Otto H. Schade
- Cognitive Neuroscience top 5%
- Atomic and Molecular Physics, and Optics top 10%
- Computer Vision and Pattern Recognition top 5%
- Electrical and Electronic Engineering
- Ophthalmology top 5%
- Topics
- Advancements in Semiconductor Devices and Circuit Design (6 papers)Semiconductor materials and devices (5 papers)CCD and CMOS Imaging Sensors (4 papers)
- Journals
- IEEE Journal of Solid-State CircuitsIEEE Transactions on Electron DevicesJournal of the Optical Society of America
- Partner nations
- United States
In The Last Decade
Otto H. Schade
19 papers receiving 534 citations
Hit Papers
Peers
Comparison fields: 5 of 75
- Cognitive Neuroscience 328
- Atomic and Molecular Physics, and Optics 180
- Computer Vision and Pattern Recognition 157
- Electrical and Electronic Engineering 128
- Ophthalmology 86
Countries citing papers authored by Otto H. Schade
This map shows the geographic impact of Otto H. Schade's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Otto H. Schade with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Otto H. Schade more than expected).
Fields of papers citing papers by Otto H. Schade
This network shows the impact of papers produced by Otto H. Schade. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Otto H. Schade. The network helps show where Otto H. Schade may publish in the future.
Co-authorship network of co-authors of Otto H. Schade
This figure shows the co-authorship network connecting the top 25 collaborators of Otto H. Schade. A scholar is included among the top collaborators of Otto H. Schade based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Otto H. Schade. Otto H. Schade is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 21 | |
| 3 | 22 | |
| 4 | 6 | |
| 5 | 15 | |
| 6 | 3 | |
| 7 | 7 | |
| 8 | 8 | |
| 9 | 3 | |
| 10 | 5 | |
| 11 | 36 | |
| 12 | 9 | |
| 13 | 15 | |
| 14 | 17 | |
| 15 | Optical and Photoelectric Analog of the Eyebreakdown → | 395 |
| 16 | 16 | |
| 17 | 4 | |
| 18 | 18 | |
| 19 | 22 | |
| 20 | 44 |
About Otto H. Schade
Otto H. Schade is a scholar working on Instrumentation, Computer Vision and Pattern Recognition and Media Technology, having authored 20 papers that have together received 666 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (6 papers), Semiconductor materials and devices (5 papers) and CCD and CMOS Imaging Sensors (4 papers). The work is most often cited by research in Cognitive Neuroscience (328 citations), Ophthalmology (86 citations) and Media Technology (78 citations). Otto H. Schade has collaborated with scholars based in United States. Frequent co-authors include L.A. Goodman, G. Dolny, Brett Goldsmith, Pierre Mertz, E. J. Kramer and Timothy J. Burns. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Electron Devices and Journal of the Optical Society of America.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.