R.‐P. Haelbich
- Radiation top 5%
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Surfaces, Coatings and Films top 5%
- Computational Mechanics top 10%
- Topics
- Electron and X-Ray Spectroscopy Techniques (5 papers)Advancements in Photolithography Techniques (4 papers)Surface Roughness and Optical Measurements (4 papers)
- Partner nations
- GermanyUnited States
In The Last Decade
R.‐P. Haelbich
15 papers receiving 489 citations
Peers
Comparison fields: 5 of 45
- Radiation 217
- Electrical and Electronic Engineering 184
- Atomic and Molecular Physics, and Optics 153
- Surfaces, Coatings and Films 134
- Computational Mechanics 118
Countries citing papers authored by R.‐P. Haelbich
This map shows the geographic impact of R.‐P. Haelbich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.‐P. Haelbich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.‐P. Haelbich more than expected).
Fields of papers citing papers by R.‐P. Haelbich
This network shows the impact of papers produced by R.‐P. Haelbich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.‐P. Haelbich. The network helps show where R.‐P. Haelbich may publish in the future.
Co-authorship network of co-authors of R.‐P. Haelbich
This figure shows the co-authorship network connecting the top 25 collaborators of R.‐P. Haelbich. A scholar is included among the top collaborators of R.‐P. Haelbich based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.‐P. Haelbich. R.‐P. Haelbich is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 8 | |
| 2 | 21 | |
| 3 | 3 | |
| 4 | 21 | |
| 5 | 129 | |
| 6 | 14 | |
| 7 | 13 | |
| 8 | 83 | |
| 9 | 14 | |
| 10 | 18 | |
| 11 | 4 | |
| 12 | 55 | |
| 13 | 9 | |
| 14 | 76 | |
| 15 | 52 |
About R.‐P. Haelbich
R.‐P. Haelbich is a scholar working on Surfaces, Coatings and Films, Radiation and Computational Mechanics, having authored 15 papers that have together received 520 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (5 papers), Advancements in Photolithography Techniques (4 papers) and Surface Roughness and Optical Measurements (4 papers). The work is most often cited by research in Radiation (217 citations), Surfaces, Coatings and Films (134 citations) and Structural Biology (19 citations). R.‐P. Haelbich has collaborated with scholars based in Germany and United States. Frequent co-authors include C. Kunz, Armin Segmüller, Eberhard Spiller, H. Hogrefe, W. Jark, Klaus J. Boller, J. C. Rife, M. Iwan, W. Eberhardt and E.E. Koch. Their work appears in journals such as Applied Physics Letters, Annals of the New York Academy of Sciences and Chemical Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.