Kuan-Yu Fu
- Industrial and Manufacturing Engineering top 5%
- Electrical and Electronic Engineering
- Computer Vision and Pattern Recognition top 10%
- Computational Mechanics
- Mechanical Engineering
- Topics
- Semiconductor materials and devices (14 papers)Advancements in Semiconductor Devices and Circuit Design (11 papers)Integrated Circuits and Semiconductor Failure Analysis (5 papers)
- Cited by
- Industrial and Manufacturing EngineeringComputer Graphics and Computer-Aided DesignComputer Vision and Pattern Recognition
- Journals
- Applied Physics LettersJournal of Applied PhysicsIEEE Transactions on Pattern Analysis and Machine Intelligence
- Partner nations
- United StatesTaiwan
In The Last Decade
Kuan-Yu Fu
26 papers receiving 308 citations
Peers
Comparison fields: 5 of 56
- Industrial and Manufacturing Engineering 142
- Electrical and Electronic Engineering 93
- Computer Vision and Pattern Recognition 62
- Computational Mechanics 57
- Mechanical Engineering 46
Countries citing papers authored by Kuan-Yu Fu
This map shows the geographic impact of Kuan-Yu Fu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kuan-Yu Fu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kuan-Yu Fu more than expected).
Fields of papers citing papers by Kuan-Yu Fu
This network shows the impact of papers produced by Kuan-Yu Fu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kuan-Yu Fu. The network helps show where Kuan-Yu Fu may publish in the future.
Co-authorship network of co-authors of Kuan-Yu Fu
This figure shows the co-authorship network connecting the top 25 collaborators of Kuan-Yu Fu. A scholar is included among the top collaborators of Kuan-Yu Fu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kuan-Yu Fu. Kuan-Yu Fu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 9 | |
| 3 | 14 | |
| 4 | 11 | |
| 5 | 10 | |
| 6 | 2 | |
| 7 | 6 | |
| 8 | 1 | |
| 9 | 116 | |
| 10 | 1 | |
| 11 | 35 | |
| 12 | 2 | |
| 13 | 4 | |
| 14 | 8 | |
| 15 | 9 | |
| 16 | 44 | |
| 17 | 2 | |
| 18 | 6 | |
| 19 | 4 | |
| 20 | 3 |
About Kuan-Yu Fu
Kuan-Yu Fu is a scholar working on Computer Graphics and Computer-Aided Design, Industrial and Manufacturing Engineering and Electrical and Electronic Engineering, having authored 27 papers that have together received 330 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (142 citations), Computer Graphics and Computer-Aided Design (16 citations) and Computer Vision and Pattern Recognition (62 citations). Kuan-Yu Fu has collaborated with scholars based in United States and Taiwan. Frequent co-authors include Julius Τ. Tou, Ramesh Srinivasan, C.R. Liu, Qingyun Shi, Loren Jones and Ming‐Jer Chen. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Pattern Analysis and Machine Intelligence.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.