Minkyung Bae

492 total citations
19 papers, 414 citations indexed

About

Minkyung Bae is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Condensed Matter Physics. According to data from OpenAlex, Minkyung Bae has authored 19 papers receiving a total of 414 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 1 paper in Condensed Matter Physics. Recurrent topics in Minkyung Bae's work include Thin-Film Transistor Technologies (18 papers), ZnO doping and properties (7 papers) and Silicon and Solar Cell Technologies (6 papers). Minkyung Bae is often cited by papers focused on Thin-Film Transistor Technologies (18 papers), ZnO doping and properties (7 papers) and Silicon and Solar Cell Technologies (6 papers). Minkyung Bae collaborates with scholars based in South Korea and United States. Minkyung Bae's co-authors include Dong Myong Kim, Dae Hwan Kim, Yongsik Kim, Dongsik Kong, Sung‐Chul Kim, Hyuck‐In Kwon, Jaeman Jang, Yong Woo Jeon, Hyungtak Kim and Kyung Min Lee and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.

In The Last Decade

Minkyung Bae

19 papers receiving 397 citations

Peers

Countries citing papers authored by Minkyung Bae

Since Specialization

Citations

This map shows the geographic impact of Minkyung Bae's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Minkyung Bae with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Minkyung Bae more than expected).

Fields of papers citing papers by Minkyung Bae

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Minkyung Bae. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Minkyung Bae. The network helps show where Minkyung Bae may publish in the future.

Co-authorship network of co-authors of Minkyung Bae

This figure shows the co-authorship network connecting the top 25 collaborators of Minkyung Bae. A scholar is included among the top collaborators of Minkyung Bae based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Minkyung Bae. Minkyung Bae is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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19 of 19 papers shown

#	Work	Indexed citations
1	Characterization of Density-of-States in Polymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator 2013 ·JSTS Journal of Semiconductor Technology and Science ·(unknown), Jaeman Jang, Minkyung Bae, Jaewook Lee, (unknown), (unknown), (unknown), Dong Myong Kim, Dae Hwan Kim	5
2	Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors 2013 ·IEEE Transactions on Electron Devices ·Minkyung Bae, Kyung Min Lee, Eou‐Sik Cho, Hyuck‐In Kwon, Dong Myong Kim, Dae Hwan Kim	34
3	P‐141L: Late‐News Poster : Characterization of Physical Parameter‐Based Reliability on the Negative Bias Illumination Stress with Wavelength‐Dependence in Amorphous Silicon Thin‐Film Transistors 2012 ·SID Symposium Digest of Technical Papers ·(unknown), (unknown), (unknown), (unknown), Dongsik Kong, Yongsik Kim, Minkyung Bae, Sunwoong Choi, Dong Myong Kim, Dae Hwan Kim, (unknown), (unknown), (unknown)	1
4	Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors 2012 ·Dae Hwan Kim, (unknown), (unknown), (unknown), Minkyung Bae, Dongsik Kong, (unknown), Dong Myong Kim, Byung Du Ahn, Chan Yun Kim, Je‐Hun Lee, Ho‐Hyun Nahm, Yong‐Sung Kim	1
5	Amorphous InGaZnO Thin-Film Transistors—Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range 2012 ·IEEE Transactions on Electron Devices ·Yongsik Kim, Minkyung Bae, (unknown), Dongsik Kong, (unknown), Hyungtak Kim, (unknown), Dong Myong Kim, Dae Hwan Kim	65
6	Amorphous InGaZnO Thin-Film Transistors—Part II: Modeling and Simulation of Negative Bias Illumination Stress-Induced Instability 2012 ·IEEE Transactions on Electron Devices ·Yongsik Kim, Sung‐Chul Kim, (unknown), Minkyung Bae, (unknown), Dongsik Kong, Sunwoong Choi, Dong Myong Kim, Dae Hwan Kim	46
7	Extraction of the sub-bandgap density-of-states in polymer thin-film transistors with the multi-frequency capacitance-voltage spectroscopy 2012 ·Applied Physics Letters ·Jaeman Jang, (unknown), Minkyung Bae, Jae‐Wook Lee, Dong Myong Kim, Dae Hwan Kim, Jiyoul Lee, Bang‐Lin Lee, Bonwon Koo, Yong Jin	24
8	3.4L: Late‐News Paper: Physical Model and Simulation Platform for High‐Level Instability‐Aware Design of Amorphous Oxide Semiconductor Thin‐Film Transistors 2012 ·SID Symposium Digest of Technical Papers ·Dae Hwan Kim, (unknown), Yongsik Kim, (unknown), Minkyung Bae, Dongsik Kong, (unknown), Dong Myong Kim, Byung Du Ahn, Chan Yun Kim, Je‐Hun Lee, Ho‐Hyun Nahm, Yong‐Sung Kim	1
9	Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors 2012 ·IEEE Electron Device Letters ·Minkyung Bae, (unknown), Yongsik Kim, Dongsik Kong, (unknown), (unknown), (unknown), (unknown), Dae Hwan Kim, Dong Myong Kim	46
10	Quantitative Analysis of Negative Bias Illumination Stress-Induced Instability Mechanisms in Amorphous InGaZnO Thin-Film Transistors 2011 ·Journal of the Korean Physical Society ·(unknown), Minkyung Bae, Dongsik Kong, (unknown), (unknown), (unknown), (unknown), Dong Myong Kim, Dae Hwan Kim	1
11	Effect of the Active Layer Thickness on the Negative Bias Illumination Stress-induced Instability in Amorphous InGaZnO Thin-film Transistors 2011 ·Journal of the Korean Physical Society ·Dongsik Kong, (unknown), Yongsik Kim, Minkyung Bae, Jaeman Jang, (unknown), (unknown), (unknown), Dong Myong Kim, Dae Hwan Kim	6
12	Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors 2011 ·IEEE Electron Device Letters ·Sung‐Chul Kim, Yong Woo Jeon, Yongsik Kim, Dongsik Kong, (unknown), Minkyung Bae, Je‐Hun Lee, Byung Du Ahn, (unknown), Jun‐Hyun Park, Jae‐Woo Park, Hyuck‐In Kwon, Dong Myong Kim, Dae Hwan Kim	63
13	P‐202L: Late‐News Poster : Density‐of‐States Based Analysis on the Effect of Active Thin‐film Thickness on Current Stress‐induced Instability in Amorphous InGaZnO AMOLED Driver TFTs 2011 ·SID Symposium Digest of Technical Papers ·Dongsik Kong, (unknown), Yongsik Kim, Minkyung Bae, Yong Woo Jeon, Sung‐Chul Kim, (unknown), (unknown), (unknown), (unknown), Dong Myong Kim, Dae Hwan Kim, Byung Du Ahn, (unknown), Jun‐Hyun Park, Joo Han Kim, Jae‐Woo Park, Je‐Hun Lee	1
14	The Effect of the Active Layer Thickness on the Negative Bias Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors 2011 ·IEEE Electron Device Letters ·Dongsik Kong, (unknown), Yongsik Kim, Minkyung Bae, Yong Woo Jeon, Sung‐Chul Kim, Dong Myong Kim, Dae Hwan Kim	21
15	Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density 2011 ·IEEE Electron Device Letters ·Minkyung Bae, Yongsik Kim, Dongsik Kong, (unknown), (unknown), (unknown), (unknown), Dong Myong Kim, Dae Hwan Kim	37
16	Differential Body-Factor Technique for Characterization of Interface Traps in MOSFETs 2011 ·IEEE Electron Device Letters ·(unknown), Minkyung Bae, Jaeman Jang, Hagyoul Bae, (unknown), (unknown), Jieun Lee, Dae Hwan Kim, Dong Myong Kim	10
17	Physics-Based SPICE Model of a-InGaZnO Thin-Film Transistor Using Verilog-A 2011 ·JSTS Journal of Semiconductor Technology and Science ·Yong Woo Jeon, (unknown), (unknown), Minkyung Bae, (unknown), Dongsik Kong, (unknown), (unknown), Jaeman Jang, Dong Myong Kim, Daehwan Kim	6
18	Extraction of Separated Source and Drain Resistances in Amorphous Indium–Gallium–Zinc Oxide TFTs Through $C$– $V$ Characterization 2011 ·IEEE Electron Device Letters ·Hagyoul Bae, Sung‐Chul Kim, Minkyung Bae, (unknown), Dongsik Kong, (unknown), Jaeman Jang, Jieun Lee, Dae Hwan Kim, Dong Myong Kim	23
19	Extraction of Subgap Donor States in a-IGZO TFTs by Generation–Recombination Current Spectroscopy 2011 ·IEEE Electron Device Letters ·Minkyung Bae, Yongsik Kim, Sung‐Chul Kim, Dong Myong Kim, Dae Hwan Kim	23

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