Ruud Schampers

560 total citations
12 papers, 368 citations indexed

About

Ruud Schampers is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, Ruud Schampers has authored 12 papers receiving a total of 368 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Surfaces, Coatings and Films, 8 papers in Structural Biology and 6 papers in Electrical and Electronic Engineering. Recurrent topics in Ruud Schampers's work include Electron and X-Ray Spectroscopy Techniques (10 papers), Advanced Electron Microscopy Techniques and Applications (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Ruud Schampers is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (10 papers), Advanced Electron Microscopy Techniques and Applications (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). Ruud Schampers collaborates with scholars based in Netherlands, Germany and Japan. Ruud Schampers's co-authors include Jürgen M. Plitzko, Anthony A. Hyman, Julia Mahamid, Wolfgang Baumeister, Digvijay Singh, Miroslava Schaffer, Reika Watanabe, Elizabeth Villa, Felix Wagner and L. Mele and has published in prestigious journals such as Applied Physics Letters, Nature Protocols and Journal of Structural Biology.

In The Last Decade

Ruud Schampers

10 papers receiving 355 citations

Peers

Ruud Schampers

SCF

EEE

Stephan Kleindiek Germany

Francesco Tatti Italy

T. Tomita Japan

W J MoberlyChan United States

A.J. Gubbens United States

C. Colliex France

M. K. Lamvik United States

Hamish G. Brown Australia

Yichao Zhang United States

Jen-Wei Chang Taiwan

Stephan Kleindiek Germany

Ruud Schampers

120 ×0.6

61 ×0.5

SCF

84 ×0.9

55 ×0.7

EEE

47 ×0.6

Citations per year, relative to Ruud Schampers Ruud Schampers (= 1×) peers Stephan Kleindiek

Countries citing papers authored by Ruud Schampers

Since Specialization

Citations

This map shows the geographic impact of Ruud Schampers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ruud Schampers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ruud Schampers more than expected).

Fields of papers citing papers by Ruud Schampers

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ruud Schampers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ruud Schampers. The network helps show where Ruud Schampers may publish in the future.

Co-authorship network of co-authors of Ruud Schampers

This figure shows the co-authorship network connecting the top 25 collaborators of Ruud Schampers. A scholar is included among the top collaborators of Ruud Schampers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ruud Schampers. Ruud Schampers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

Comet, M, Patricia M. Dijkman, Simonas Masiulis, et al.. (2024). Tomo Live : an on-the-fly reconstruction pipeline to judge data quality for cryo-electron tomography workflows. Acta Crystallographica Section D Structural Biology. 80(4). 247–258. 3 indexed citations

Wagner, Felix, Reika Watanabe, Ruud Schampers, et al.. (2020). Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography. Nature Protocols. 15(6). 2041–2070. 115 indexed citations

Mele, L., et al.. (2016). A MEMS‐based heating holder for the direct imaging of simultaneous in‐situ heating and biasing experiments in scanning/transmission electron microscopes. Microscopy Research and Technique. 79(4). 239–250. 82 indexed citations

Mahamid, Julia, et al.. (2015). A focused ion beam milling and lift-out approach for site-specific preparation of frozen-hydrated lamellas from multicellular organisms. Journal of Structural Biology. 192(2). 262–269. 112 indexed citations

Young, Richard, Chad Rue, Steven Randolph, et al.. (2011). A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications. Microscopy and Microanalysis. 17(S2). 652–653. 8 indexed citations

Schampers, Ruud, et al.. (2010). High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source. Microscopy and Microanalysis. 16(S2). 222–223. 10 indexed citations

Schampers, Ruud, et al.. (2009). Backside TEM Sample Preparation With The Multi-Loader Flip-Stage. Microscopy and Microanalysis. 15(S2). 334–335. 2 indexed citations

Young, Richard, et al.. (2008). Applications of In-situ Sample Preparation and Modeling of SEM-STEM Imaging. Proceedings - International Symposium for Testing and Failure Analysis. 30910. 320–327. 3 indexed citations

Bénistant, F., et al.. (2008). Strain relaxation in transistor channels with embedded epitaxial silicon germanium source/drain. Applied Physics Letters. 93(22). 221912–221912. 28 indexed citations

10.

Schampers, Ruud, et al.. (2008). In-Situ Sample Preparation and Modeling of SEM-STEM Imaging. Microscopy and Microanalysis. 14(S2). 1000–1001.

11.

André, Frederic, et al.. (2006). In-line TEM sample preparation and wafer return strategy for rapid yield learning. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6152. 615217–615217. 3 indexed citations

12.

Young, Richard, et al.. (2004). In-Situ Sample Preparation and High-Resolution SEM-STEM Analysis. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 331–337. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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