M.A. Styblinski

950 citations

54 papers · 641 indexed · h-index 12

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
Statistics, Probability and Uncertainty top 2%
- Probabilistic and Robust Engineering Design

Papers in ⓘ

Hardware and Architecture 15
- VLSI and Analog Circuit Testing 15
Statistics, Probability and Uncertainty 12
- Probabilistic and Robust Engineering Design 11

Co-authors: Ming Qu (8 shared papers)Andrzej Ruszczyński (1 shared paper)Jeson Chen (1 shared paper)R.M. Biernacki (1 shared paper)Min Huang (4 shared papers)Xu Gao (1 shared paper)Donald R. Smith (1 shared paper)Chanan Singh (1 shared paper)
Journals: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (7 papers)Microelectronics Reliability (3 papers)International Journal of Circuit Theory and Applications (2 papers)Electronics Letters (2 papers)Neural Networks (1 paper)
Partner nations: United States Poland Belgium

In The Last Decade

M.A. Styblinski

46 papers receiving 599 citations

Peers

Countries citing papers authored by M.A. Styblinski

Since Specialization

Citations

This map shows the geographic impact of M.A. Styblinski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.A. Styblinski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.A. Styblinski more than expected).

Fields of papers citing papers by M.A. Styblinski

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.A. Styblinski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.A. Styblinski. The network helps show where M.A. Styblinski may publish in the future.

Co-authors

The 13 scholars most cited alongside M.A. Styblinski, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M.A. Styblinski Line = papers co-authored together M.A. Styblinski links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 54 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Experiments in nonconvex optimization: Stochastic approximation with function smoothing and simulated annealing Neural Networks ·M.A. Styblinski, T.S. Tang	1990	152
2	Yield and Variability Optimization of Integrated Circuits J. C. Zhang, M.A. Styblinski	1995	84
3	Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·M.A. Styblinski, Leszek J. Opalski	1986	62
4	Signal Flow Graphs vs Fuzzy Cognitive Maps in application to qualitative circuit analysis International Journal of Man-Machine Studies ·M.A. Styblinski, Brian Meyer	1991	50
5	Stochastic approximation approach to statistical circuit design Electronics Letters ·M.A. Styblinski, Andrzej Ruszczyński	1983	27
6	IC Variability Minimization using a New Cp and Cpk Based Variability/Performance Measure. International Symposium on Circuits and Systems ·S.A. Aftab, M.A. Styblinski	1994	17
7	A systematic approach of statistical modeling and its application to CMOS circuits 1993 IEEE International Symposium on Circuits and Systems ·Jeson Chen, M.A. Styblinski	2002	17
8	Combination of interpolation and self-organizing approximation techniques-a new approach to circuit performance modeling IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·M.A. Styblinski, S.A. Aftab	1993	17
9	Formulation of the drift reliability optimization problem Microelectronics Reliability ·M.A. Styblinski	1991	17
10	Generalization of Yield Optimization Problem: Maximum Income Approach IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Leszek J. Opalski, M.A. Styblinski	1986	16
11	Problems of Yield Gradient Estimation for Truncated Probability Density Functions IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·M.A. Styblinski	1986	15
12	Efficient performance function interpolation scheme and its application to statistical circuit design International Journal of Circuit Theory and Applications ·R.M. Biernacki, M.A. Styblinski	1991	15
13	Phase compensation of an OTA-C integrator for high-frequency continuous-time filters Electronics Letters ·Ming Qu, M.A. Styblinski	1993	11
14	Statistical behavioral modeling of integrated circuits J.F. Swidzinski, M.A. Styblinski, Xu Gao	2002	11
15	Drift reliability optimization in IC design: generalized formulation and practical examples IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·M.A. Styblinski, Min Huang	1993	10
16	Reliability modeling of flexible manufacturing systems Microelectronics Reliability ·Petro Yuanidis, M.A. Styblinski, Donald R. Smith, Chanan Singh	1994	10
17	Yield optimization for nondifferentiable density functions using convolution techniques IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·T.S. Tang, M.A. Styblinski	1988	8
18	Parameter extraction for statistical IC modeling based on recursive inverse approximation IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Ming Qu, M.A. Styblinski	1997	8
19	Orthogonal array approach to gradient based yield optimization M.A. Styblinski, J.C. Zhang	2002	7
20	Design of experiments approach to gradient estimation and its application to CMOS circuit stochastic optimization J.C. Zhang, M.A. Styblinski	1991	7

About M.A. Styblinski

M.A. Styblinski is a scholar working on Hardware and Architecture, Statistics, Probability and Uncertainty, Management Science and Operations Research, Computational Theory and Mathematics and Industrial and Manufacturing Engineering, having authored 54 papers that have together received 641 indexed citations. Recurring topics across this work include VLSI and FPGA Design Techniques (26 papers), Low-power high-performance VLSI design (22 papers), VLSI and Analog Circuit Testing (15 papers), Analog and Mixed-Signal Circuit Design (12 papers), Probabilistic and Robust Engineering Design (11 papers), Optimal Experimental Design Methods (11 papers), Advanced Multi-Objective Optimization Algorithms (10 papers) and Manufacturing Process and Optimization (6 papers). The work is most often cited by research in Hardware and Architecture (148 citations), Statistics, Probability and Uncertainty (114 citations), Management Science and Operations Research (128 citations), Computational Theory and Mathematics (124 citations) and Electrical and Electronic Engineering (333 citations). M.A. Styblinski has collaborated with scholars based in United States, Poland and Belgium. Frequent co-authors include Ming Qu, Andrzej Ruszczyński, Jeson Chen, R.M. Biernacki, Min Huang, Xu Gao, Donald R. Smith, Chanan Singh, Minglu Qu and Anirvan M. Sengupta. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Microelectronics Reliability, International Journal of Circuit Theory and Applications, Electronics Letters and Neural Networks.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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