John M. Emmert
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 2%
- Computer Networks and Communications top 10%
- Artificial Intelligence
- Biomedical Engineering
- Co-authors
- Charles E. StroudM. AbramoviciDinesh BhatiaSaiyu RenJ. R. BaileyDragana NikolićJames H. LambertThomas L. Polmateer
- Topics
- VLSI and Analog Circuit Testing (21 papers)Physical Unclonable Functions (PUFs) and Hardware Security (18 papers)Integrated Circuits and Semiconductor Failure Analysis (14 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringComputer Networks and Communications
- Partner nations
- United States
In The Last Decade
John M. Emmert
34 papers receiving 487 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 445
- Hardware and Architecture 415
- Computer Networks and Communications 71
- Artificial Intelligence 50
- Biomedical Engineering 30
Countries citing papers authored by John M. Emmert
This map shows the geographic impact of John M. Emmert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John M. Emmert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John M. Emmert more than expected).
Fields of papers citing papers by John M. Emmert
This network shows the impact of papers produced by John M. Emmert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John M. Emmert. The network helps show where John M. Emmert may publish in the future.
Co-authorship network of co-authors of John M. Emmert
This figure shows the co-authorship network connecting the top 25 collaborators of John M. Emmert. A scholar is included among the top collaborators of John M. Emmert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John M. Emmert. John M. Emmert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 2 | |
| 3 | 4 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 0 | |
| 7 | 12 | |
| 8 | 1 | |
| 9 | 2 | |
| 10 | 63 | |
| 11 | 2 | |
| 12 | 3 | |
| 13 | 25 | |
| 14 | 1 | |
| 15 | 24 | |
| 16 | 18 | |
| 17 | 9 | |
| 18 | 76 | |
| 19 | On-Line Fault Tolerance for FPGA Interconnect with Roving STARs | 6 |
| 20 | 3 |
About John M. Emmert
John M. Emmert is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Software, having authored 39 papers that have together received 542 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (21 papers), Physical Unclonable Functions (PUFs) and Hardware Security (18 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). The work is most often cited by research in Hardware and Architecture (415 citations), Electrical and Electronic Engineering (445 citations) and Computer Networks and Communications (71 citations). John M. Emmert has collaborated with scholars based in United States. Frequent co-authors include Charles E. Stroud, M. Abramovici, Dinesh Bhatia, Saiyu Ren, J. R. Bailey, Dragana Nikolić, James H. Lambert, Thomas L. Polmateer, Boyang Wang and Anindya Roy. Their work appears in journals such as IEEE Access, Electronics Letters and IEEE Transactions on Engineering Management.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.