S. Jena

1.0k total citations
53 papers, 841 citations indexed

About

S. Jena is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, S. Jena has authored 53 papers receiving a total of 841 indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Electrical and Electronic Engineering, 21 papers in Materials Chemistry and 19 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in S. Jena's work include Semiconductor materials and devices (13 papers), Metal and Thin Film Mechanics (11 papers) and Optical Coatings and Gratings (11 papers). S. Jena is often cited by papers focused on Semiconductor materials and devices (13 papers), Metal and Thin Film Mechanics (11 papers) and Optical Coatings and Gratings (11 papers). S. Jena collaborates with scholars based in India, Germany and Kuwait. S. Jena's co-authors include R.B. Tokas, D. V. Udupa, S. Thakur, N. K. Sahoo, K. Divakar Rao, R. Ganesan, Ramakanta Naik, Chinmaya Kar, S. Maidul Haque and S. Tripathi and has published in prestigious journals such as Journal of Applied Physics, Applied Surface Science and Journal of Applied Crystallography.

In The Last Decade

S. Jena

50 papers receiving 801 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Jena India 19 497 405 260 253 114 53 841
S. Thakur India 18 495 1.0× 380 0.9× 159 0.6× 229 0.9× 111 1.0× 50 861
Kiyoshi Yasutake Japan 22 1.2k 2.4× 697 1.7× 269 1.0× 258 1.0× 96 0.8× 146 1.5k
Yun Cui China 13 275 0.6× 249 0.6× 215 0.8× 163 0.6× 49 0.4× 45 623
G. A. Antonelli United States 17 501 1.0× 306 0.8× 196 0.8× 168 0.7× 360 3.2× 57 869
Н. А. Феоктистов Russia 15 423 0.9× 492 1.2× 159 0.6× 316 1.2× 83 0.7× 116 813
Byoung‐Ho Cheong South Korea 14 620 1.2× 488 1.2× 156 0.6× 310 1.2× 146 1.3× 41 919
Hiroaki Kakiuchi Japan 18 758 1.5× 481 1.2× 150 0.6× 104 0.4× 85 0.7× 108 957
Meiping Zhu China 17 416 0.8× 243 0.6× 214 0.8× 161 0.6× 126 1.1× 99 830
M. Bolduc Canada 15 434 0.9× 366 0.9× 104 0.4× 249 1.0× 98 0.9× 67 747
M. Kazan France 18 325 0.7× 555 1.4× 359 1.4× 155 0.6× 241 2.1× 75 1.0k

Countries citing papers authored by S. Jena

Since Specialization
Citations

This map shows the geographic impact of S. Jena's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Jena with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Jena more than expected).

Fields of papers citing papers by S. Jena

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Jena. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Jena. The network helps show where S. Jena may publish in the future.

Co-authorship network of co-authors of S. Jena

This figure shows the co-authorship network connecting the top 25 collaborators of S. Jena. A scholar is included among the top collaborators of S. Jena based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Jena. S. Jena is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
Sharma, R. P., S. Jena, & D. V. Udupa. (2023). Coupling of topological interface states in 1D photonic crystal. Optical Materials. 137. 113508–113508. 14 indexed citations
3.
Tokas, R.B., et al.. (2023). Study of reactive electron beam deposited tantalum penta oxide thin films with spectroscopic ellipsometry and atomic force microscopy. Applied Surface Science Advances. 18. 100480–100480. 3 indexed citations
4.
Jena, S., R.B. Tokas, S. Thakur, & D. V. Udupa. (2022). Rabi-like splitting and refractive index sensing with hybrid Tamm plasmon-cavity modes. Journal of Physics D Applied Physics. 55(17). 175104–175104. 26 indexed citations
5.
Gupta, Divya, et al.. (2022). Study of photonic band gap robustness in disordered polymer photonic crystals under hydrostatic pressure. Optical Materials. 125. 112094–112094. 3 indexed citations
6.
Jena, S., et al.. (2021). Transfer matrix based reverse engineering approach to analyse annealing induced changes in optical transmission of TiO2/Ag/TiO2/Ag multilayer. Optics & Laser Technology. 144. 107392–107392. 6 indexed citations
8.
Jena, S., R.B. Tokas, S. Thakur, & D. V. Udupa. (2019). Tunable mirrors and filters in 1D photonic crystals containing polymers. Physica E Low-dimensional Systems and Nanostructures. 114. 113627–113627. 41 indexed citations
9.
Jena, S., R.B. Tokas, S. Thakur, & D. V. Udupa. (2019). Study of aging effects on optical properties and residual stress of HfO2 thin film. Optik. 185. 71–81. 27 indexed citations
10.
Aparimita, Adyasha, C. Sripan, R. Ganesan, S. Jena, & Ramakanta Naik. (2018). Influence of thermal annealing on optical and structural properties change in Bi-doped Ge30Se70 thin films. Phase Transitions. 91(8). 872–886. 9 indexed citations
11.
Jena, S., et al.. (2018). Evaluation of microstructure and residual stress in W/B4C multilayer optics. Journal of Applied Physics. 124(11). 14 indexed citations
12.
Jena, S., R.B. Tokas, S. Tripathi, et al.. (2018). Influence of oxygen partial pressure on microstructure, optical properties, residual stress and laser induced damage threshold of amorphous HfO2 thin films. Journal of Alloys and Compounds. 771. 373–381. 49 indexed citations
13.
Tokas, R.B., S. Jena, S. Maidul Haque, et al.. (2016). Spectroscopic ellipsometry investigations of optical anisotropy in obliquely deposited hafnia thin films. AIP conference proceedings. 1731. 60007–60007. 1 indexed citations
14.
Nand, Mangla, Babita Babita, S. Jena, et al.. (2016). Development of high damage threshold multilayer thin film beam combiner for laser application. AIP conference proceedings. 1731. 80051–80051. 2 indexed citations
15.
Tokas, R.B., S. Jena, S. R. Polaki, et al.. (2015). Oblique angle deposition of HfO2thin films: quantitative assessment of indentation modulus and micro structural properties. Materials Research Express. 2(3). 35010–35010. 13 indexed citations
16.
Paul, Sabyasachi, S.P. Tripathy, Sharma Sc, et al.. (2014). Effects of neutron irradiation on optical and chemical properties of CR-39: Potential application in neutron dosimetry. Applied Radiation and Isotopes. 94. 200–205. 30 indexed citations
17.
Tripathy, S.P., et al.. (2014). Effect of 14 MeV neutrons on the optical properties of CR-39 detector. The European Physical Journal Applied Physics. 65(1). 10701–10701. 7 indexed citations
18.
Naik, Ramakanta, S. Jena, R. Ganesan, & N. K. Sahoo. (2013). Laser‐induced optical properties change in Sb10S40Se50 chalcogenide thin films: An investigation through FTIR and XPS measurements. physica status solidi (b). 251(3). 661–668. 31 indexed citations
19.
Kumar, Sanjiv, et al.. (2013). Postanalyses of an optical multilayer interference filter using numerical reverse synthesis and Rutherford backscattering spectrometry. Applied Optics. 52(10). 2102–2102. 3 indexed citations
20.
Jena, S., R.B. Tokas, Seema Thakur, & N. K. Sahoo. (2013). Optical constants and thickness determination of thin films using envelope method and inverse synthesis method: A comparative study. AIP conference proceedings. 632–633. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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