Kuan-Yu Fu
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- Manufacturing Process and Optimization 3
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- Semiconductor materials and devices 14
- Advancements in Semiconductor Devices and Circuit Design 11
- Integrated Circuits and Semiconductor Failure Analysis 5
- Ferroelectric and Negative Capacitance Devices 3
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- Fault Detection and Control Systems 3
- Advanced Control Systems Optimization 3
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- Copper Interconnects and Reliability 3
- Cited by
- Industrial and Manufacturing EngineeringComputer Graphics and Computer-Aided DesignComputer Vision and Pattern Recognition
- Journals
- Applied Physics Letters (2 papers)Journal of Applied Physics (2 papers)IEEE Transactions on Pattern Analysis and Machine Intelligence (1 paper)
- Partner nations
- United StatesTaiwan
In The Last Decade
Kuan-Yu Fu
26 papers receiving 308 citations
Peers
Comparison fields: 5 of 56
- Industrial and Manufacturing Engineering 142
- Computer Graphics and Computer-Aided Design 16
- Computer Vision and Pattern Recognition 62
- Computational Mechanics 57
- Geology 15
Countries citing papers authored by Kuan-Yu Fu
This map shows the geographic impact of Kuan-Yu Fu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kuan-Yu Fu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kuan-Yu Fu more than expected).
Fields of papers citing papers by Kuan-Yu Fu
This network shows the impact of papers produced by Kuan-Yu Fu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kuan-Yu Fu. The network helps show where Kuan-Yu Fu may publish in the future.
Co-authorship network
The 6 scholars most cited alongside Kuan-Yu Fu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 0 | |
| 2 | 2001 | 9 | |
| 3 | 1997 | 14 | |
| 4 | 1997 | 11 | |
| 5 | 1991 | 10 | |
| 6 | 1989 | 2 | |
| 7 | 1988 | 6 | |
| 8 | 1988 | 1 | |
| 9 | 1987 | 116 | |
| 10 | 1986 | 1 | |
| 11 | 1985 | 35 | |
| 12 | 1983 | 2 | |
| 13 | 1982 | 4 | |
| 14 | 1982 | 8 | |
| 15 | 1979 | 9 | |
| 16 | 1974 | 44 | |
| 17 | 1971 | 2 | |
| 18 | 1969 | 6 | |
| 19 | 1967 | 4 | |
| 20 | 1964 | 3 |
About Kuan-Yu Fu
Kuan-Yu Fu is a scholar working on Computer Graphics and Computer-Aided Design, Industrial and Manufacturing Engineering and Electrical and Electronic Engineering, having authored 27 papers that have together received 330 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Ferroelectric and Negative Capacitance Devices (3 papers), Fault Detection and Control Systems (3 papers), Advanced Control Systems Optimization (3 papers), Manufacturing Process and Optimization (3 papers) and Copper Interconnects and Reliability (3 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (142 citations), Computer Graphics and Computer-Aided Design (16 citations) and Computer Vision and Pattern Recognition (62 citations). Kuan-Yu Fu has collaborated with scholars based in United States and Taiwan. Frequent co-authors include Julius Τ. Tou, Ramesh Srinivasan, C.R. Liu, Qingyun Shi, Loren Jones and Ming‐Jer Chen. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Pattern Analysis and Machine Intelligence.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.