P. H. Keck
- Electrical and Electronic Engineering top 10%
- Materials Chemistry top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Biomedical Engineering
- Computational Mechanics top 10%
- Co-authors
- W. KaiserC. F. M. de LangeMarcel J. E. GolayLawrence SuchowG. H. SchwuttkeJ. D. BroderRaquel L. LiebermanS. B. Levin
- Topics
- Silicon and Solar Cell Technologies (3 papers)Solidification and crystal growth phenomena (3 papers)Ion-surface interactions and analysis (2 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryAtomic and Molecular Physics, and Optics
- Partner nations
- United States
In The Last Decade
P. H. Keck
17 papers receiving 710 citations
Peers
Comparison fields: 5 of 56
- Electrical and Electronic Engineering 573
- Materials Chemistry 461
- Atomic and Molecular Physics, and Optics 255
- Biomedical Engineering 133
- Computational Mechanics 100
Countries citing papers authored by P. H. Keck
This map shows the geographic impact of P. H. Keck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. H. Keck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. H. Keck more than expected).
Fields of papers citing papers by P. H. Keck
This network shows the impact of papers produced by P. H. Keck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. H. Keck. The network helps show where P. H. Keck may publish in the future.
Co-authorship network of co-authors of P. H. Keck
This figure shows the co-authorship network connecting the top 25 collaborators of P. H. Keck. A scholar is included among the top collaborators of P. H. Keck based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. H. Keck. P. H. Keck is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 2 | |
| 3 | 5 | |
| 4 | 36 | |
| 5 | 205 | |
| 6 | 331 | |
| 7 | 1 | |
| 8 | 14 | |
| 9 | 17 | |
| 10 | 3 | |
| 11 | 77 | |
| 12 | 49 | |
| 13 | 24 | |
| 14 | 53 | |
| 15 | 31 | |
| 16 | 31 | |
| 17 | 11 |
About P. H. Keck
P. H. Keck is a scholar working on Surfaces, Coatings and Films, Materials Chemistry and Computational Mechanics, having authored 17 papers that have together received 893 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (3 papers), Solidification and crystal growth phenomena (3 papers) and Ion-surface interactions and analysis (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (573 citations), Materials Chemistry (461 citations) and Atomic and Molecular Physics, and Optics (255 citations). P. H. Keck has collaborated with scholars based in United States. Frequent co-authors include W. Kaiser, C. F. M. de Lange, Marcel J. E. Golay, Lawrence Suchow, G. H. Schwuttke, J. D. Broder, Raquel L. Lieberman, S. B. Levin and Claire E. White. Their work appears in journals such as Journal of the American Chemical Society, Journal of Applied Physics and Analytical Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.