R. E. Klinger

412 total citations
20 papers, 300 citations indexed

About

R. E. Klinger is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, R. E. Klinger has authored 20 papers receiving a total of 300 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 9 papers in Materials Chemistry and 6 papers in Computational Mechanics. Recurrent topics in R. E. Klinger's work include Semiconductor materials and devices (7 papers), Ion-surface interactions and analysis (4 papers) and Metal and Thin Film Mechanics (4 papers). R. E. Klinger is often cited by papers focused on Semiconductor materials and devices (7 papers), Ion-surface interactions and analysis (4 papers) and Metal and Thin Film Mechanics (4 papers). R. E. Klinger collaborates with scholars based in United States, Canada and Australia. R. E. Klinger's co-authors include J. E. Greene, C. K. Carniglia, J. E. Greene, L. B. Welsh, Vı́tor Baranauskas, Tery L. Barr, John P. Lehan, F. R. Szofran, Scott A. Barnett and Phil Martin and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemical Physics Letters.

In The Last Decade

R. E. Klinger

20 papers receiving 267 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
R. E. Klinger United States	9	179	147	104	93	42	20	300
P. Geittner Germany	10	253 1.4×	151 1.0×	56 0.5×	64 0.7×	91 2.2×	27	412
E. F. Krimmel Germany	12	295 1.6×	131 0.9×	220 2.1×	62 0.7×	55 1.3×	43	383
Chr. Weißmantel Germany	8	153 0.9×	226 1.5×	136 1.3×	201 2.2×	26 0.6×	18	343
Mark Wiggins United States	8	208 1.2×	212 1.4×	45 0.4×	87 0.9×	75 1.8×	12	366
R. R. Kola United States	10	223 1.2×	80 0.5×	29 0.3×	75 0.8×	63 1.5×	40	311
G. Veilleux Canada	13	82 0.5×	251 1.7×	138 1.3×	65 0.7×	42 1.0×	25	365
M. Terauchi Japan	12	236 1.3×	252 1.7×	61 0.6×	57 0.6×	45 1.1×	31	372
T. L. Shofner United States	7	147 0.8×	82 0.6×	93 0.9×	27 0.3×	52 1.2×	17	317
M. S. Ameen United States	10	199 1.1×	181 1.2×	61 0.6×	52 0.6×	77 1.8×	31	331
D. Barr United States	10	202 1.1×	80 0.5×	96 0.9×	35 0.4×	28 0.7×	33	268

Countries citing papers authored by R. E. Klinger

Since Specialization

Citations

This map shows the geographic impact of R. E. Klinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. E. Klinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. E. Klinger more than expected).

Fields of papers citing papers by R. E. Klinger

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. E. Klinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. E. Klinger. The network helps show where R. E. Klinger may publish in the future.

Co-authorship network of co-authors of R. E. Klinger

This figure shows the co-authorship network connecting the top 25 collaborators of R. E. Klinger. A scholar is included among the top collaborators of R. E. Klinger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. E. Klinger. R. E. Klinger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Ockenfuß, G. & R. E. Klinger. (2006). Ultra-low-stress thin-film interference filters. Applied Optics. 45(7). 1364–1364. 4 indexed citations

Klinger, R. E., et al.. (2006). Beam displacement and distortion effects in narrowband optical thin-film filters. Applied Optics. 45(14). 3237–3237. 5 indexed citations

Klinger, R. E., Azar Alizadeh, Chris Keimel, et al.. (2006). Templated Growth of Semiconductor Nanostructures through Block Copolymer Lithography. Microscopy and Microanalysis. 12(S02). 604–605. 1 indexed citations

Klemberg-Sapieha, J.E., L. Martinů, Ian Stevenson, et al.. (2004). Mechanical characteristics of optical coatings prepared by various techniques: a comparative study. Applied Optics. 43(13). 2670–2670. 34 indexed citations

Cao, X. A., Chunhui Yan, Mark P. D’Evelyn, et al.. (2004). Homoepitaxially grown GaN-based light-emitting diodes with peak emission at 405nm. Journal of Crystal Growth. 269(2-4). 242–248. 5 indexed citations

Hedström, Jonas, Daniel Lincot, M. Ruckh, et al.. (2002). Optimization of windows in ZnO-CdS-CuInSe/sub 2/ heterojunctions. 898–902. 2 indexed citations

Klinger, R. E.. (1992). Thin film deposition technologies, and structure/property relationships applied to solid state ionic conductors. Solid State Ionics. 52(1-3). 249–249. 1 indexed citations

Lehan, John P., et al.. (1992). High-rate aluminum oxide deposition by MetaModeTM reactive sputtering. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(6). 3401–3406. 22 indexed citations

Klinger, R. E., et al.. (1987). Preparation of Multilayer Optical Coatings for Tem Cross-Sectional Microanalysis by Ultramicrotomy. MRS Proceedings. 115. 8 indexed citations

10.

Klinger, R. E., et al.. (1986). Evolution Of Surface Roughness And Scatter In Evaporated Zirconia/Silica Multilayer Coatings. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 678. 41–41. 4 indexed citations

11.

Klinger, R. E. & C. K. Carniglia. (1985). Optical and crystalline inhomogeneity in evaporated zirconia films. Applied Optics. 24(19). 3184–3184. 59 indexed citations

12.

Klinger, R. E. & J. E. Greene. (1983). Reactive ion etching of GaAs in CCl4−xFx (x=0, 2, 4) and mixed CCl4−xFx/Ar discharges. Journal of Applied Physics. 54(3). 1595–1604. 20 indexed citations

13.

Klinger, R. E. & J. E. Greene. (1981). Reactive ion etching of GaAs in CCl2F2. Applied Physics Letters. 38(8). 620–622. 30 indexed citations

14.

Baranauskas, Vı́tor, et al.. (1980). Laser-induced chemical vapor deposition of polycrystalline Si from SiCl4. Applied Physics Letters. 36(11). 930–932. 45 indexed citations

15.

Greene, J. E., R. E. Klinger, Tery L. Barr, & L. B. Welsh. (1979). Auger and X-ray photoelectron spectroscopy studies of preferential sputtering in Y2O3-doped ZrO2 films. Chemical Physics Letters. 62(1). 46–50. 26 indexed citations

16.

Bajor, G., Scott A. Barnett, R. E. Klinger, & J. E. Greene. (1979). Determination of concentrations and ionization energies of imperfections in degenerate InSb films. Thin Solid Films. 59(2). 183–192. 6 indexed citations

17.

Barr, Tery L., L. B. Welsh, F. R. Szofran, J. E. Greene, & R. E. Klinger. (1978). Abstract: Surface studies of Y2O3 doped CeO2 and ZrO2 thin films. Journal of Vacuum Science and Technology. 15(2). 341–342. 4 indexed citations

18.

Greene, J. E., et al.. (1977). Ion‐plated lead oxide, an x‐ray sensitive photoconductor. Journal of Vacuum Science and Technology. 14(1). 219–222. 6 indexed citations

19.

Greene, J. E., R. E. Klinger, L. B. Welsh, & F. R. Szofran. (1977). Growth and characterization of doped ZrO2 and CeO2 films deposited by bias sputtering. Journal of Vacuum Science and Technology. 14(1). 177–180. 17 indexed citations

20.

Klinger, R. E., et al.. (1960). Die Entwicklung einer hochkonstanten dekadischen Kurzwellensteuerstufe für den Bereich 1,5 ... 30 MHz. Frequenz. 14(10). 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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