Matthieu Beaumel

606 total citations
13 papers, 117 citations indexed

About

Matthieu Beaumel is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Radiation. According to data from OpenAlex, Matthieu Beaumel has authored 13 papers receiving a total of 117 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 5 papers in Aerospace Engineering and 4 papers in Radiation. Recurrent topics in Matthieu Beaumel's work include CCD and CMOS Imaging Sensors (9 papers), Radiation Effects in Electronics (6 papers) and Radiation Detection and Scintillator Technologies (4 papers). Matthieu Beaumel is often cited by papers focused on CCD and CMOS Imaging Sensors (9 papers), Radiation Effects in Electronics (6 papers) and Radiation Detection and Scintillator Technologies (4 papers). Matthieu Beaumel collaborates with scholars based in Netherlands, France and Belgium. Matthieu Beaumel's co-authors include Dominique Hervé, C. Inguimbert, R. Ecoffet, A. Bardoux, Cédric Virmontois, D. Falguère, Thierry Nuns, Dominique Blain, E. Lorfèvre and S. Bourdarie and has published in prestigious journals such as IEEE Transactions on Nuclear Science, International Conference on Space Optics — ICSO 2018 and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

In The Last Decade

Matthieu Beaumel

12 papers receiving 107 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Matthieu Beaumel Netherlands 6 106 34 24 18 7 13 117
Wojtek Hajdas Switzerland 6 54 0.5× 23 0.7× 12 0.5× 32 1.8× 14 2.0× 16 82
M.A. Baturitsky Belarus 6 53 0.5× 41 1.2× 15 0.6× 24 1.3× 5 0.7× 22 88
P. Bambade France 6 63 0.6× 47 1.4× 41 1.7× 17 0.9× 3 0.4× 39 86
J. Chrin Switzerland 6 34 0.3× 62 1.8× 20 0.8× 16 0.9× 20 105
Lizhi Sheng China 6 26 0.2× 27 0.8× 11 0.5× 36 2.0× 15 2.1× 26 76
C. Rush United States 5 34 0.3× 67 2.0× 6 0.3× 30 1.7× 3 0.4× 16 90
G. Boorman United Kingdom 6 60 0.6× 34 1.0× 21 0.9× 27 1.5× 28 86
M. Huffer United States 4 32 0.3× 16 0.5× 14 0.6× 5 0.3× 12 1.7× 7 56
G. Wang United States 6 89 0.8× 32 0.9× 47 2.0× 6 0.3× 12 1.7× 9 99
Adam Jeff Switzerland 4 25 0.2× 30 0.9× 22 0.9× 12 0.7× 3 0.4× 15 51

Countries citing papers authored by Matthieu Beaumel

Since Specialization
Citations

This map shows the geographic impact of Matthieu Beaumel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Matthieu Beaumel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Matthieu Beaumel more than expected).

Fields of papers citing papers by Matthieu Beaumel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Matthieu Beaumel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Matthieu Beaumel. The network helps show where Matthieu Beaumel may publish in the future.

Co-authorship network of co-authors of Matthieu Beaumel

This figure shows the co-authorship network connecting the top 25 collaborators of Matthieu Beaumel. A scholar is included among the top collaborators of Matthieu Beaumel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Matthieu Beaumel. Matthieu Beaumel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
1.
Montay, Guillaume, et al.. (2024). A Comparison of Board-Level Lot Acceptance Testing Method With Worst Case Analysis Results. IEEE Transactions on Nuclear Science. 71(8). 1906–1913.
2.
Koechlin, Charlie, et al.. (2019). Optical switch matrix development for new concepts of photonic based flexible telecom payloads. International Conference on Space Optics — ICSO 2018. 124–124. 5 indexed citations
3.
Inguimbert, C., et al.. (2018). In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking. IEEE Transactions on Nuclear Science. 65(8). 1676–1684. 3 indexed citations
4.
Virmontois, Cédric, et al.. (2018). Dose and Single-Event Effects on a Color CMOS Camera for Space Exploration. IEEE Transactions on Nuclear Science. 66(1). 104–110. 23 indexed citations
5.
Inguimbert, C., et al.. (2014). Modeling the Dark Current Non-Uniformity of Image Sensors With GEANT4. IEEE Transactions on Nuclear Science. 61(6). 3323–3330. 16 indexed citations
6.
Beaumel, Matthieu, et al.. (2014). Proton, Electron, and Heavy Ion Single Event Effects on the HAS2 CMOS Image Sensor. IEEE Transactions on Nuclear Science. 61(4). 1909–1917. 9 indexed citations
7.
Beaumel, Matthieu, et al.. (2013). Proton, electron and heavy ion single event effects on the HAS2 CMOS Image Sensor. 3 indexed citations
8.
Beaumel, Matthieu, et al.. (2010). Cobalt-60, Proton and Electron Irradiation of a Radiation-Hardened Active Pixel Sensor. IEEE Transactions on Nuclear Science. 57(4). 2056–2065. 30 indexed citations
9.
Hervé, Dominique, et al.. (2009). Total dose, displacement damage, and single event effects in the radiation hardened CMOS APS HAS2. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7474. 74741C–74741C. 4 indexed citations
10.
Beaumel, Matthieu, et al.. (2009). Cobalt-60, proton and electron irradiation of a radiation-hardened active pixel sensor. 535–538. 1 indexed citations
11.
Beaumel, Matthieu, Thierry Bouchet, Larry L. Pater, et al.. (2008). SEGR Study on Power MOSFETs: Multiple Impacts Assumption. IEEE Transactions on Nuclear Science. 55(4). 2181–2187. 20 indexed citations
12.
Beaumel, Matthieu, et al.. (2008). Charge-coupled device proton-induced degradation observed on low earth orbit star tracker. 370–375. 1 indexed citations
13.
Beaumel, Matthieu, Thierry Bouchet, Larry L. Pater, et al.. (2007). SEGR study on Power MOSFETs: Multiple impacts assumption. 1–8. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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