M. V. Yablonskikh

30 papers receiving 646 citations

Peers

M. V. Yablonskikh
Comparison fields: 5 of 39
  • Materials Chemistry 491
  • Electronic, Optical and Magnetic Materials 261
  • Electrical and Electronic Engineering 244
  • Atomic and Molecular Physics, and Optics 112
  • Condensed Matter Physics 62
Replace H. Rotella with:
H. Rotella France
J. C. Woicik United States
Masahiro Kunisu Japan
V. Krayzman United States
H. Belkhir Algeria
Hyeong‐Do Kim South Korea
Takaaki Sudayama Japan
G. B. Rayner United States
Teguh Citra Asmara Singapore
J.M. Chen Taiwan
M. V. Yablonskikh relative to H. Rotella France H. Rotella's profile →
Citations per field
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H. Rotella · 1×
Citations per year

Countries citing papers authored by M. V. Yablonskikh

Since Specialization
Citations

This map shows the geographic impact of M. V. Yablonskikh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. V. Yablonskikh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. V. Yablonskikh more than expected).

Fields of papers citing papers by M. V. Yablonskikh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. V. Yablonskikh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. V. Yablonskikh. The network helps show where M. V. Yablonskikh may publish in the future.

Co-authorship network of co-authors of M. V. Yablonskikh

This figure shows the co-authorship network connecting the top 25 collaborators of M. V. Yablonskikh. A scholar is included among the top collaborators of M. V. Yablonskikh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. V. Yablonskikh. M. V. Yablonskikh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 103
2 22
3 10
4 52
5 7
6 11
7 30
8 5
9 2
10 16
11 6
12 11
13
Resonant L-alpha,L-beta X-ray emission and L-3,L-2 X-ray absorption spectra of 3d metals in Co(2)MnZ (Z = Al, Ga, Sn, Sb) Heusler alloys as an element- selective probe of spin character of valence band
2
14 5
15 9
16 11
17 6
18 45
19 50
20 125

About M. V. Yablonskikh

M. V. Yablonskikh is a scholar working on Electronic, Optical and Magnetic Materials, Radiation and Surfaces, Coatings and Films, having authored 30 papers that have together received 657 indexed citations. Recurring topics across this work include Chalcogenide Semiconductor Thin Films (7 papers), Heusler alloys: electronic and magnetic properties (7 papers) and 2D Materials and Applications (6 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (261 citations), Materials Chemistry (491 citations) and Condensed Matter Physics (62 citations). M. V. Yablonskikh has collaborated with scholars based in Russia, Canada and Italy. Frequent co-authors include Yu. M. Yarmoshenko, E.Z. Kurmaev, M. Neumann, A. N. Titov, A. S. Shkvarin, А. И. Меренцов, Alexei Barinov, E. I. Shreder, Jürgen Braun and Thomas Schlathölter. Their work appears in journals such as The Journal of Chemical Physics, Nano Letters and Physical review. B, Condensed matter.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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