage Variability IEEE Electron Device Letters ·Campbell Millar, D. Reid, Gareth Roy, Scott Roy, Asen Asenov	2008	48
8	Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques Journal of Computational Electronics ·Asen Asenov, A. R. Brown, Gareth Roy, B. Cheng, Craig Alexander, Craig Riddet, Urban Kováč, A. Martı́nez, Natalia Seoane, Scott Roy	2009	45
9	Simulation of Statistical Aspects of Charge Trapping and Related Degradation in Bulk MOSFETs in the Presence of Random Discrete Dopants IEEE Transactions on Electron Devices ·Muhammad Faiz Bukhori, Scott Roy, A. Asenov	2010	35
10	Understanding LER-Induced MOSFET $V_{T}$ Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples IEEE Transactions on Electron Devices ·Dave Reid, Campbell Millar, Scott Roy, A. Asenov	2010	32
11	3-D Monte Carlo Simulation of the Impact of Quantum Confinement Scattering on the Magnitude of Current Fluctuations in Double Gate MOSFETs IEEE Transactions on Nanotechnology ·Craig Riddet, A. R. Brown, Craig Alexander, J.R. Watling, Scott Roy, Asen Asenov	2007	28
12	Si–SiO₂ interface band‐gap transition – effects on MOS inversion layer physica status solidi (a) ·Stanislav Markov, Peter V. Sushko, Scott Roy, C. Fiegna, Enrico Sangiorgi, Alexander L. Shluger, A. Asenov	2008	24
13	Quantum Aspects of Resolving Discrete Charges in ‘Atomistic’ Device Simulations Journal of Computational Electronics ·Gareth Roy, A. R. Brown, A. Asenov, Scott Roy	2003	23
14	Simulation of “Ab Initio” Quantum Confinement Scattering in UTB MOSFETs Using Three-Dimensional Ensemble Monte Carlo IEEE Transactions on Electron Devices ·Craig Riddet, Craig Alexander, Andrew R. Brown, Scott Roy, Asen Asenov	2010	19
15	Bipolar quantum corrections in resolving individual dopants in ‘atomistic’ device simulation Superlattices and Microstructures ·Gareth Roy, A. R. Brown, Asen Asenov, Scott Roy	2003	17
16	Understanding LER-induced statistical variability: A 35,000 sample 3D simulation study ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam) ·Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov	2009	16
17	Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants Microelectronics Reliability ·Muhammad Faiz Bukhori, Scott Roy, Asen Asenov	2008	15
18	Towards bendable CMOS magnetic sensors ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam) ·Hadi Heidari, Nicoleta Wacker, Scott Roy, Ravinder Dahiya	2015	15
19	Impact of STI on Statistical Variability and Reliability of Decananometer MOSFETs IEEE Electron Device Letters ·Xingsheng Wang, Scott Roy, Andrew R. Brown, A. Asenov	2011	15
20	Direct Tunnelling Gate Leakage Variability in Nano-CMOS Transistors IEEE Transactions on Electron Devices ·Stanislav Markov, Scott Roy, Asen Asenov	2010	14

About Scott Roy

Scott Roy is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Media Technology, Atomic and Molecular Physics, and Optics and Numerical Analysis, having authored 67 papers that have together received 1.2k indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (49 papers), Semiconductor materials and devices (46 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Low-power high-performance VLSI design (14 papers), Silicon Carbide Semiconductor Technologies (8 papers), Quantum and electron transport phenomena (3 papers), Advancements in Photolithography Techniques (3 papers) and Natural Language Processing Techniques (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (990 citations), Hardware and Architecture (81 citations), Atomic and Molecular Physics, and Optics (195 citations), Structural Biology (6 citations) and Management Science and Operations Research (47 citations). Scott Roy has collaborated with scholars based in United Kingdom, United States and Italy. Frequent co-authors include Asen Asenov, Gareth Roy, A. R. Brown, A. Asenov, Campbell Millar, Fikru Adamu-Lema, J.R. Watling, John R. Barker, B. Cheng and Craig Riddet. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of Computational Electronics, IEEE Electron Device Letters, Superlattices and Microstructures and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact