M.J. Verheijen
- Biomedical Engineering top 5%
- Electrical and Electronic Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Surfaces, Coatings and Films top 10%
- Materials Chemistry
- Co-authors
- J. HaismaJan van den BergPaul van der SluisJustin RollerOzan UgurluZhenxin ZhongH. de KoningJ.J.M. Binsma
- Topics
- Advancements in Photolithography Techniques (3 papers)Electron and X-Ray Spectroscopy Techniques (3 papers)Advanced Measurement and Metrology Techniques (2 papers)
- Partner nations
- NetherlandsFinlandUnited States
In The Last Decade
M.J. Verheijen
11 papers receiving 549 citations
Hit Papers
Peers
Comparison fields: 5 of 39
- Biomedical Engineering 514
- Electrical and Electronic Engineering 405
- Atomic and Molecular Physics, and Optics 181
- Surfaces, Coatings and Films 71
- Materials Chemistry 50
Countries citing papers authored by M.J. Verheijen
This map shows the geographic impact of M.J. Verheijen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.J. Verheijen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.J. Verheijen more than expected).
Fields of papers citing papers by M.J. Verheijen
This network shows the impact of papers produced by M.J. Verheijen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.J. Verheijen. The network helps show where M.J. Verheijen may publish in the future.
Co-authorship network of co-authors of M.J. Verheijen
This figure shows the co-authorship network connecting the top 25 collaborators of M.J. Verheijen. A scholar is included among the top collaborators of M.J. Verheijen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M.J. Verheijen. M.J. Verheijen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 2 | |
| 3 | 9 | |
| 4 | 3 | |
| 5 | Mold-assisted nanolithography: A process for reliable pattern replicationbreakdown → | 520 |
| 6 | 6 | |
| 7 | 4 | |
| 8 | 1 | |
| 9 | 12 | |
| 10 | 23 | |
| 11 | 1 |
About M.J. Verheijen
M.J. Verheijen is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 11 papers that have together received 583 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers) and Advanced Measurement and Metrology Techniques (2 papers). The work is most often cited by research in Biomedical Engineering (514 citations), Surfaces, Coatings and Films (71 citations) and Electrical and Electronic Engineering (405 citations). M.J. Verheijen has collaborated with scholars based in Netherlands, Finland and United States. Frequent co-authors include J. Haisma, Jan van den Berg, Paul van der Sluis, Justin Roller, Ozan Ugurlu, Zhenxin Zhong, H. de Koning, J.J.M. Binsma, F.C.M.J.M. van Delft and M. Strauss. Their work appears in journals such as Applied Physics Letters, Journal of Modern Optics and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.