Kees Beenakker

455 total citations
41 papers, 374 citations indexed

About

Kees Beenakker is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, Kees Beenakker has authored 41 papers receiving a total of 374 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 22 papers in Materials Chemistry and 10 papers in Computational Mechanics. Recurrent topics in Kees Beenakker's work include Thin-Film Transistor Technologies (24 papers), Silicon Nanostructures and Photoluminescence (11 papers) and Laser Material Processing Techniques (9 papers). Kees Beenakker is often cited by papers focused on Thin-Film Transistor Technologies (24 papers), Silicon Nanostructures and Photoluminescence (11 papers) and Laser Material Processing Techniques (9 papers). Kees Beenakker collaborates with scholars based in Netherlands, Japan and United States. Kees Beenakker's co-authors include Ryoichi Ishihara, Ming He, Sten Vollebregt, Tatsuya Shimoda, Yasushi Hiroshima, Said Hamdioui, Satoshi Inoue, Erik Jan Marinissen, Mottaqiallah Taouil and Vikas Rana and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

Kees Beenakker

39 papers receiving 354 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Kees Beenakker Netherlands 11 305 174 86 50 31 41 374
Michael Algasinger Germany 8 271 0.9× 190 1.1× 152 1.8× 14 0.3× 33 1.1× 12 326
Jeffrey Lam Singapore 8 195 0.6× 37 0.2× 70 0.8× 22 0.4× 35 1.1× 76 261
M. T. Wu Taiwan 11 226 0.7× 207 1.2× 68 0.8× 4 0.1× 16 0.5× 16 368
M.M. Jevtić Serbia 10 264 0.9× 91 0.5× 69 0.8× 13 0.3× 9 0.3× 55 305
Dominik Suwito Germany 13 429 1.4× 98 0.6× 61 0.7× 15 0.3× 3 0.1× 32 445
Warren Montgomery United States 10 409 1.3× 32 0.2× 186 2.2× 21 0.4× 13 0.4× 34 463
R.G.R. Weemaes Netherlands 6 282 0.9× 98 0.6× 75 0.9× 10 0.2× 2 0.1× 13 312
Ricardo Cotrin Teixeira Brazil 7 140 0.5× 53 0.3× 69 0.8× 7 0.1× 5 0.2× 40 177
Saul Winderbaum Australia 8 380 1.2× 169 1.0× 170 2.0× 31 0.6× 19 436
K. Yamakawa Japan 10 194 0.6× 93 0.5× 52 0.6× 5 0.1× 15 0.5× 31 255

Countries citing papers authored by Kees Beenakker

Since Specialization
Citations

This map shows the geographic impact of Kees Beenakker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kees Beenakker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kees Beenakker more than expected).

Fields of papers citing papers by Kees Beenakker

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kees Beenakker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kees Beenakker. The network helps show where Kees Beenakker may publish in the future.

Co-authorship network of co-authors of Kees Beenakker

This figure shows the co-authorship network connecting the top 25 collaborators of Kees Beenakker. A scholar is included among the top collaborators of Kees Beenakker based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kees Beenakker. Kees Beenakker is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Tang, Jiaqi, et al.. (2015). Decapsulation of Multichip BOAC Devices with Exposed Copper Metallization Using Atmospheric Pressure Microwave Induced Plasma. Proceedings - International Symposium for Testing and Failure Analysis. 81030. 480–490. 4 indexed citations
2.
Vollebregt, Sten, Sourish Banerjee, Kees Beenakker, & Ryoichi Ishihara. (2013). Thermal conductivity of low temperature grown vertical carbon nanotube bundles measured using the three-ω method. Applied Physics Letters. 102(19). 6 indexed citations
3.
Vollebregt, Sten, Sourish Banerjee, Kees Beenakker, & Ryoichi Ishihara. (2013). Size-Dependent Effects on the Temperature Coefficient of Resistance of Carbon Nanotube Vias. IEEE Transactions on Electron Devices. 60(12). 4085–4089. 22 indexed citations
4.
Vollebregt, Sten, H. Schellevis, Kees Beenakker, & Ryoichi Ishihara. (2013). Carbon nanotube vias fabricated at back-end of line compatible temperature using a novel CoAl catalyst. 50. 1–3. 3 indexed citations
5.
Vollebregt, Sten, et al.. (2012). Contact resistance of low-temperature carbon nanotube vertical interconnects | NIST. IEEE Transactions on Nanotechnology. 1 indexed citations
6.
Ishihara, Ryoichi, et al.. (2010). Location- and Orientation-Controlled (100) and (110) Single-Grain Si TFTs Without Seed Substrate. IEEE Transactions on Electron Devices. 57(9). 2348–2352. 2 indexed citations
7.
Ishihara, Ryoichi, et al.. (2010). Strained Single-Grain Silicon n- and p-Channel Thin-Film Transistors by Excimer Laser. IEEE Electron Device Letters. 31(4). 308–310. 4 indexed citations
8.
Taouil, Mottaqiallah, Said Hamdioui, Kees Beenakker, & Erik Jan Marinissen. (2010). Test Cost Analysis for 3D Die-to-Wafer Stacking. 435–441. 46 indexed citations
9.
Ishihara, Ryoichi, et al.. (2009). High Performance n- and p-channel Strained Single Grain Silicon TFTs using Excimer Laser. MRS Proceedings. 1153. 1 indexed citations
10.
Derakhshandeh, Jaber, et al.. (2009). Stacking of Single-Grain Thin-Film Transistors. Japanese Journal of Applied Physics. 48(3S2). 03B015–03B015. 12 indexed citations
11.
Ishihara, Ryoichi, et al.. (2008). Formation of Location-Controlled Germanium Grains by Excimer Laser. ECS Meeting Abstracts. MA2008-02(35). 2277–2277.
12.
Ishihara, Ryoichi, et al.. (2008). Location and Crystallographic Orientation Control of Si Grains through Combined Metal Induced Lateral Crystalization and µ-Czochralski Process. Japanese Journal of Applied Physics. 47(3S). 1880–1880. 8 indexed citations
13.
Ishihara, Ryoichi, et al.. (2008). Reliability Analysis of Single Grain Si TFT using 2D Simulation. ECS Meeting Abstracts. MA2008-02(35). 2273–2273. 1 indexed citations
14.
Ishihara, Ryoichi, et al.. (2008). Reliability Analysis of Single Grain Si TFT using 2D Simulation. ECS Transactions. 16(9). 109–114. 3 indexed citations
15.
Rana, Vikas, Ryoichi Ishihara, Yasushi Hiroshima, et al.. (2007). Single-Grain Si TFTs and Circuits Inside Location-Controlled Grains Fabricated Using a Capping Layer of $\hbox{SiO}_{2}$. IEEE Transactions on Electron Devices. 54(1). 124–130. 14 indexed citations
16.
Rana, Vikas, Ryoichi Ishihara, Yasushi Hiroshima, et al.. (2006). Capping Layer on Thin Si Film for µ-Czochralski Process with Excimer Laser Crystallization. Japanese Journal of Applied Physics. 45(5S). 4340–4340. 16 indexed citations
17.
Ishihara, Ryoichi, Y. van Andel, Xun Cao, et al.. (2006). A Novel Selected Area Laser Assisted (SALA) System for Crystallization and Doping Processes in Low-Temperature Poly-Si Thin-Film Transistors. IEICE Transactions on Electronics. E89-C(10). 1377–1382. 1 indexed citations
18.
He, Ming, et al.. (2006). Agglomeration of amorphous silicon film with high energy density excimer laser irradiation. Thin Solid Films. 515(5). 2872–2878. 29 indexed citations
19.
Rana, Vikas, Ryoichi Ishihara, Yasushi Hiroshima, et al.. (2005). Dependence of Single-Crystalline Si TFT Characteristics on the Channel Position Inside a Location-Controlled Grain. IEEE Transactions on Electron Devices. 52(12). 2622–2628. 37 indexed citations
20.
Rana, Vikas, Ryoichi Ishihara, Yasushi Hiroshima, et al.. (2004). High Performance P-Channel Single-Crystalline Si TFTs Fabricated Inside a Location-Controlled Grain by μ-Czochralski Process( Electronic Displays). 87(11). 1943–1947. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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