N. Schulz

740 citations
29 papers · 539 indexed · h-index 12

N. Schulz

25 papers receiving 494 citations

Peers

N. Schulz
Comparison fields: 5 of 28
  • Atomic and Molecular Physics, and Optics 363
  • Electrical and Electronic Engineering 485
  • Surfaces, Coatings and Films 38
  • Spectroscopy 60
  • Materials Chemistry 48
Replace R.E. Bartolo with:
R.E. Bartolo United States
G. Beister Germany
В. К. Кононенко Belarus
R. Pathak United States
Y. Kan Japan
C. Schönbein Germany
Richard Jefferies United Kingdom
J.S. Roberts United Kingdom
K. Kasaya Japan
Tomi Leinonen Finland
N. Schulz relative to R.E. Bartolo United States R.E. Bartolo's profile →
Citations per field
00.5×1.7×
R.E. Bartolo · 1×
Citations per year

Countries citing papers authored by N. Schulz

Since Specialization
Citations

This map shows the geographic impact of N. Schulz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Schulz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Schulz more than expected).

Fields of papers citing papers by N. Schulz

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Schulz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Schulz. The network helps show where N. Schulz may publish in the future.

Co-authorship network

The 25 scholars most cited alongside N. Schulz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with N. Schulz Line = papers co-authored together N. Schulz links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20240
2 20240
3 20241
4 20231
5 20097
6 200818
7 200836
8 20082
9 200892
10 20082
11 200821
12 20081
13 20071
14 20078
15 200721
16 20076
17 200712
18 20061
19 199111
20 198620

About N. Schulz

N. Schulz is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Spectroscopy, Condensed Matter Physics and Aerospace Engineering, having authored 29 papers that have together received 539 indexed citations. Recurring topics across this work include Semiconductor Lasers and Optical Devices (20 papers), Photonic and Optical Devices (18 papers), Semiconductor Quantum Structures and Devices (14 papers), Advanced Fiber Laser Technologies (8 papers), Solid State Laser Technologies (5 papers), Spectroscopy and Laser Applications (4 papers), Terahertz technology and applications (3 papers) and Laser Design and Applications (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (363 citations), Electrical and Electronic Engineering (485 citations), Surfaces, Coatings and Films (38 citations), Spectroscopy (60 citations) and Materials Chemistry (48 citations). N. Schulz has collaborated with scholars based in Germany, United Kingdom and United States. Frequent co-authors include F. Arndt, J. Wagner, Marcel Rattunde, J.‐M. Hopkins, D. Burns, C. Manz, K. Köhler, T. Heinzel, Stefan Hugger and M. Cerchez. Their work appears in journals such as IEEE Photonics Technology Letters, IEEE Transactions on Microwave Theory and Techniques, Optics Express, Applied Physics Letters and Journal of Lightwave Technology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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