Joon-Min Park

435 citations
13 papers · 66 · h-index 4

Impact in

Papers in

    • Advancements in Photolithography Techniques 9
    • 3D IC and TSV technologies 5
    • Integrated Circuits and Semiconductor Failure Analysis 2
    • Thin-Film Transistor Technologies 1
    • Advanced Surface Polishing Techniques 4
    • Nanofabrication and Lithography Techniques 2

Joon-Min Park

12 papers receiving 63 citations

Peers

Joon-Min Park
Comparison fields: 5 of 16
  • Surfaces, Coatings and Films 7
  • Electrical and Electronic Engineering 55
  • Materials Chemistry 27
  • Polymers and Plastics 6
  • Biomedical Engineering 18
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Citations per field
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Citations per year

Countries citing papers authored by Joon-Min Park

Since Specialization
Citations

This map shows the geographic impact of Joon-Min Park's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Joon-Min Park with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Joon-Min Park more than expected).

Fields of papers citing papers by Joon-Min Park

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Joon-Min Park. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Joon-Min Park. The network helps show where Joon-Min Park may publish in the future.

Co-authors

The 20 scholars most cited alongside Joon-Min Park, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Joon-Min Park Line = papers co-authored together Joon-Min Park links everyone, so they are left out of the graph.

All Works

13 of 13 papers shown
#Work
1 201233
2 200710
3 20189
4 20043
5 20092
6 20092
7 20092
8 20081
9 20081
10 20091
11 20081
12 20141
13 20090

About Joon-Min Park

Joon-Min Park is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Automotive Engineering, Control and Systems Engineering and Computer Vision and Pattern Recognition, having authored 13 papers that have together received 66 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (9 papers), 3D IC and TSV technologies (5 papers), Advanced Surface Polishing Techniques (4 papers), Nanofabrication and Lithography Techniques (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Thin-Film Transistor Technologies (1 paper), Image and Video Quality Assessment (1 paper) and Metal Alloys Wear and Properties (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (7 citations), Electrical and Electronic Engineering (55 citations), Materials Chemistry (27 citations), Polymers and Plastics (6 citations) and Biomedical Engineering (18 citations). Joon-Min Park has collaborated with scholars based in South Korea. Frequent co-authors include Hye-Keun Oh, Kwon‐Shik Park, Junho Lee, Jooyoo Hong, Hoon Jeong, Yong‐Kee Hwang, Junho Cho, Ilsin An, Kwanjung Yee and Eun‐jin Kim. Their work appears in journals such as Japanese Journal of Applied Physics, Current Nanoscience, SAE International Journal of Passenger Cars - Mechanical Systems, SID Symposium Digest of Technical Papers and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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