F. Abelès

3.0k total citations · 1 hit paper
45 papers, 1.4k citations indexed

About

F. Abelès is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, F. Abelès has authored 45 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 14 papers in Surfaces, Coatings and Films and 11 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in F. Abelès's work include Optical Coatings and Gratings (12 papers), Copper Interconnects and Reliability (7 papers) and Semiconductor materials and devices (7 papers). F. Abelès is often cited by papers focused on Optical Coatings and Gratings (12 papers), Copper Interconnects and Reliability (7 papers) and Semiconductor materials and devices (7 papers). F. Abelès collaborates with scholars based in France and United States. F. Abelès's co-authors include Alloys, T. López-Rı́os, M.L. Thèye, G. Vuye, J. Rivory, S. Fisson, Vien Van, A. Tadjeddine, Y. Borensztein and A. Brunet‐Bruneau and has published in prestigious journals such as Physical Review Letters, Surface Science and Thin Solid Films.

In The Last Decade

F. Abelès

45 papers receiving 1.3k citations

Hit Papers

Optical properties and electronic structure of metals and... 1966 2026 1986 2006 1966 100 200 300 400 500
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Optical properties and electronic structure of metals and alloys
    1966 517 citations F. Abelès et al. profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Abelès France 17 675 518 417 358 337 45 1.4k
N. P. Economou United States 18 782 1.2× 503 1.0× 327 0.8× 189 0.5× 282 0.8× 48 1.5k
G.A. Haas United States 22 600 0.9× 671 1.3× 164 0.4× 279 0.8× 608 1.8× 77 1.5k
F. G. Allen United States 23 1.1k 1.6× 1.4k 2.6× 456 1.1× 620 1.7× 624 1.9× 38 2.2k
R. J. Warmack United States 24 971 1.4× 824 1.6× 1.1k 2.6× 215 0.6× 342 1.0× 58 1.8k
C. A. Ward United States 8 768 1.1× 932 1.8× 1.1k 2.7× 268 0.7× 149 0.4× 11 1.9k
F. Salvan France 24 1.7k 2.6× 864 1.7× 484 1.2× 371 1.0× 621 1.8× 64 2.1k
David Brust United States 20 1.0k 1.5× 620 1.2× 174 0.4× 185 0.5× 636 1.9× 34 1.6k
H. Kanter United States 16 479 0.7× 523 1.0× 138 0.3× 537 1.5× 188 0.6× 32 1.1k
J. B. Kortright United States 22 978 1.4× 614 1.2× 195 0.5× 217 0.6× 390 1.2× 47 1.7k
E. D. Palik United States 25 1.2k 1.8× 1.3k 2.6× 820 2.0× 135 0.4× 697 2.1× 83 2.4k

Countries citing papers authored by F. Abelès

Since Specialization
Citations

This map shows the geographic impact of F. Abelès's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Abelès with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Abelès more than expected).

Fields of papers citing papers by F. Abelès

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Abelès. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Abelès. The network helps show where F. Abelès may publish in the future.

Co-authorship network of co-authors of F. Abelès

This figure shows the co-authorship network connecting the top 25 collaborators of F. Abelès. A scholar is included among the top collaborators of F. Abelès based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Abelès. F. Abelès is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Brunet‐Bruneau, A., S. Fisson, Vien Van, et al.. (1998). Visible and infrared ellipsometry study of ion assisted SiO2 films. Thin Solid Films. 313-314. 676–681. 11 indexed citations
2.
Brunet‐Bruneau, A., et al.. (1996). Infrared ellipsometry investigation of SiOxNy thin films on silicon. Applied Optics. 35(25). 4998–4998. 5 indexed citations
3.
Van, Vien, A. Brunet‐Bruneau, S. Fisson, et al.. (1996). Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurements. Applied Optics. 35(28). 5540–5540. 14 indexed citations
4.
Abelès, F.. (1994). Optical Interference Coatings. Optical Interference Coatings. 2253. 16 indexed citations
5.
Rivory, Josette, et al.. (1994). Growth of low and high refractive index dielectric films: an in situ ellipsometry study. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2253. 1328–1328. 1 indexed citations
6.
Van, Vien, et al.. (1994). Growth of low and high refractive index dielectric layers as studied by in situ ellipsometry. Thin Solid Films. 253(1-2). 257–261. 8 indexed citations
7.
Vuye, G., et al.. (1993). Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry. Thin Solid Films. 233(1-2). 166–170. 130 indexed citations
8.
Abelès, F. & Philip Baumeister. (1992). Multilayer reflectors with minimal dispersion of differential phase shift upon reflection. Optics Communications. 93(1-2). 1–3. 3 indexed citations
9.
Borensztein, Y. & F. Abelès. (1985). Surface reflectance spectroscopy: Its application to the study of very thin films. Thin Solid Films. 125(1-2). 129–142. 9 indexed citations
10.
Abelès, F., Y. Borensztein, M. De Crescenzi, & T. López-Rı́os. (1980). Optical evidence for longitudinal waves in very thin Ag layers. Surface Science. 101(1-3). 123–130. 15 indexed citations
11.
Abelès, F.. (1977). LES ONDES ÉLECTROMAGNÉTIQUES DE SURFACE ET LEUR UTILISATION POUR L'ÉTUDE DES SURFACES ET INTERFACES. Le Journal de Physique Colloques. 38(C5). C5–67. 5 indexed citations
12.
Abelès, F.. (1976). Surface electromagnetic waves ellipsometry. Surface Science. 56. 237–251. 85 indexed citations
13.
Abelès, F., et al.. (1973). Calculating optical constants of anisotropic materials from reflectivity data*. Journal of the Optical Society of America. 63(1). 104–104. 20 indexed citations
14.
Abelès, F., et al.. (1970). Le vide : formation et contrôle des couches minces. CERN Document Server (European Organization for Nuclear Research). 2 indexed citations
15.
Abelès, F.. (1968). Review of Optical Properties of Metals and Alloys due to Interband Transitions. 191. 1 indexed citations
16.
Abelès, F. & M.L. Thèye. (1966). Méthode de calcul des constantes optiques des couches minces absorbantes à partir de mesures de réflexion et de transmission. Surface Science. 5(3). 325–331. 126 indexed citations
17.
Abelès, F. & M.L. Thèye. (1963). Simultaneous determination of the scattering parameter and the mean free path of conduction electrons in thin films. Physics Letters. 4(6). 348–349. 11 indexed citations
18.
Abelès, F. & Jean‐Paul Mathieu. (1958). Calcul des constantes optiques des cristaux ioniques dans l’infrarouge, à partir du spectre de réflexion. Annales de Physique. 13(3). 5–32. 11 indexed citations
19.
20.
Abelès, F.. (1952). On a Method for Measurements of Optical Constants by Reflection. Proceedings of the Physical Society Section B. 65(12). 996–996. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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