C. Inguimbert

1.2k total citations
76 papers, 891 citations indexed

About

C. Inguimbert is a scholar working on Electrical and Electronic Engineering, Radiation and Computational Mechanics. According to data from OpenAlex, C. Inguimbert has authored 76 papers receiving a total of 891 indexed citations (citations by other indexed papers that have themselves been cited), including 58 papers in Electrical and Electronic Engineering, 22 papers in Radiation and 14 papers in Computational Mechanics. Recurrent topics in C. Inguimbert's work include Radiation Effects in Electronics (19 papers), Semiconductor materials and devices (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). C. Inguimbert is often cited by papers focused on Radiation Effects in Electronics (19 papers), Semiconductor materials and devices (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). C. Inguimbert collaborates with scholars based in France, Netherlands and United States. C. Inguimbert's co-authors include S. Duzellier, Thierry Nuns, R. Ecoffet, F. Bezerra, D. Falguère, Scott R. Messenger, Robert Ecoffet, G. Hubert, M. Raine and J. Puech and has published in prestigious journals such as Journal of Applied Physics, Applied Surface Science and Journal of Physics D Applied Physics.

In The Last Decade

C. Inguimbert

72 papers receiving 853 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. Inguimbert France 17 755 170 120 95 91 76 891
M. Raine France 22 1.0k 1.4× 172 1.0× 76 0.6× 82 0.9× 47 0.5× 71 1.2k
C.J. Dale United States 22 1.4k 1.8× 147 0.9× 85 0.7× 196 2.1× 289 3.2× 53 1.5k
Bryan J. Rice United States 15 420 0.6× 49 0.3× 67 0.6× 166 1.7× 22 0.2× 59 701
A. R. Frederickson United States 20 632 0.8× 85 0.5× 345 2.9× 14 0.1× 132 1.5× 67 1.1k
P. Michelato Italy 12 276 0.4× 128 0.8× 58 0.5× 99 1.0× 208 2.3× 99 513
N. Balcon France 17 761 1.0× 64 0.4× 114 0.9× 16 0.2× 314 3.5× 49 1.0k
Pascal Meyer Germany 16 227 0.3× 513 3.0× 59 0.5× 80 0.8× 40 0.4× 85 829
Marco Van Uffelen Belgium 15 889 1.2× 77 0.5× 145 1.2× 56 0.6× 47 0.5× 84 1.1k
Michikazu Kinsho Japan 11 326 0.4× 93 0.5× 61 0.5× 106 1.1× 348 3.8× 125 498
Paul B. Reid United States 15 154 0.2× 212 1.2× 68 0.6× 60 0.6× 30 0.3× 89 668

Countries citing papers authored by C. Inguimbert

Since Specialization
Citations

This map shows the geographic impact of C. Inguimbert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Inguimbert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Inguimbert more than expected).

Fields of papers citing papers by C. Inguimbert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Inguimbert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Inguimbert. The network helps show where C. Inguimbert may publish in the future.

Co-authorship network of co-authors of C. Inguimbert

This figure shows the co-authorship network connecting the top 25 collaborators of C. Inguimbert. A scholar is included among the top collaborators of C. Inguimbert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Inguimbert. C. Inguimbert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Inguimbert, C.. (2025). Multiple threshold displacement energy in Non-Ionizing Energy Loss calculations for compound semiconductors. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 561. 165622–165622. 1 indexed citations
2.
Inguimbert, C., et al.. (2025). Aging model of optical signature for space paint coating under proton radiation. Journal of Quantitative Spectroscopy and Radiative Transfer. 345. 109561–109561.
3.
Inguimbert, C., et al.. (2023). Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films. Journal of Applied Physics. 133(13). 1 indexed citations
4.
Lambert, Damien, N. Richard, M. Raine, et al.. (2023). Neutron Displacement Damage Cross Section in GaN: Numerical Evaluations and Differences With Si. IEEE Transactions on Nuclear Science. 70(8). 1870–1877. 5 indexed citations
5.
Inguimbert, C., et al.. (2022). Modelling the impact on the secondary electron yield of carbon layers of various thicknesses on copper substrate. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 526. 1–8. 4 indexed citations
6.
Arnoult, Alexandre, Inès Massiot, Thierry Nuns, et al.. (2021). As-Grown InGaAsN Subcells for Multijunction Solar Cells by Molecular Beam Epitaxy. IEEE Journal of Photovoltaics. 11(5). 1271–1277. 4 indexed citations
7.
Massiot, Inès, Alexandre Arnoult, Thierry Nuns, et al.. (2021). Degradation Study of InGaAsN p-i-n Solar Cell Under 1-MeV Electron Irradiation. IEEE Transactions on Nuclear Science. 68(8). 1694–1700. 1 indexed citations
8.
Inguimbert, C., et al.. (2021). A Kinetic Monte Carlo Algorithm to Model the Annealing Process and Compute the Dark Current Nonuniformity. IEEE Transactions on Nuclear Science. 68(8). 1701–1711.
9.
Inguimbert, C., et al.. (2018). In-Flight Dark Current Nonuniformity Used for Space Environment Model Benchmarking. IEEE Transactions on Nuclear Science. 65(8). 1676–1684. 3 indexed citations
10.
Inguimbert, C., et al.. (2018). Effect of rectangular grooves and checkerboard patterns on the electron emission yield. Journal of Applied Physics. 124(9). 9 indexed citations
11.
Inguimbert, C., et al.. (2018). Gamma non-ionizing energy loss: Comparison with the damage factor in silicon devices. Journal of Applied Physics. 123(9). 16 indexed citations
12.
Inguimbert, C., et al.. (2017). Ionizing Doses Calculations for Low Energy Electrons in Silicon and Aluminum. IEEE Transactions on Nuclear Science. 1–1. 5 indexed citations
13.
Bourdarie, S., C. Inguimbert, A. Sicard, et al.. (2017). Benchmarking ionizing space environment models. IEEE Transactions on Nuclear Science. 1–1. 8 indexed citations
14.
Inguimbert, C., et al.. (2017). Electron emission yield for low energy electrons: Monte Carlo simulation and experimental comparison for Al, Ag, and Si. Journal of Applied Physics. 121(21). 24 indexed citations
15.
16.
Gilard, O., et al.. (2014). Statistical Analysis of Random Telegraph Signal Maximum Transition Amplitudes in an Irradiated CMOS Image Sensor. IEEE Transactions on Nuclear Science. 61(2). 939–947. 3 indexed citations
17.
18.
Chatry, C., R. Ecoffet, G. Rolland, et al.. (2004). OMERE - A Toolkit for Space Environment. ESA Special Publication. 536. 639. 7 indexed citations
19.
Nieminen, P., R. Harboe-Sørensen, Rose Marino, et al.. (2003). Standards for Space Radiation Environments and Effects. ESA Special Publication. 536. 175–179. 2 indexed citations
20.
Chatry, C., R. Ecoffet, G. Rolland, et al.. (2003). A toolkit for space environment. 639–641. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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