Heui Jae Pahk
- Mechanical Engineering top 10%
- Biomedical Engineering
- Computational Mechanics top 10%
- Computer Vision and Pattern Recognition top 10%
- Control and Systems Engineering top 10%
- Co-authors
- Jongho ParkYoung Sam KimGaram ChoiSeung-Woo LeeSeongryong KimJeong-Yun LeeJae-Ho KimMin‐Soo Kim
- Topics
- Optical measurement and interference techniques (12 papers)Advanced Measurement and Metrology Techniques (9 papers)Surface Roughness and Optical Measurements (8 papers)
- Partner nations
- South KoreaSwitzerlandUnited States
In The Last Decade
Heui Jae Pahk
29 papers receiving 401 citations
Peers
Comparison fields: 5 of 47
- Mechanical Engineering 191
- Biomedical Engineering 144
- Computational Mechanics 119
- Computer Vision and Pattern Recognition 112
- Control and Systems Engineering 97
Countries citing papers authored by Heui Jae Pahk
This map shows the geographic impact of Heui Jae Pahk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Heui Jae Pahk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Heui Jae Pahk more than expected).
Fields of papers citing papers by Heui Jae Pahk
This network shows the impact of papers produced by Heui Jae Pahk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Heui Jae Pahk. The network helps show where Heui Jae Pahk may publish in the future.
Co-authorship network of co-authors of Heui Jae Pahk
This figure shows the co-authorship network connecting the top 25 collaborators of Heui Jae Pahk. A scholar is included among the top collaborators of Heui Jae Pahk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Heui Jae Pahk. Heui Jae Pahk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 4 | |
| 3 | 0 | |
| 4 | 22 | |
| 5 | 14 | |
| 6 | 4 | |
| 7 | 6 | |
| 8 | 4 | |
| 9 | 1 | |
| 10 | Precise Edge Detection Method Using Sigmoid Function in Blurry and Noisy Image for TFT-LCD 2D Critical Dimension Measurement | 9 |
| 11 | 14 | |
| 12 | 14 | |
| 13 | 20 | |
| 14 | 9 | |
| 15 | 5 | |
| 16 | 1 | |
| 17 | 21 | |
| 18 | 2 | |
| 19 | 13 | |
| 20 | A Comprehensive Investigation of Active Vibration Isolation Systems Using An Air Spring | 2 |
About Heui Jae Pahk
Heui Jae Pahk is a scholar working on Media Technology, Industrial and Manufacturing Engineering and Structural Biology, having authored 31 papers that have together received 432 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (12 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (53 citations), Computational Mechanics (119 citations) and Computer Vision and Pattern Recognition (112 citations). Heui Jae Pahk has collaborated with scholars based in South Korea, Switzerland and United States. Frequent co-authors include Jongho Park, Young Sam Kim, Garam Choi, Seung-Woo Lee, Seongryong Kim, Jeong-Yun Lee, Jae-Ho Kim, Min‐Soo Kim, Sung‐Hoon Ahn and Ying‐Jun Quan. Their work appears in journals such as Optics Express, IEEE Access and International Journal of Machine Tools and Manufacture.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.