J.P. Fillard

3.1k total citations · 2 hit papers
73 papers, 2.6k citations indexed

About

J.P. Fillard is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, J.P. Fillard has authored 73 papers receiving a total of 2.6k indexed citations (citations by other indexed papers that have themselves been cited), including 52 papers in Electrical and Electronic Engineering, 33 papers in Atomic and Molecular Physics, and Optics and 18 papers in Materials Chemistry. Recurrent topics in J.P. Fillard's work include Gas Sensing Nanomaterials and Sensors (12 papers), Semiconductor Quantum Structures and Devices (11 papers) and Silicon and Solar Cell Technologies (10 papers). J.P. Fillard is often cited by papers focused on Gas Sensing Nanomaterials and Sensors (12 papers), Semiconductor Quantum Structures and Devices (11 papers) and Silicon and Solar Cell Technologies (10 papers). J.P. Fillard collaborates with scholars based in France, United States and Germany. J.P. Fillard's co-authors include J.-C. Manifacier, J. Gasiot, M. de Murcia, E. Vicario, M. Castagné, J. Bonnafé, P. Bräunlich, G. Delacôte, Paul Montgomery and Pierre Parot and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

J.P. Fillard

72 papers receiving 2.5k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

1976 1.4k citations J.-C. Manifacier, J. Gasiot et al. Journal of Physics E Scientific Instruments profile →
Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure

1977 364 citations J.-C. Manifacier, M. de Murcia et al. profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J.P. Fillard France	17	1.8k	1.8k	520	362	354	73	2.6k
J.-C. Manifacier France	16	2.2k 1.2×	2.1k 1.2×	539 1.0×	313 0.9×	506 1.4×	56	2.9k
J. Gasiot France	21	2.0k 1.1×	1.4k 0.8×	327 0.6×	297 0.8×	182 0.5×	106	2.8k
Y. Goldstein Israel	22	1.5k 0.8×	1.6k 0.9×	959 1.8×	351 1.0×	110 0.3×	129	2.6k
L.S. Wieluński United States	27	1.3k 0.7×	985 0.5×	442 0.8×	211 0.6×	238 0.7×	126	2.1k
B. O. Seraphin United States	23	1.3k 0.7×	983 0.5×	1.3k 2.4×	265 0.7×	105 0.3×	73	2.5k
Ursula J. Gibson United States	33	1.8k 1.0×	1.4k 0.8×	727 1.4×	533 1.5×	102 0.3×	136	3.0k
D. Gerstenberg United States	13	1.1k 0.6×	725 0.4×	545 1.0×	293 0.8×	104 0.3×	20	2.0k
R. A. Collins United Kingdom	25	964 0.5×	864 0.5×	302 0.6×	244 0.7×	328 0.9×	102	1.6k
Stephen J. Fonash United States	32	3.0k 1.6×	1.5k 0.8×	1.0k 1.9×	611 1.7×	180 0.5×	193	3.5k
Tatsuo Shimizu Japan	34	3.5k 1.9×	3.4k 1.9×	628 1.2×	384 1.1×	229 0.6×	330	4.6k

Countries citing papers authored by J.P. Fillard

Since Specialization

Citations

This map shows the geographic impact of J.P. Fillard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.P. Fillard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.P. Fillard more than expected).

Fields of papers citing papers by J.P. Fillard

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.P. Fillard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.P. Fillard. The network helps show where J.P. Fillard may publish in the future.

Co-authorship network of co-authors of J.P. Fillard

This figure shows the co-authorship network connecting the top 25 collaborators of J.P. Fillard. A scholar is included among the top collaborators of J.P. Fillard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.P. Fillard. J.P. Fillard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Castagné, M., et al.. (1995). Optical properties of silicon-nitride atomic-force microscopy tips in scanning tunneling optical microscopy: experimental study. Applied Optics. 34(4). 703–703. 10 indexed citations

Fillard, J.P., et al.. (1995). Atomic force microscopy silicon tips as photon tunneling sensors: a resonant evanescent coupling experiment. Applied Optics. 34(19). 3737–3737. 7 indexed citations

Fillard, J.P., et al.. (1994). Photon tunneling from semiconductor surfaces to atomic force microscopy probes. Materials Science and Engineering B. 28(1-3). 493–496. 4 indexed citations

Triboulet, R., et al.. (1992). Qualification by optical means of CdTe substrates. Journal of Crystal Growth. 117(1-4). 227–232. 17 indexed citations

Fillard, J.P.. (1990). Investigations of oxygen precipitates in Czochralski silicon wafers by using infrared tomography. Journal of Crystal Growth. 103(1-4). 71–77. 12 indexed citations

Fillard, J.P., et al.. (1990). Submicron optical sectioning microscopy: A particular inverse problem solution adapted to epilayer defect analysis. Journal of Crystal Growth. 103(1-4). 120–125. 6 indexed citations

Bonnafé, J., et al.. (1989). An analysis of the oxygen condensation processes in silicon by laser-scanning tomography. Materials Science and Engineering B. 4(1-4). 483–487. 1 indexed citations

Fillard, J.P., et al.. (1988). Image Analysis of EL2 Distributions in LEC GaAs Si Materials. Japanese Journal of Applied Physics. 27(2A). L258–L258. 3 indexed citations

Fillard, J.P., et al.. (1986). Scattering and Absorption of Infrared Light on EL2 Clusters in GaAs Semi-Insulating Materials. MRS Proceedings. 69. 4 indexed citations

10.

Castagné, M., J.P. Fillard, & J. Bonnafé. (1985). EL2 related levels in GaAs-SI: Transmission and dispersion in infra-red imaging. Solid State Communications. 54(7). 653–656. 9 indexed citations

11.

Fillard, J.P., J. Bonnafé, & M. Castagné. (1984). Direct evidence for a charge-controlled dipolar structure of the EL2 complex center in semi-insulating GaAs. Journal of Applied Physics. 56(10). 3020–3021. 14 indexed citations

12.

Gasiot, J., P. Bräunlich, & J.P. Fillard. (1982). Laser heating in thermoluminescence dosimetry. Journal of Applied Physics. 53(7). 5200–5209. 23 indexed citations

13.

Vanderschueren, J., et al.. (1980). Simulation of field-induced thermally stimulated currents in dielectrics. Application to the dipolar case in polymeric systems. Journal of Applied Physics. 51(9). 4967–4975. 19 indexed citations

14.

Fillard, J.P. & J. van Turnhout. (1977). Thermally stimulated processes in solids : new prospects : proceedings of the international workshop on thermally stimulated processes in solids, Montpellier, June 22-25, 1976. Elsevier eBooks. 8 indexed citations

15.

Fillard, J.P. & J. Gasiot. (1977). Towards a logical analysis of the mathematical basis of thermally stimulated processes. Journal of Electrostatics. 3(1-3). 37–42. 2 indexed citations

16.

Gasiot, J. & J.P. Fillard. (1977). Correlation in simultaneous TSC and TSL measurements. Journal of Applied Physics. 48(7). 3171–3172. 11 indexed citations

17.

Manifacier, J.-C., J. Gasiot, & J.P. Fillard. (1976). A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film. Journal of Physics E Scientific Instruments. 9(11). 1002–1004. 1449 indexed citations breakdown →

18.

Fillard, J.P., et al.. (1972). Stimulated light emission in SnO2 high resistivity monocrystals. physica status solidi (a). 9(2). K169–K172. 14 indexed citations

19.

Fillard, J.P., et al.. (1971). A possibility for the determination of the microscopic mobility of carriers in semiconductors under SCLC conditions. Solid-State Electronics. 14(5). 371–372. 2 indexed citations

20.

Fillard, J.P. & J. Gasiot. (1970). Thermally stimulated currents in Cu2O. Journal of Physics and Chemistry of Solids. 31(9). 2139–2141. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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