Ron Green

598 total citations · 1 hit paper
9 papers, 457 citations indexed

About

Ron Green is a scholar working on Electrical and Electronic Engineering, Environmental Engineering and Geochemistry and Petrology. According to data from OpenAlex, Ron Green has authored 9 papers receiving a total of 457 indexed citations (citations by other indexed papers that have themselves been cited), including 5 papers in Electrical and Electronic Engineering, 2 papers in Environmental Engineering and 1 paper in Geochemistry and Petrology. Recurrent topics in Ron Green's work include Silicon Carbide Semiconductor Technologies (5 papers), Semiconductor materials and devices (3 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). Ron Green is often cited by papers focused on Silicon Carbide Semiconductor Technologies (5 papers), Semiconductor materials and devices (3 papers) and Advancements in Semiconductor Devices and Circuit Design (2 papers). Ron Green collaborates with scholars based in United States, Australia and United Kingdom. Ron Green's co-authors include Aivars J. Lelis, Daniel B. Habersat, Darrell W. Sims, David A. Ferrill, Alan P. Morris, Neil Goldsman and Damian Urciuoli and has published in prestigious journals such as IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics and ECS Transactions.

In The Last Decade

Ron Green

7 papers receiving 439 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Basic Mechanisms of Threshold-Voltage Instability and Implications for Reliability Testing of SiC MOSFETs

2014 370 citations Aivars J. Lelis, Ron Green et al. IEEE Transactions on Electron Devices profile →

Peers

Countries citing papers authored by Ron Green

Since Specialization

Citations

This map shows the geographic impact of Ron Green's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ron Green with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ron Green more than expected).

Fields of papers citing papers by Ron Green

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ron Green. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ron Green. The network helps show where Ron Green may publish in the future.

Co-authorship network of co-authors of Ron Green

This figure shows the co-authorship network connecting the top 25 collaborators of Ron Green. A scholar is included among the top collaborators of Ron Green based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ron Green. Ron Green is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

9 of 9 papers shown

#	Work	Indexed citations
1	The Edwards Aquifer 2022 ·(unknown), Ron Green	0
2	(Invited) Updated Key Issues for SiC MOSFET Reliability 2020 ·ECS Meeting Abstracts ·Aivars J. Lelis, Daniel B. Habersat, Damian Urciuoli, (unknown), (unknown), Ron Green	0
3	Threshold-voltage bias-temperature instability in commercially-available SiC MOSFETs 2016 ·Japanese Journal of Applied Physics ·Ron Green, Aivars J. Lelis, Daniel B. Habersat	69
4	Reliability of Commercially Available SiC Power MOSFETs 2014 ·ECS Transactions ·Aivars J. Lelis, Ron Green, (unknown), Daniel B. Habersat	1
5	Basic Mechanisms of Threshold-Voltage Instability and Implications for Reliability Testing of SiC MOSFETs breakdown → 2014 ·IEEE Transactions on Electron Devices ·Aivars J. Lelis, Ron Green, Daniel B. Habersat, (unknown)	370
6	SiC MOSFET oxide-trap two-way tunneling model 2011 ·Aivars J. Lelis, Daniel B. Habersat, Ron Green, Neil Goldsman	2
7	Geologic Controls on Interaction Between the Edwards and Trinity Aquifers, Balcones Fault System, Texas 2008 ·Digital Commons - University of South Florida (University of South Florida) ·David A. Ferrill, Alan P. Morris, Darrell W. Sims, Ron Green, (unknown), (unknown)	8
8	Factors that Influence the Desire to Become Teachers of Technology: An Australian Study 2007 ·Ron Green, (unknown)	6
9	The Ethics of Teaching Ethics 1989 ·(unknown), Ron Green, (unknown), (unknown), (unknown), (unknown), (unknown)	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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