S. M. Stein

22 papers receiving 891 citations

Peers

S. M. Stein
Comparison fields: 5 of 63
  • Electronic, Optical and Magnetic Materials 626
  • Spectroscopy 294
  • Organic Chemistry 351
  • Polymers and Plastics 164
  • Materials Chemistry 259
Replace B. Deloche with:
B. Deloche France
J. C. Rouillon France
Hirokazu Toriumi Japan
C. Cruz Portugal
Andrzej Żywociński Poland
Mary E. Neubert United States
H. Nakanishi Japan
Isa Nishiyama Japan
Malay Kumar Das India
L. Richter Germany
S. M. Stein relative to B. Deloche France B. Deloche's profile →
Citations per field
00.5×1.5×2.2×
B. Deloche · 1×
Citations per year

Countries citing papers authored by S. M. Stein

Since Specialization
Citations

This map shows the geographic impact of S. M. Stein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. M. Stein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. M. Stein more than expected).

Fields of papers citing papers by S. M. Stein

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. M. Stein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. M. Stein. The network helps show where S. M. Stein may publish in the future.

Co-authors

The 25 scholars most cited alongside S. M. Stein, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. M. Stein Line = papers co-authored together S. M. Stein links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 22 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1989370
2 1989247
3 1993143
4 199349
5 198736
6 200821
7 198919
8 199517
9 19949
10 19949
11 19929
12 19958
13 19958
14 19946
15 19956
16 19935
17 19945
18 19964
19 19873
20 19873

About S. M. Stein

S. M. Stein is a scholar working on Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Organic Chemistry, Spectroscopy and Industrial and Manufacturing Engineering, having authored 22 papers that have together received 980 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (8 papers), Molecular spectroscopy and chirality (4 papers), Liquid Crystal Research Advancements (4 papers), Nanofabrication and Lithography Techniques (3 papers), Chemical Synthesis and Characterization (2 papers), Surfactants and Colloidal Systems (2 papers), Semiconductor materials and devices (2 papers) and 3D IC and TSV technologies (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (626 citations), Spectroscopy (294 citations), Organic Chemistry (351 citations), Polymers and Plastics (164 citations) and Materials Chemistry (259 citations). S. M. Stein has collaborated with scholars based in United States, Germany and United Kingdom. Frequent co-authors include M. A. Waugh, E. Chin, R. Pindak, Jay Patel, John W. Goodby, J. W. Goodby, Elizabeth W. Kwock, Timothy Miller, Thomas X. Neenan and Howard E. Katz. Their work appears in journals such as Journal of the American Chemical Society, Microelectronic Engineering, Macromolecules, Chemistry of Materials and Macromolecular Symposia.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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