Mathias Senoner

598 total citations
22 papers, 471 citations indexed

About

Mathias Senoner is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, Mathias Senoner has authored 22 papers receiving a total of 471 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 9 papers in Atomic and Molecular Physics, and Optics and 9 papers in Computational Mechanics. Recurrent topics in Mathias Senoner's work include Ion-surface interactions and analysis (7 papers), Electron and X-Ray Spectroscopy Techniques (6 papers) and Force Microscopy Techniques and Applications (5 papers). Mathias Senoner is often cited by papers focused on Ion-surface interactions and analysis (7 papers), Electron and X-Ray Spectroscopy Techniques (6 papers) and Force Microscopy Techniques and Applications (5 papers). Mathias Senoner collaborates with scholars based in Germany, Switzerland and Italy. Mathias Senoner's co-authors include Wolfgang E. S. Unger, J. Voigt, A. Maaßdorf, Knut Rurack, Thomas Wirth, I. Rückmann, Mikko Ritala, Jörg Raabe, Konstantins Jefimovs and Tero Pilvi and has published in prestigious journals such as Biochimica et Biophysica Acta (BBA) - Bioenergetics, Analytical and Bioanalytical Chemistry and Applied Physics A.

In The Last Decade

Mathias Senoner

21 papers receiving 457 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Mathias Senoner Germany 11 165 150 137 107 95 22 471
H. Zeijlemaker Netherlands 12 137 0.8× 151 1.0× 125 0.9× 86 0.8× 42 0.4× 20 430
Conrad Escher Switzerland 14 123 0.7× 136 0.9× 161 1.2× 63 0.6× 77 0.8× 21 454
Jean-Nicolas Longchamp Switzerland 13 77 0.5× 128 0.9× 179 1.3× 46 0.4× 82 0.9× 23 408
Günther Kassier Germany 15 175 1.1× 183 1.2× 216 1.6× 36 0.3× 130 1.4× 30 642
Christopher J. Kaplan United States 8 185 1.1× 235 1.6× 126 0.9× 39 0.4× 35 0.4× 14 489
Alexander V. Yakubovich Germany 13 152 0.9× 112 0.7× 292 2.1× 79 0.7× 34 0.4× 38 583
Sercan Keskin Germany 11 111 0.7× 158 1.1× 134 1.0× 24 0.2× 46 0.5× 22 512
Kenneth R. Beyerlein Germany 15 87 0.5× 62 0.4× 408 3.0× 66 0.6× 157 1.7× 32 687
R. A. McCorkle United States 11 206 1.2× 166 1.1× 73 0.5× 20 0.2× 63 0.7× 24 374
Clemens Weninger United States 15 102 0.6× 228 1.5× 114 0.8× 14 0.1× 235 2.5× 24 548

Countries citing papers authored by Mathias Senoner

Since Specialization
Citations

This map shows the geographic impact of Mathias Senoner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mathias Senoner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mathias Senoner more than expected).

Fields of papers citing papers by Mathias Senoner

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mathias Senoner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mathias Senoner. The network helps show where Mathias Senoner may publish in the future.

Co-authorship network of co-authors of Mathias Senoner

This figure shows the co-authorship network connecting the top 25 collaborators of Mathias Senoner. A scholar is included among the top collaborators of Mathias Senoner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mathias Senoner. Mathias Senoner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Unger, Wolfgang E. S., Mathias Senoner, Thomas Weimann, et al.. (2020). Introduction to lateral resolution and analysis area measurements in XPS. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 38(5). 14 indexed citations
3.
Unger, Wolfgang E. S., Mathias Senoner, Τ. Wirth, Sebastian Bütefisch, & I. Busch. (2017). Lateral Resolution of Imaging Surface-Analytical Instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and Related ISO Standards. Journal of Surface Analysis. 24(2). 123–128. 6 indexed citations
4.
Senoner, Mathias, A. Maaßdorf, W. Österle, et al.. (2014). Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards. Analytical and Bioanalytical Chemistry. 407(11). 3211–3217. 20 indexed citations
5.
6.
Senoner, Mathias & Wolfgang E. S. Unger. (2012). SIMS imaging of the nanoworld: applications in science and technology. Journal of Analytical Atomic Spectrometry. 27(7). 1050–1050. 61 indexed citations
7.
Senoner, Mathias, Thomas Wirth, & Wolfgang E. S. Unger. (2010). Imaging surface analysis: Lateral resolution and its relation to contrast and noise. Journal of Analytical Atomic Spectrometry. 25(9). 1440–1440. 33 indexed citations
8.
Vila‐Comamala, Joan, Konstantins Jefimovs, Jörg Raabe, et al.. (2009). Advanced thin film technology for ultrahigh resolution X-ray microscopy. Ultramicroscopy. 109(11). 1360–1364. 91 indexed citations
9.
Senoner, Mathias & Wolfgang E. S. Unger. (2006). Lateral resolution of secondary ion mass spectrometry–results of an inter‐laboratory comparison. Surface and Interface Analysis. 39(1). 16–25. 17 indexed citations
10.
Senoner, Mathias, Τ. Wirth, & Wolfgang E. S. Unger. (2005). Testing of Lateral Resolution in the Nanometre Range Using the BAM-L002 - Certified Reference Material: Application to ToF-SIMS 4 and NanoESCA Instruments. Journal of Surface Analysis. 12(2). 78–82. 8 indexed citations
11.
Senoner, Mathias, Τ. Wirth, Wolfgang E. S. Unger, et al.. (2004). BAM‐L002—a new type of certified reference material for length calibration and testing of lateral resolution in the nanometre range. Surface and Interface Analysis. 36(10). 1423–1426. 20 indexed citations
12.
Senoner, Mathias, Wolfgang E. S. Unger, & G. Reiners. (2003). Quality assurance in nano-scale analysis. Applied Physics A. 76(6). 919–921. 1 indexed citations
13.
Senoner, Mathias. (2001). Auswertung von Ringversuchen zur Verfahrensvalidierung. Materials Testing. 43(7-8). 298–303.
14.
Senoner, Mathias, et al.. (1999). <title>Digital forward error correction in optoelectronic image analysis: a case study</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3715. 313–320. 2 indexed citations
15.
Demoli, Nazif, et al.. (1998). <title>Problems in complex modulation of wavefronts using LCTV displays in optical correlation measurements</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3407. 508–515. 1 indexed citations
16.
Rurack, Knut, et al.. (1993). A new fluorescence probe for trace metal ions: Cation-dependent spectroscopic properties. Journal of Fluorescence. 3(3). 141–143. 44 indexed citations
17.
Senoner, Mathias. (1986). The nanosecond decay of variable chlorophyll fluorescence in leaves of higher plants. Biochimica et Biophysica Acta (BBA) - Bioenergetics. 849(3). 374–380. 7 indexed citations
18.
Senoner, Mathias, Walter Unger, & J. Voigt. (1980). Spatial and spectral distribution of emission from optically pumped CdS platelet lasers. physica status solidi (a). 58(1). 259–269. 5 indexed citations
19.
Voigt, J., et al.. (1979). Band parameters of CdS and CdSe single crystals determined from optical exciton spectra. physica status solidi (b). 91(1). 189–199. 84 indexed citations
20.
Voigt, J., Mathias Senoner, & I. Rückmann. (1976). Quantitative Analysis of Interference Structures in the Transmission Spectrum of Very Thin CdS Platelets. physica status solidi (b). 75(1). 213–219. 34 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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