Piet Bijl
- Aerospace Engineering top 5%
- Computer Vision and Pattern Recognition top 5%
- Electrical and Electronic Engineering
- Media Technology top 2%
- Atomic and Molecular Physics, and Optics
- Co-authors
- J. M. ValetonMaarten A. HogervorstAlexander ToetJan J. KoenderinkFrank L. KooiJudith DijkKlamer SchutteMarcel P. Lucassen
- Topics
- Infrared Target Detection Methodologies (46 papers)CCD and CMOS Imaging Sensors (14 papers)Visual perception and processing mechanisms (13 papers)
- Partner nations
- NetherlandsFranceUnited States
In The Last Decade
Piet Bijl
62 papers receiving 424 citations
Peers
Comparison fields: 5 of 54
- Aerospace Engineering 340
- Computer Vision and Pattern Recognition 199
- Electrical and Electronic Engineering 160
- Media Technology 144
- Atomic and Molecular Physics, and Optics 103
Countries citing papers authored by Piet Bijl
This map shows the geographic impact of Piet Bijl's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Piet Bijl with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Piet Bijl more than expected).
Fields of papers citing papers by Piet Bijl
This network shows the impact of papers produced by Piet Bijl. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Piet Bijl. The network helps show where Piet Bijl may publish in the future.
Co-authorship network of co-authors of Piet Bijl
This figure shows the co-authorship network connecting the top 25 collaborators of Piet Bijl. A scholar is included among the top collaborators of Piet Bijl based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Piet Bijl. Piet Bijl is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 4 | |
| 3 | 2 | |
| 4 | 2 | |
| 5 | 10 | |
| 6 | 1 | |
| 7 | 5 | |
| 8 | 3 | |
| 9 | 4 | |
| 10 | 3 | |
| 11 | 5 | |
| 12 | 6 | |
| 13 | 25 | |
| 14 | 5 | |
| 15 | 29 | |
| 16 | 23 | |
| 17 | 27 | |
| 18 | Target acquisition: Human observer performance studies and TARGAC model validation (Final Report) | 1 |
| 19 | 10 | |
| 20 | 23 |
About Piet Bijl
Piet Bijl is a scholar working on Aerospace Engineering, Media Technology and Computer Vision and Pattern Recognition, having authored 62 papers that have together received 517 indexed citations. Recurring topics across this work include Infrared Target Detection Methodologies (46 papers), CCD and CMOS Imaging Sensors (14 papers) and Visual perception and processing mechanisms (13 papers). The work is most often cited by research in Media Technology (144 citations), Aerospace Engineering (340 citations) and Computer Vision and Pattern Recognition (199 citations). Piet Bijl has collaborated with scholars based in Netherlands, France and United States. Frequent co-authors include J. M. Valeton, Maarten A. Hogervorst, Alexander Toet, Jan J. Koenderink, Frank L. Kooi, Judith Dijk, Klamer Schutte, Marcel P. Lucassen, Jaap A. Beintema and Astrid M. L. Kappers. Their work appears in journals such as Vision Research, Journal of the Optical Society of America A and Polymer Testing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.