T.M. Parrill

491 citations
18 papers · 427 · h-index 10

Impact in

Papers in

T.M. Parrill

18 papers receiving 416 citations

Peers

T.M. Parrill
Comparison fields: 5 of 47
  • Ceramics and Composites 52
  • Surfaces, Coatings and Films 54
  • Electronic, Optical and Magnetic Materials 90
  • Electrical and Electronic Engineering 279
  • Materials Chemistry 179
Replace Svetlana Rogojevic with:
Svetlana Rogojevic United States
M. Azizan France
V. G. Polovinkin Russia
Yoshinori Akamatsu Japan
Michael Laube Germany
Haijiang Yu China
A. Zenasni France
Xavier Orignac Portugal
Benjamin French United States
A. Walkiewicz‐Pietrzykowska Poland
T.M. Parrill relative to Svetlana Rogojevic United States Svetlana Rogojevic's profile →
Citations per field
00.5×
Svetlana Rogojevic · 1×
Citations per year

Countries citing papers authored by T.M. Parrill

Since Specialization
Citations

This map shows the geographic impact of T.M. Parrill's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.M. Parrill with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.M. Parrill more than expected).

Fields of papers citing papers by T.M. Parrill

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.M. Parrill. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.M. Parrill. The network helps show where T.M. Parrill may publish in the future.

Co-authors

The 15 scholars most cited alongside T.M. Parrill, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T.M. Parrill Line = papers co-authored together T.M. Parrill links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1 1991104
2 199271
3 198659
4 199449
5 198740
6 200320
7 199513
8 198712
9 198811
10 198610
11 19838
12 19927
13 19866
14 19855
15 20024
16 20023
17 20123
18 20052

About T.M. Parrill

T.M. Parrill is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Spectroscopy and Ceramics and Composites, having authored 18 papers that have together received 427 indexed citations. Recurring topics across this work include Semiconductor materials and devices (9 papers), Silicon Carbide Semiconductor Technologies (7 papers), Copper Interconnects and Reliability (5 papers), Silicon and Solar Cell Technologies (3 papers), Silicone and Siloxane Chemistry (2 papers), 3D IC and TSV technologies (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Aerogels and thermal insulation (2 papers). The work is most often cited by research in Ceramics and Composites (52 citations), Surfaces, Coatings and Films (54 citations), Electronic, Optical and Magnetic Materials (90 citations), Electrical and Electronic Engineering (279 citations) and Materials Chemistry (179 citations). T.M. Parrill has collaborated with scholars based in United States, Taiwan and Switzerland. Frequent co-authors include Y. W. Chung, R. Kaplan, V. M. Bermudez, Yip-Wah Chung, H.-J. Gossmann, L. Rubin, G. V. Chandrashekhar, L. Gignac, Aditya Agarwal and J. M. Poate. Their work appears in journals such as Surface Science, Journal of materials research/Pratt's guide to venture capital sources, JOM, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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