Heui Jae Pahk

572 total citations
31 papers, 432 citations indexed

About

Heui Jae Pahk is a scholar working on Mechanical Engineering, Computer Vision and Pattern Recognition and Computational Mechanics. According to data from OpenAlex, Heui Jae Pahk has authored 31 papers receiving a total of 432 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Mechanical Engineering, 12 papers in Computer Vision and Pattern Recognition and 9 papers in Computational Mechanics. Recurrent topics in Heui Jae Pahk's work include Optical measurement and interference techniques (12 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). Heui Jae Pahk is often cited by papers focused on Optical measurement and interference techniques (12 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). Heui Jae Pahk collaborates with scholars based in South Korea, Switzerland and United States. Heui Jae Pahk's co-authors include Jongho Park, Young Sam Kim, Seung-Woo Lee, Garam Choi, Seongryong Kim, Jeong-Yun Lee, Jae-Ho Kim, Mingyu Kim, Ying‐Jun Quan and Seung Woo Lee and has published in prestigious journals such as Optics Express, IEEE Access and International Journal of Machine Tools and Manufacture.

In The Last Decade

Heui Jae Pahk

29 papers receiving 401 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Heui Jae Pahk South Korea 13 191 144 119 112 97 31 432
Wei-Yao Hsu Taiwan 13 234 1.2× 259 1.8× 109 0.9× 70 0.6× 67 0.7× 58 480
Heui-Jae Pahk South Korea 13 178 0.9× 86 0.6× 136 1.1× 145 1.3× 30 0.3× 36 382
Zexiao Li China 13 232 1.2× 328 2.3× 127 1.1× 88 0.8× 22 0.2× 40 472
Yindi Cai China 15 377 2.0× 220 1.5× 99 0.8× 126 1.1× 28 0.3× 41 512
Kate Medicus United States 10 285 1.5× 229 1.6× 52 0.4× 44 0.4× 18 0.2× 32 366
Rainer Tutsch Germany 12 258 1.4× 134 0.9× 92 0.8× 203 1.8× 15 0.2× 91 504
Hsin-Ta Hsieh Taiwan 13 129 0.7× 169 1.2× 103 0.9× 28 0.3× 11 0.1× 25 362
Tim King United Kingdom 12 343 1.8× 116 0.8× 124 1.0× 30 0.3× 157 1.6× 29 572
G. Jäger Germany 12 315 1.6× 181 1.3× 134 1.1× 76 0.7× 38 0.4× 42 486
Sonko Osawa Japan 14 576 3.0× 153 1.1× 168 1.4× 211 1.9× 33 0.3× 55 669

Countries citing papers authored by Heui Jae Pahk

Since Specialization
Citations

This map shows the geographic impact of Heui Jae Pahk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Heui Jae Pahk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Heui Jae Pahk more than expected).

Fields of papers citing papers by Heui Jae Pahk

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Heui Jae Pahk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Heui Jae Pahk. The network helps show where Heui Jae Pahk may publish in the future.

Co-authorship network of co-authors of Heui Jae Pahk

This figure shows the co-authorship network connecting the top 25 collaborators of Heui Jae Pahk. A scholar is included among the top collaborators of Heui Jae Pahk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Heui Jae Pahk. Heui Jae Pahk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kim, Youngjoon, et al.. (2025). Snapshot angle-resolved channeled spectroscopic micro-ellipsometry for thin-film characterization. Applied Optics. 64(12). 3391–3391.
2.
Kim, Min‐Soo, et al.. (2022). Surface Nanopatterned Shape Memory Alloy (SMA)‐Based Photosensitive Artificial Muscle (Advanced Optical Materials 5/2022). Advanced Optical Materials. 10(5). 4 indexed citations
3.
4.
Kim, Min‐Soo, et al.. (2021). Surface Nanopatterned Shape Memory Alloy (SMA)‐Based Photosensitive Artificial Muscle. Advanced Optical Materials. 10(5). 22 indexed citations
5.
Choi, Garam, et al.. (2020). Single-shot multispectral angle-resolved ellipsometry. Applied Optics. 59(21). 6296–6296. 14 indexed citations
6.
Pahk, Heui Jae, et al.. (2020). Active Contour Method Based Sub-pixel Critical Dimension Measurement of Thin Film Transistor Liquid Crystal Display (TFT-LCD) Patterns. International Journal of Precision Engineering and Manufacturing. 21(5). 831–841. 4 indexed citations
7.
Kim, Seung-Jae, et al.. (2019). Generating a True Color Image with Data from Scanning White-Light Interferometry by Using a Fourier Transform. Current Optics and Photonics. 3(5). 408–414. 4 indexed citations
8.
Kim, SangYun & Heui Jae Pahk. (2018). A Method for Improving Resolution and Critical Dimension Measurement of an Organic Layer Using Deep Learning Superresolution. Current Optics and Photonics. 2(2). 153–164. 1 indexed citations
9.
Lee, Seung Woo, et al.. (2018). Precise Edge Detection Method Using Sigmoid Function in Blurry and Noisy Image for TFT-LCD 2D Critical Dimension Measurement. 2(1). 69–78. 9 indexed citations
10.
Kim, Jae-Ho, et al.. (2017). Thickness Measurement of a Transparent Thin Film Using Phase Change in White-Light Phase-Shift Interferometry. Current Optics and Photonics. 1(5). 505–513. 14 indexed citations
11.
Lee, Jeong-Yun, et al.. (2017). Robust defect detection method for a non-periodic TFT-LCD pad area. International Journal of Precision Engineering and Manufacturing. 18(8). 1093–1102. 14 indexed citations
12.
Pahk, Heui Jae, et al.. (2015). Fast focus and astigmatism correction algorithm for critical dimension measurement using electron microscopy. International Journal of Precision Engineering and Manufacturing. 16(9). 1941–1947. 3 indexed citations
13.
Pahk, Heui Jae, et al.. (2015). Residual vibration reduction of white-light scanning interferometry by input shaping. Optics Express. 23(1). 464–464. 20 indexed citations
14.
Pahk, Heui Jae, et al.. (2014). Critical dimension measurement of transparent film layers by multispectral imaging. Optics Express. 22(14). 17370–17370. 9 indexed citations
15.
Pahk, Heui Jae, et al.. (2012). The optimum projection angle of fringe projection for ball grid array inspection based on reflectance analysis. The International Journal of Advanced Manufacturing Technology. 67(5-8). 1597–1607. 5 indexed citations
16.
Pahk, Heui Jae, et al.. (2011). A new and effective 3D measurement system for micro solder bump. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8321. 83212J–83212J. 1 indexed citations
17.
Pahk, Heui Jae, et al.. (2010). Design, modeling, and testing of a novel 6-DOF micropositioning stage with low profile and low parasitic motion. The International Journal of Advanced Manufacturing Technology. 55(1-4). 163–176. 21 indexed citations
18.
Pahk, Heui Jae, et al.. (2000). <title>Vision-based precision inspection system for profile and performance of small and micro gears using the intelligent image processing techniques and virtual master gears</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4222. 48–53. 2 indexed citations
19.
Pahk, Heui Jae, et al.. (1996). Precision inspection system for aircraft parts having very thin features based on CAD/CAI integration. The International Journal of Advanced Manufacturing Technology. 12(6). 442–449. 13 indexed citations
20.
Cho, Dong‐Woo, et al.. (1993). A Comprehensive Investigation of Active Vibration Isolation Systems Using An Air Spring. 305–322. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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