Kikuo Yamabe

2.5k total citations
180 papers, 1.9k citations indexed

About

Kikuo Yamabe is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Kikuo Yamabe has authored 180 papers receiving a total of 1.9k indexed citations (citations by other indexed papers that have themselves been cited), including 164 papers in Electrical and Electronic Engineering, 48 papers in Materials Chemistry and 37 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Kikuo Yamabe's work include Semiconductor materials and devices (156 papers), Advancements in Semiconductor Devices and Circuit Design (49 papers) and Integrated Circuits and Semiconductor Failure Analysis (39 papers). Kikuo Yamabe is often cited by papers focused on Semiconductor materials and devices (156 papers), Advancements in Semiconductor Devices and Circuit Design (49 papers) and Integrated Circuits and Semiconductor Failure Analysis (39 papers). Kikuo Yamabe collaborates with scholars based in Japan, United States and South Korea. Kikuo Yamabe's co-authors include Kenji Taniguchi, Norio Tokuda, Keitaro Imai, Satoshi Yamasaki, Ryu Hasunuma, Akira Uedono, Toyohiro Chikyow, Kenji Shiraishi, Hideyo Okushi and Naoto Umezawa and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Kikuo Yamabe

173 papers receiving 1.9k citations

Peers

Kikuo Yamabe
Kiyoshi Yasutake Japan
N. Rochat France
J.E. Bourée France
David Eon France
M. Schaepkens United States
Jean‐François de Marneffe Belgium
M. A. Capano United States
Masakiyo Matsumura Japan
A. Rahim Forouhi United States
Mengbing Huang United States
Kiyoshi Yasutake Japan
Kikuo Yamabe
Citations per year, relative to Kikuo Yamabe Kikuo Yamabe (= 1×) peers Kiyoshi Yasutake

Countries citing papers authored by Kikuo Yamabe

Since Specialization
Citations

This map shows the geographic impact of Kikuo Yamabe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kikuo Yamabe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kikuo Yamabe more than expected).

Fields of papers citing papers by Kikuo Yamabe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kikuo Yamabe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kikuo Yamabe. The network helps show where Kikuo Yamabe may publish in the future.

Co-authorship network of co-authors of Kikuo Yamabe

This figure shows the co-authorship network connecting the top 25 collaborators of Kikuo Yamabe. A scholar is included among the top collaborators of Kikuo Yamabe based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kikuo Yamabe. Kikuo Yamabe is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Higashi, Y., Koichi Kato, Masamichi Suzuki, et al.. (2017). Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. Microelectronics Reliability. 70. 12–21. 11 indexed citations
3.
Hasunuma, Ryu, et al.. (2016). Characterization of Interface State Density of SiO2/SiC (000-1) Based on Oxygen Concentration at the Interface during Thermal Oxidation. ECS Transactions. 75(12). 201–206. 1 indexed citations
4.
Yamabe, Kikuo, et al.. (2015). Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-semiconductor capacitor. Microelectronics Reliability. 58. 185–191. 3 indexed citations
5.
Sato, Shintaro, et al.. (2015). Effect of series resistance on dielectric breakdown phenomenon of silicon carbide MOS capacitor. 84. 72–75. 1 indexed citations
6.
Hasunuma, Ryu, Yusuke Hayashi, Masahiro Ota, & Kikuo Yamabe. (2013). Microscopic Thickness Uniformity and Time-Dependent Dielectric Breakdown Lifetime Dispersion of Thermally Grown Ultrathin SiO. Japanese Journal of Applied Physics. 52(3). 4 indexed citations
7.
Tokuda, Norio, Hitoshi Umezawa, Kikuo Yamabe, Hideyo Okushi, & Satoshi Yamasaki. (2009). Growth of atomically step-free surface on diamond {111} mesas. Diamond and Related Materials. 19(4). 288–290. 32 indexed citations
8.
Hayashi, T., et al.. (2009). Vestiges of Multiple Progressive Dielectric Breakdown on HfSiON Surfaces. Japanese Journal of Applied Physics. 48(5S1). 05DD02–05DD02. 4 indexed citations
9.
Umezawa, Naoto, Kenji Shiraishi, Kazuyoshi Torii, et al.. (2007). Role of Nitrogen Atoms in Reduction of Electron Charge Traps in Hf-Based High- $\kappa$ Dielectrics. IEEE Electron Device Letters. 28(5). 363–365. 18 indexed citations
10.
Hasunuma, Ryu, et al.. (2005). Utilization of Si atomic steps for Cu nanowire fabrication. Science and Technology of Advanced Materials. 6(6). 667–670. 3 indexed citations
11.
Tokuda, Norio, et al.. (2004). Fabrication of Cu nanowires along atomic step edge lines on Si(111) substrates. Applied Surface Science. 237(1-4). 529–532. 7 indexed citations
12.
Tokuda, Norio, et al.. (2004). Fabrication of Cu nanowires along atomic step edge lines on Si(111) substrates. Applied Surface Science. 237(1-4). 529–532. 7 indexed citations
13.
Hojo, Daisuke, Norio Tokuda, & Kikuo Yamabe. (2003). Effect of SiO2Fence on Atomic Step Flow in Chemical Etching of Si Surface. Japanese Journal of Applied Physics. 42(Part 2, No. 5B). L561–L563. 6 indexed citations
14.
Momose, H.S., T. Morimoto, Kikuo Yamabe, & Hiroshi Iwai. (2002). Relationship between mobility and residual-mechanical-stress as measured by Raman spectroscopy for nitrided-oxide-gate MOSFETs. 65–68. 7 indexed citations
15.
Morimoto, T., H.S. Momose, Kikuo Yamabe, & Hiroshi Iwai. (1990). Prevention of boron penetration from p + poly gate by RTN produced thin gate oxide. European Solid-State Device Research Conference. 73–76. 3 indexed citations
16.
Hattori, Takeo, et al.. (1990). Structural studies of ultrathin silicon oxides and their interfaces by XPS. Applied Surface Science. 41-42. 416–419. 13 indexed citations
17.
Imai, Keitaro & Kikuo Yamabe. (1990). Nonplanar silicon oxidation in dry O2+NF3. Applied Physics Letters. 56(3). 280–282. 14 indexed citations
18.
Yamabe, Kikuo. (1989). Thin thermally grown SiO2 films.. Bulletin of the Japan Institute of Metals. 28(1). 14–21. 1 indexed citations
19.
Yamaguchi, Hiroaki, et al.. (1988). Si-SiO_2 Interface Structures : Chemical Shifts in Si 2p Photoelectron Spectra : Surfaces, Interfaces and Films. Japanese Journal of Applied Physics. 27(8). 1 indexed citations
20.
Yamabe, Kikuo, Kenji Taniguchi, & Yoshiaki Matsushita. (1983). Thickness Dependence of Dielectric Breakdown Failure of Thermal SiO2 Films. Reliability physics. 184–190. 31 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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