Satoru Toyooka
- Computer Vision and Pattern Recognition top 2%
- Mechanical Engineering top 5%
- Mechanics of Materials top 5%
- Atomic and Molecular Physics, and Optics top 10%
- Media Technology top 2%
- Co-authors
- Kyuichiro TanakaYoshitaka UchiyamaHirofumi KadonoJussi ParkkinenTimo JääskeläinenH. KadonoVioleta MadjarovaQingchuan Zhang
- Topics
- Optical measurement and interference techniques (35 papers)Surface Roughness and Optical Measurements (20 papers)Advanced Measurement and Metrology Techniques (13 papers)
In The Last Decade
Satoru Toyooka
66 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 78
- Computer Vision and Pattern Recognition 516
- Mechanical Engineering 345
- Mechanics of Materials 326
- Atomic and Molecular Physics, and Optics 317
- Media Technology 171
Countries citing papers authored by Satoru Toyooka
This map shows the geographic impact of Satoru Toyooka's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Satoru Toyooka with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Satoru Toyooka more than expected).
Fields of papers citing papers by Satoru Toyooka
This network shows the impact of papers produced by Satoru Toyooka. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Satoru Toyooka. The network helps show where Satoru Toyooka may publish in the future.
Co-authorship network of co-authors of Satoru Toyooka
This figure shows the co-authorship network connecting the top 25 collaborators of Satoru Toyooka. A scholar is included among the top collaborators of Satoru Toyooka based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Satoru Toyooka. Satoru Toyooka is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 5 | |
| 4 | 4 | |
| 5 | 1 | |
| 6 | 1 | |
| 7 | 19 | |
| 8 | 0 | |
| 9 | Dynamic Deformation Analysis by ESPI | 1 |
| 10 | 17 | |
| 11 | 1 | |
| 12 | 1 | |
| 13 | 9 | |
| 14 | 6 | |
| 15 | 16 | |
| 16 | 47 | |
| 17 | 8 | |
| 18 | 2 | |
| 19 | 95 | |
| 20 | 14 |
About Satoru Toyooka
Satoru Toyooka is a scholar working on Computer Vision and Pattern Recognition, Media Technology and Computational Mechanics, having authored 69 papers that have together received 1.1k indexed citations. Recurring topics across this work include Optical measurement and interference techniques (35 papers), Surface Roughness and Optical Measurements (20 papers) and Advanced Measurement and Metrology Techniques (13 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (516 citations), Media Technology (171 citations) and Mechanics of Materials (326 citations). Satoru Toyooka has collaborated with scholars based in Japan, Finland and China. Frequent co-authors include Kyuichiro Tanaka, Yoshitaka Uchiyama, Hirofumi Kadono, Jussi Parkkinen, Timo Jääskeläinen, H. Kadono, Violeta Madjarova, Qingchuan Zhang, Markku Hauta‐Kasari and Makoto Miwa. Their work appears in journals such as Optics Letters, Optics Express and Journal of Physics Condensed Matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.