Oleg M. Orlov

721 total citations
37 papers, 587 citations indexed

About

Oleg M. Orlov is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Cellular and Molecular Neuroscience. According to data from OpenAlex, Oleg M. Orlov has authored 37 papers receiving a total of 587 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 14 papers in Materials Chemistry and 4 papers in Cellular and Molecular Neuroscience. Recurrent topics in Oleg M. Orlov's work include Semiconductor materials and devices (27 papers), Ferroelectric and Negative Capacitance Devices (20 papers) and Advanced Memory and Neural Computing (17 papers). Oleg M. Orlov is often cited by papers focused on Semiconductor materials and devices (27 papers), Ferroelectric and Negative Capacitance Devices (20 papers) and Advanced Memory and Neural Computing (17 papers). Oleg M. Orlov collaborates with scholars based in Russia, Egypt and Taiwan. Oleg M. Orlov's co-authors include V. A. Gritsenko, Andrey M. Markeev, Timofey V. Perevalov, Damir R. Islamov, Аnna G. Chernikova, Yu. Yu. Lebedinskiǐ, Konstantin Egorov, Maxim G. Kozodaev, Andrei A. Gismatulin and D. V. Negrov and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Acta Materialia.

In The Last Decade

Oleg M. Orlov

36 papers receiving 551 citations

Peers

Oleg M. Orlov
Sungho Heo South Korea
I. Kasko Germany
Hubert Hody Belgium
T. Witters Belgium
Oleg M. Orlov
Citations per year, relative to Oleg M. Orlov Oleg M. Orlov (= 1×) peers Enric Grustan‐Gutierrez

Countries citing papers authored by Oleg M. Orlov

Since Specialization
Citations

This map shows the geographic impact of Oleg M. Orlov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Oleg M. Orlov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Oleg M. Orlov more than expected).

Fields of papers citing papers by Oleg M. Orlov

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Oleg M. Orlov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Oleg M. Orlov. The network helps show where Oleg M. Orlov may publish in the future.

Co-authorship network of co-authors of Oleg M. Orlov

This figure shows the co-authorship network connecting the top 25 collaborators of Oleg M. Orlov. A scholar is included among the top collaborators of Oleg M. Orlov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Oleg M. Orlov. Oleg M. Orlov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gismatulin, Andrei A., Г. Н. Камаев, В. Н. Кручинин, et al.. (2021). Charge transport mechanism in the forming-free memristor based on silicon nitride. Scientific Reports. 11(1). 2417–2417. 32 indexed citations
2.
Gritsenko, V. A., Andrei A. Gismatulin, & Oleg M. Orlov. (2021). Memory Properties of SiOx- and SiNx-Based Memristors. Nanobiotechnology Reports. 16(6). 722–731. 4 indexed citations
3.
Islamov, Damir R., et al.. (2020). Impact of oxygen vacancy on the ferroelectric properties of lanthanum-doped hafnium oxide. Applied Physics Letters. 117(16). 42 indexed citations
4.
Orlov, Oleg M., et al.. (2020). Charge Transport Mechanism in a Formless Memristor Based on Silicon Nitride. Russian Microelectronics. 49(5). 372–377. 4 indexed citations
5.
Orlov, Oleg M., et al.. (2019). Features of the Improving of the HFO2 ReRAM Cells Characteristics Reproducibility. 2087–2089. 3 indexed citations
6.
Orlov, Oleg M., et al.. (2017). FRAM test memory cells radiation hardness research. 255–257. 1 indexed citations
7.
Islamov, Damir R., Аnna G. Chernikova, Maxim G. Kozodaev, et al.. (2017). Leakage Currents Mechanism in Thin Films of Ferroelectric Hf0.5Zr0.5O2. ECS Transactions. 75(32). 123–129. 12 indexed citations
8.
Islamov, Damir R., Аnna G. Chernikova, Maxim G. Kozodaev, et al.. (2017). Leakage currents mechanism in thin films of ferroelectric Hf0.5Zr0.5O2. Journal of Physics Conference Series. 864. 12002–12002. 6 indexed citations
9.
Islamov, Damir R., В. Н. Кручинин, В. Ш. Алиев, et al.. (2016). Potential Fluctuation in RRAM Based on Non-Stoichiometric Hafnium Sub-Oxides. Advances in science and technology. 99. 69–74. 7 indexed citations
10.
Islamov, Damir R., et al.. (2016). Charge Transport Mechanism of Stress Induced Leakage Current in Thermal Silicon Oxide. ECS Transactions. 75(5). 57–62. 3 indexed citations
11.
Negrov, D. V., et al.. (2016). Integration of functional elements of resistive nonvolative memory with 1T-1R topology. Russian Microelectronics. 45(6). 383–395. 2 indexed citations
12.
Orlov, Oleg M., et al.. (2015). Analysis of characteristics for periodically doped channel field-effect transistors under extreme thermal conditions. Russian Microelectronics. 44(4). 231–235. 1 indexed citations
13.
Islamov, Damir R., Аnna G. Chernikova, Maxim G. Kozodaev, et al.. (2015). Charge transport mechanism in thin films of amorphous and ferroelectric Hf0.5Zr0.5O2. Journal of Experimental and Theoretical Physics Letters. 102(8). 544–547. 25 indexed citations
14.
Orlov, Oleg M., V. A. Gritsenko, В. Н. Кручинин, et al.. (2015). Nanoscale Potential Fluctuation in Non-Stoichiometric Hafnium Suboxides. ECS Transactions. 69(5). 237–241. 4 indexed citations
15.
Orlov, Oleg M., et al.. (2014). Resistive switching in TiN/Hf x Al1 − x O y /HfO2/TiN and TiN/HfO2/Ti/TiN structures. Russian Microelectronics. 43(5). 328–332. 2 indexed citations
16.
Orlov, Oleg M., A. S. Baturin, Konstantin Egorov, et al.. (2014). Nonvolatile memory cells based on the effect of resistive switching in depth-graded ternary Hf x Al1 − x O y oxide films. Russian Microelectronics. 43(4). 239–245. 6 indexed citations
17.
Legotin, S., et al.. (2010). A silicon position-sensitive detector of charged particles and radiations on the basis of functionally integrated structures with nano-micron active regions. Instruments and Experimental Techniques. 53(5). 657–662. 1 indexed citations
18.
Orlov, Oleg M., et al.. (2008). Distinctive features and problems of CMOS technology for decrease in the node size to 0.18 μm or less. Nanotechnologies in Russia. 3(7-8). 502–506. 9 indexed citations
19.
Orlov, Oleg M., et al.. (2004). SIMS analysis of ultrathin implanted arsenic layers in silicon. Technical Physics Letters. 30(11). 897–899. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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