M. Zeller

2.7k total citations · 1 hit paper
26 papers, 2.5k citations indexed

About

M. Zeller is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, M. Zeller has authored 26 papers receiving a total of 2.5k indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 9 papers in Atomic and Molecular Physics, and Optics and 7 papers in Biomedical Engineering. Recurrent topics in M. Zeller's work include Silicon Carbide Semiconductor Technologies (7 papers), Semiconductor materials and devices (7 papers) and Metal and Thin Film Mechanics (5 papers). M. Zeller is often cited by papers focused on Silicon Carbide Semiconductor Technologies (7 papers), Semiconductor materials and devices (7 papers) and Metal and Thin Film Mechanics (5 papers). M. Zeller collaborates with scholars based in United States. M. Zeller's co-authors include C. D. Wagner, L. H. Gale, J. Ashley Taylor, R. Raymond, Lawrence E. Davis, Robert G. Hayes, Thomas P. Fehlner, Paul A. Grutsch, Stephen J. Hahn and John Ferrante and has published in prestigious journals such as Journal of the American Chemical Society, Journal of The Electrochemical Society and Langmuir.

In The Last Decade

M. Zeller

26 papers receiving 2.4k citations

Hit Papers

Empirical atomic sensitiv... 1981 2026 1996 2011 1981 500 1000 1.5k

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Zeller United States 14 1.4k 923 375 336 333 26 2.5k
Lawrence E. Davis United States 6 1.3k 0.9× 766 0.8× 473 1.3× 332 1.0× 270 0.8× 6 2.2k
L. H. Gale United States 6 1.5k 1.1× 884 1.0× 491 1.3× 382 1.1× 302 0.9× 9 2.6k
R. Raymond United States 8 1.9k 1.4× 1.1k 1.2× 559 1.5× 432 1.3× 427 1.3× 18 3.2k
P. Oelhafen Switzerland 15 1.7k 1.3× 1.1k 1.2× 599 1.6× 194 0.6× 470 1.4× 31 3.2k
G. Mattogno Italy 32 1.6k 1.2× 1.1k 1.2× 248 0.7× 188 0.6× 780 2.3× 127 3.1k
Gary W. Simmons United States 16 1.2k 0.8× 643 0.7× 331 0.9× 192 0.6× 319 1.0× 27 2.2k
E. Paparazzo Italy 25 1.5k 1.1× 645 0.7× 444 1.2× 309 0.9× 270 0.8× 108 2.4k
Brian R. Strohmeier United States 18 1.3k 1.0× 707 0.8× 295 0.8× 348 1.0× 266 0.8× 39 2.3k
Masaoki Oku Japan 28 2.1k 1.5× 1.2k 1.3× 393 1.0× 234 0.7× 275 0.8× 118 3.2k
J. Riga Belgium 31 1.1k 0.8× 1.2k 1.3× 400 1.1× 146 0.4× 345 1.0× 82 2.7k

Countries citing papers authored by M. Zeller

Since Specialization
Citations

This map shows the geographic impact of M. Zeller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Zeller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Zeller more than expected).

Fields of papers citing papers by M. Zeller

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Zeller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Zeller. The network helps show where M. Zeller may publish in the future.

Co-authorship network of co-authors of M. Zeller

This figure shows the co-authorship network connecting the top 25 collaborators of M. Zeller. A scholar is included among the top collaborators of M. Zeller based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Zeller. M. Zeller is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lei, Jih-Fen, et al.. (2013). Oxidation of Palladium-Chromium Alloys for High Temperature Applications. NASA Technical Reports Server (NASA). 1 indexed citations
2.
Ng, Lily, et al.. (1995). Surface Chemistry of Perfluoro Ethers: An Infrared Study of the Thermal Decomposition of (C2F5)2O on Al2O3. Langmuir. 11(1). 127–135. 36 indexed citations
3.
Ho, Chih‐Ming, et al.. (1995). Electrical resistance drift of molybdenum silicide thin film temperature sensors. Thin Solid Films. 260(2). 232–238. 10 indexed citations
4.
Zeller, M., et al.. (1993). Auger electron spectroscopy study of oxidation of a PdCr alloy used for high-temperature sensors. NASA Technical Reports Server (NASA). 5 indexed citations
5.
Petit, J. B. & M. Zeller. (1992). Electrical and Chemical Characterization of Contacts to Silicon Carbide. MRS Proceedings. 242. 4 indexed citations
6.
Bhatt, Himanshu Kumar, M. Zeller, & Hannes Will. (1992). Novel thin-film heat flux sensors. 7 indexed citations
7.
Berry, W.B., et al.. (1990). High Frequency Capacitance‐Voltage Characteristics of Thermally Grown SiO2 Films on β ‐ SiC. Journal of The Electrochemical Society. 137(1). 221–225. 26 indexed citations
8.
Berry, W.B., et al.. (1989). Ohmic Contacts on β-SiC. MRS Proceedings. 162. 11 indexed citations
9.
Zeller, M. & Stephen J. Hahn. (1988). The correlation of chemical structure and electrical conductivity in polypyrrole films by x‐ray photoelectron spectroscopy. Surface and Interface Analysis. 11(6-7). 327–334. 43 indexed citations
10.
Zeller, M., et al.. (1987). AES Studies of the M/SiC Interface with Metal Carbide Formers. MRS Proceedings. 97. 7 indexed citations
11.
Zeller, M., et al.. (1987). Thermally Activated Reactions of Titanium Thin Films with (100) 3C-SiC Substrates. MRS Proceedings. 97. 8 indexed citations
12.
Ferrante, John, et al.. (1986). Surface modification strategies for (100)3C-SiC. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 4(3). 1692–1695. 30 indexed citations
13.
Zeller, M., et al.. (1986). Stoichiometric changes in the surface of (100) cubic SiC caused by ion bombardment and annealing. Applied Surface Science. 25(4). 380–390. 29 indexed citations
14.
Hahn, Stephen J., et al.. (1986). Auger and infrared study of polypyrrole films: Evidence of chemical changes during electrochemical deposition and aging in air. Synthetic Metals. 14(1-2). 89–96. 33 indexed citations
15.
Zeller, M., et al.. (1984). Surface analysis studies on the corrosion resistance of Mo implanted Al alloys. Applications of Surface Science. 18(1-2). 63–85. 14 indexed citations
16.
Zeller, M., et al.. (1983). AES studies of phosphorus impurity on hydrogen embrittlement of Ni2Cr. Applications of Surface Science. 15(1-4). 129–148. 8 indexed citations
17.
Wagner, C. D., Lawrence E. Davis, M. Zeller, et al.. (1981). Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis. Surface and Interface Analysis. 3(5). 211–225. 1885 indexed citations breakdown →
18.
Keller, Richard W., Shang J. Yao, Janet M. Brown, Sidney K. Wolfson, & M. Zeller. (1980). Electrochemical removal of urea from physiological buffer as the basis for a regenerative dialysis system. Journal of Electroanalytical Chemistry. 116. 469–485. 17 indexed citations
19.
Keller, Richard W., Shang J. Yao, Janet M. Brown, Sidney K. Wolfson, & M. Zeller. (1980). 345 - Electrochemical removal of urea from physiological buffer as the basis for a regenerative dialysis system. Bioelectrochemistry and Bioenergetics. 7(3). 469–485. 21 indexed citations
20.
Grutsch, Paul A., M. Zeller, & Thomas P. Fehlner. (1973). Photoelectron spectroscopy of tin compounds. Inorganic Chemistry. 12(6). 1431–1433. 128 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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