S. Raghavan

635 citations
14 papers · 491 indexed · h-index 9
Topics
Advanced Semiconductor Detectors and Materials (13 papers)Semiconductor Quantum Structures and Devices (13 papers)Semiconductor Lasers and Optical Devices (5 papers)
Partner nations
United States

In The Last Decade

S. Raghavan

14 papers receiving 476 citations

Peers

S. Raghavan
Comparison fields: 5 of 31
  • Atomic and Molecular Physics, and Optics 432
  • Electrical and Electronic Engineering 417
  • Materials Chemistry 143
  • Spectroscopy 94
  • Biomedical Engineering 79
Replace Yulian Cao with:
Yulian Cao China
Steve Kennerly United States
M. Erdtmann United States
Y. C. Lo United States
B. Fuchs United States
Yunbao Zheng China
X.H. Su United States
Y.–H. Zhang United States
Xiaohua Su United States
Robert R. Abbott United States
S. Raghavan relative to Yulian Cao China Yulian Cao's profile →
Citations per field
00.5×1.5×2.1×
Yulian Cao · 1×
Citations per year

Countries citing papers authored by S. Raghavan

Since Specialization
Citations

This map shows the geographic impact of S. Raghavan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Raghavan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Raghavan more than expected).

Fields of papers citing papers by S. Raghavan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Raghavan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Raghavan. The network helps show where S. Raghavan may publish in the future.

Co-authorship network of co-authors of S. Raghavan

This figure shows the co-authorship network connecting the top 25 collaborators of S. Raghavan. A scholar is included among the top collaborators of S. Raghavan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Raghavan. S. Raghavan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
#WorkIndexed citations
1 49
2 63
3 51
4 3
5 13
6 9
7 8
8 8
9 92
10 52
11 5
12 28
13 107
14 3

About S. Raghavan

S. Raghavan is a scholar working on Acoustics and Ultrasonics, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 14 papers that have together received 491 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (13 papers), Semiconductor Quantum Structures and Devices (13 papers) and Semiconductor Lasers and Optical Devices (5 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (432 citations), Electrical and Electronic Engineering (417 citations) and Spectroscopy (94 citations). S. Raghavan has collaborated with scholars based in United States. Frequent co-authors include Sanjay Krishna, A. Stintz, P. Rotella, G. von Winckel, Stephen W. Kennerly, Christian Morath, B. Fuchs, D. A. Cardimona, S. G. Matsik and A. G. U. Perera. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Physics Letters A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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