Junichi Uchikoshi

514 total citations
41 papers, 366 citations indexed

About

Junichi Uchikoshi is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Mechanical Engineering. According to data from OpenAlex, Junichi Uchikoshi has authored 41 papers receiving a total of 366 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 24 papers in Biomedical Engineering and 15 papers in Mechanical Engineering. Recurrent topics in Junichi Uchikoshi's work include Advanced Surface Polishing Techniques (14 papers), Advanced Measurement and Metrology Techniques (12 papers) and Silicon Nanostructures and Photoluminescence (11 papers). Junichi Uchikoshi is often cited by papers focused on Advanced Surface Polishing Techniques (14 papers), Advanced Measurement and Metrology Techniques (12 papers) and Silicon Nanostructures and Photoluminescence (11 papers). Junichi Uchikoshi collaborates with scholars based in Japan and United States. Junichi Uchikoshi's co-authors include Shoichi Shimada, Naoya Ikawa, Hiroaki Tanaka, Kenta Arima, Mizuho Morita, Kentaro Kawai, Tatsuya Kawase, Yasuo Higashi, Hiroki Matsumura and Ryosuke Inoue and has published in prestigious journals such as Journal of Applied Physics, Japanese Journal of Applied Physics and CIRP Annals.

In The Last Decade

Junichi Uchikoshi

38 papers receiving 346 citations

Peers

Junichi Uchikoshi

EEE

AMPO

A. Tibrewala Germany

S. Hirsch Germany

Joachim Frühauf Germany

Masaki Michihata Japan

Mikio Deguchi Japan

Yohannes M. Desta United States

Jiunnjye Tsaur Japan

Karey Holland United States

V. Eyraud France

Kathleen C. Richardson United States

A. Tibrewala Germany

Junichi Uchikoshi

104 ×0.4

50 ×0.3

164 ×1.1

EEE

184 ×1.4

127 ×1.4

AMPO

Citations per year, relative to Junichi Uchikoshi Junichi Uchikoshi (= 1×) peers A. Tibrewala

Countries citing papers authored by Junichi Uchikoshi

Since Specialization

Citations

This map shows the geographic impact of Junichi Uchikoshi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Junichi Uchikoshi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Junichi Uchikoshi more than expected).

Fields of papers citing papers by Junichi Uchikoshi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Junichi Uchikoshi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Junichi Uchikoshi. The network helps show where Junichi Uchikoshi may publish in the future.

Co-authorship network of co-authors of Junichi Uchikoshi

This figure shows the co-authorship network connecting the top 25 collaborators of Junichi Uchikoshi. A scholar is included among the top collaborators of Junichi Uchikoshi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Junichi Uchikoshi. Junichi Uchikoshi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Oshikane, Yasushi, et al.. (2022). Electroluminescence in metal-oxide-semiconductor tunnel diodes with a crystalline silicon/silicon dioxide quantum well. Micro and Nanostructures. 166. 207228–207228. 1 indexed citations

Uchikoshi, Junichi, et al.. (2017). Photoetching method that provides improved silicon-on-insulator layer thickness uniformity in a defined area. Microelectronic Engineering. 180. 93–95. 1 indexed citations

Uchikoshi, Junichi, et al.. (2013). Absolute flatness measurements of silicon mirrors by a three-intersection method by near-infrared interferometry. Nanoscale Research Letters. 8(1). 275–275. 1 indexed citations

Matsumura, Hiroki, et al.. (2013). Profile measurement of concave spherical mirror and a flat mirror using a high-speed nanoprofiler. Nanoscale Research Letters. 8(1). 231–231. 6 indexed citations

Kojima, Takuya, et al.. (2013). Development of a high-speed nanoprofiler using normal vector tracing method for high-accuracy mirrors. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8884. 888410–888410. 2 indexed citations

Kawase, Tatsuya, et al.. (2013). Metal-assisted chemical etching of Ge(100) surfaces in water toward nanoscale patterning. Nanoscale Research Letters. 8(1). 151–151. 33 indexed citations

Kawai, Kentaro, Junichi Uchikoshi, Kenta Arima, & Mizuho Morita. (2013). Nomally-closed valve integration for pneumatic actuators. 288. 254–257. 1 indexed citations

Uchikoshi, Junichi, Yutaka Ie, Takabumi Nagai, et al.. (2012). Characterization of Si etching with N-fluoropyridinium salt. Current Applied Physics. 12. S29–S32. 2 indexed citations

Matsumura, Hiroki, et al.. (2012). Effects of a laser beam profile to measure an aspheric mirror on a high-speed nanoprofiler using normal vector tracing method. Current Applied Physics. 12. S47–S51. 2 indexed citations

10.

Arima, Kenta, et al.. (2011). Formation of Pyramidal Etch Pits Induced by Metallic Particles on Ge(100) Surfaces in Water. ECS Transactions. 41(5). 171–178. 3 indexed citations

11.

Kawase, Tatsuya, et al.. (2011). Characterization of Terraces and Steps on Cl-Terminated Ge(111) Surfaces After HCl Treatment in N<SUB>2</SUB> Ambient. Journal of Nanoscience and Nanotechnology. 11(4). 2968–2972. 3 indexed citations

12.

Higashi, Y., et al.. (2008). Development of surface gradient integrated profiler: precise coordinate determination of normal vector measured points by self-calibration method and new data analysis from normal vector to surface profile. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7077. 70770C–70770C. 2 indexed citations

13.

Uchikoshi, Junichi, et al.. (2008). Absolute Line Profile Measurements of Silicon Plane Mirrors by Near-Infrared Interferometry. Japanese Journal of Applied Physics. 47(12R). 8978–8978. 2 indexed citations

14.

Hashimoto, H, et al.. (2007). Photodetective Characteristics of Metal–Oxide–Semiconductor Tunneling Structure with Aluminum Grid Gate. Japanese Journal of Applied Physics. 46(4S). 2467–2467. 2 indexed citations

15.

Morita, Satoru, et al.. (2005). Development of Nano-Gap Device for Biosensor. 1 indexed citations

16.

Uchikoshi, Junichi, et al.. (1995). Straightness measurement using laser beam straight datum.. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2576. 315–322. 2 indexed citations

17.

Shimada, Shiro, et al.. (1995). Molecular dynamics analysis on microstructure of diamond turned surfaces.. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2576. 396–405. 2 indexed citations

18.

Shimada, Shoichi, Ryosuke Inoue, Junichi Uchikoshi, & Naoya Ikawa. (1995). <title>Molecular dynamics analysis on microstructure of diamond-turned surfaces</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2576. 396–405. 12 indexed citations

19.

Uchikoshi, Junichi, et al.. (1995). <title>Straightness measurement using laser beam straight datum</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2576. 315–322. 6 indexed citations

20.

Shimada, Shoichi, et al.. (1993). Molecular Dynamics Analysis of Cutting Force and Chip Formation Process in Microcutting.. Journal of the Japan Society for Precision Engineering. 59(12). 2015–2021. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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