Kurt K. Christenson
- Electrical and Electronic Engineering
- Biomedical Engineering
- Automotive Engineering top 10%
- Surfaces, Coatings and Films top 10%
- Computational Mechanics
- Co-authors
- Michael J. RennJ. A. PaulsenJ. EadesR. ViswanathanT. J. WagenerG. J. PaparielloAniruddh MukherjiJeffery W. Butterbaugh
- Topics
- Semiconductor materials and devices (6 papers)Advanced Surface Polishing Techniques (5 papers)Nanomaterials and Printing Technologies (4 papers)
- Partner nations
- United States
In The Last Decade
Kurt K. Christenson
22 papers receiving 332 citations
Peers
Comparison fields: 5 of 59
- Electrical and Electronic Engineering 213
- Biomedical Engineering 148
- Automotive Engineering 113
- Surfaces, Coatings and Films 43
- Computational Mechanics 41
Countries citing papers authored by Kurt K. Christenson
This map shows the geographic impact of Kurt K. Christenson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kurt K. Christenson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kurt K. Christenson more than expected).
Fields of papers citing papers by Kurt K. Christenson
This network shows the impact of papers produced by Kurt K. Christenson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kurt K. Christenson. The network helps show where Kurt K. Christenson may publish in the future.
Co-authorship network of co-authors of Kurt K. Christenson
This figure shows the co-authorship network connecting the top 25 collaborators of Kurt K. Christenson. A scholar is included among the top collaborators of Kurt K. Christenson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kurt K. Christenson. Kurt K. Christenson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 195 | |
| 3 | 2 | |
| 4 | 21 | |
| 5 | Direct Printing of Circuit Boards Using Aerosol Jet | 30 |
| 6 | 10 | |
| 7 | 7 | |
| 8 | 4 | |
| 9 | 6 | |
| 10 | 1 | |
| 11 | 8 | |
| 12 | 1 | |
| 13 | 11 | |
| 14 | 0 | |
| 15 | 1 | |
| 16 | 26 | |
| 17 | 4 | |
| 18 | 1 | |
| 19 | 15 | |
| 20 | 12 |
About Kurt K. Christenson
Kurt K. Christenson is a scholar working on Structural Biology, Surfaces, Coatings and Films and Radiation, having authored 24 papers that have together received 368 indexed citations. Recurring topics across this work include Semiconductor materials and devices (6 papers), Advanced Surface Polishing Techniques (5 papers) and Nanomaterials and Printing Technologies (4 papers). The work is most often cited by research in Structural Biology (28 citations), Automotive Engineering (113 citations) and Surfaces, Coatings and Films (43 citations). Kurt K. Christenson has collaborated with scholars based in United States. Frequent co-authors include Michael J. Renn, J. A. Paulsen, J. Eades, R. Viswanathan, T. J. Wagener, G. J. Papariello, Aniruddh Mukherji, Jeffery W. Butterbaugh, L. Davis and M. C. Aronson. Their work appears in journals such as Physical review. B, Condensed matter, Journal of Pharmaceutical Sciences and Ultramicroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.