Marcel Michling

516 total citations
8 papers, 451 citations indexed

About

Marcel Michling is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Marcel Michling has authored 8 papers receiving a total of 451 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Materials Chemistry, 5 papers in Electrical and Electronic Engineering and 3 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Marcel Michling's work include Semiconductor materials and devices (5 papers), Electronic and Structural Properties of Oxides (4 papers) and Catalytic Processes in Materials Science (3 papers). Marcel Michling is often cited by papers focused on Semiconductor materials and devices (5 papers), Electronic and Structural Properties of Oxides (4 papers) and Catalytic Processes in Materials Science (3 papers). Marcel Michling collaborates with scholars based in Germany, United States and Estonia. Marcel Michling's co-authors include Dieter Schmeißer, R. Fornari, K. Irmscher, Joel B. Varley, C. Janowitz, J. R. Weber, H. Dwelk, V. Scherer, A. Krapf and Mansour Mohamed and has published in prestigious journals such as Chemistry of Materials, Thin Solid Films and New Journal of Physics.

In The Last Decade

Marcel Michling

8 papers receiving 441 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Marcel Michling Germany	7	413	284	184	162	21	8	451
S.M. Liu China	5	332 0.8×	165 0.6×	193 1.0×	47 0.3×	10 0.5×	9	358
Madani Labed South Korea	12	322 0.8×	310 1.1×	150 0.8×	162 1.0×	14 0.7×	36	406
Hyunji An South Korea	9	302 0.7×	150 0.5×	190 1.0×	266 1.6×	13 0.6×	13	401
C. L. Shao China	7	374 0.9×	117 0.4×	205 1.1×	38 0.2×	16 0.8×	7	412
Aihua Tang China	7	298 0.7×	177 0.6×	198 1.1×	39 0.2×	33 1.6×	20	397
Haibo Tian China	9	276 0.7×	80 0.3×	251 1.4×	77 0.5×	29 1.4×	17	360
Thong Q. Ngo United States	13	434 1.1×	117 0.4×	375 2.0×	32 0.2×	10 0.5×	21	487
Zhen Zhu China	12	394 1.0×	250 0.9×	239 1.3×	141 0.9×	85 4.0×	36	448
Hemaunt Kumar India	11	333 0.8×	216 0.8×	125 0.7×	134 0.8×	20 1.0×	23	394
S.B. Lee South Korea	9	380 0.9×	85 0.3×	299 1.6×	29 0.2×	31 1.5×	10	425

Countries citing papers authored by Marcel Michling

Since Specialization

Citations

This map shows the geographic impact of Marcel Michling's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marcel Michling with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marcel Michling more than expected).

Fields of papers citing papers by Marcel Michling

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Marcel Michling. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marcel Michling. The network helps show where Marcel Michling may publish in the future.

Co-authorship network of co-authors of Marcel Michling

This figure shows the co-authorship network connecting the top 25 collaborators of Marcel Michling. A scholar is included among the top collaborators of Marcel Michling based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Marcel Michling. Marcel Michling is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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8 of 8 papers shown

Michling, Marcel & Dieter Schmeißer. (2012). Resonant Photoemission at the O1s threshold to characterize β-Ga₂O₃single crystals. IOP Conference Series Materials Science and Engineering. 34. 12002–12002. 43 indexed citations

Tallarida, Massimo, et al.. (2011). Growth of TiO<SUB>2</SUB> with Thermal and Plasma Enhanced Atomic Layer Deposition. Journal of Nanoscience and Nanotechnology. 11(9). 8049–8053. 12 indexed citations

Tallarida, Massimo, et al.. (2011). Atomic layer deposition reactor for fabrication of metal oxides. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 8(4). 1287–1292. 5 indexed citations

Tallarida, Massimo, et al.. (2011). In situ study of the atomic layer deposition of HfO2 on Si. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 30(1). 16 indexed citations

Tallarida, Massimo, et al.. (2011). Atomic layer deposition of nanolaminate oxide films on Si. Journal of Nanoparticle Research. 13(11). 5975–5983. 24 indexed citations

Schwarzkopf, Jutta, Albert Kwasniewski, M. Schmidbauer, et al.. (2011). Influence of Na on the structure of Bi4Ti3O12 films deposited by liquid-delivery spin MOCVD. Thin Solid Films. 519(17). 5754–5759. 7 indexed citations

Tallarida, Massimo, Kaupo Kukli, Marcel Michling, et al.. (2011). Substrate Reactivity Effects in the Atomic Layer Deposition of Aluminum Oxide from Trimethylaluminum on Ruthenium. Chemistry of Materials. 23(13). 3159–3168. 38 indexed citations

Janowitz, C., V. Scherer, Mansour Mohamed, et al.. (2011). Experimental electronic structure of In₂O₃and Ga₂O₃. New Journal of Physics. 13(8). 85014–85014. 306 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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