J.M. Dell

3.6k total citations
255 papers, 2.8k citations indexed

About

J.M. Dell is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, J.M. Dell has authored 255 papers receiving a total of 2.8k indexed citations (citations by other indexed papers that have themselves been cited), including 221 papers in Electrical and Electronic Engineering, 113 papers in Atomic and Molecular Physics, and Optics and 51 papers in Materials Chemistry. Recurrent topics in J.M. Dell's work include Advanced Semiconductor Detectors and Materials (94 papers), Semiconductor Quantum Structures and Devices (60 papers) and Photonic and Optical Devices (51 papers). J.M. Dell is often cited by papers focused on Advanced Semiconductor Detectors and Materials (94 papers), Semiconductor Quantum Structures and Devices (60 papers) and Photonic and Optical Devices (51 papers). J.M. Dell collaborates with scholars based in Australia, United States and Poland. J.M. Dell's co-authors include L. Faraone, C.A. Musca, J. Antoszewski, K.J. Winchester, Adrian Keating, Mariusz Martyniuk, Han Huang, Giacinta Parish, Yinong Liu and Brett Nener and has published in prestigious journals such as SHILAP Revista de lepidopterología, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

J.M. Dell

225 papers receiving 2.7k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J.M. Dell Australia 27 2.1k 1.1k 704 636 495 255 2.8k
Jerrold A. Floro United States 27 1.3k 0.6× 1.0k 0.9× 1.2k 1.7× 457 0.7× 703 1.4× 89 2.7k
M. Ettenberg United States 27 2.5k 1.2× 1.7k 1.5× 543 0.8× 482 0.8× 311 0.6× 133 3.2k
Tanemasa Asano Japan 24 1.7k 0.8× 637 0.6× 750 1.1× 510 0.8× 163 0.3× 225 2.3k
R. D. Twesten United States 27 1.7k 0.8× 1.1k 1.0× 1.1k 1.6× 468 0.7× 276 0.6× 59 2.9k
Ichiro Yonenaga Japan 33 2.9k 1.4× 1.7k 1.5× 2.3k 3.2× 975 1.5× 675 1.4× 277 4.4k
S. N. G. Chu United States 34 3.0k 1.4× 3.0k 2.7× 1.0k 1.4× 431 0.7× 436 0.9× 189 4.5k
Akira KINBARA Japan 30 1.2k 0.6× 949 0.8× 1.2k 1.6× 709 1.1× 815 1.6× 173 3.0k
Conal E. Murray United States 20 1.6k 0.7× 406 0.4× 1.1k 1.6× 427 0.7× 438 0.9× 104 2.6k
G.Y. Yeom South Korea 29 2.2k 1.0× 358 0.3× 1.4k 2.0× 500 0.8× 549 1.1× 223 3.0k
Changzheng Sun China 29 1.7k 0.8× 1.1k 1.0× 592 0.8× 479 0.8× 132 0.3× 259 2.6k

Countries citing papers authored by J.M. Dell

Since Specialization
Citations

This map shows the geographic impact of J.M. Dell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Dell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Dell more than expected).

Fields of papers citing papers by J.M. Dell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.M. Dell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Dell. The network helps show where J.M. Dell may publish in the future.

Co-authorship network of co-authors of J.M. Dell

This figure shows the co-authorship network connecting the top 25 collaborators of J.M. Dell. A scholar is included among the top collaborators of J.M. Dell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.M. Dell. J.M. Dell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Silva, Dilusha, et al.. (2025). Low-SWaP Solutions for Adaptive Multi-Spectral Infrared Imaging. Journal of Electronic Materials. 54(10). 8335–8349.
2.
3.
Pan, Wenwu, Renjie Gu, Dilusha Silva, et al.. (2024). Emerging technologies for infrared sensing and imaging. UWA Profiles and Research Repository (University of Western Australia). 33–33.
4.
Parish, Giacinta, et al.. (2023). Morphological and Optical Transformation of Gas Assisted Direct Laser Written Porous Silicon Films. Small. 19(32). e2300655–e2300655. 2 indexed citations
5.
Lee, Won-Jae, Gilberto A. Umana‐Membreno, J.M. Dell, & L. Faraone. (2015). Effect of CdS Processing Conditions on the Properties of CdS/Si Diodes and CdS/CdTe Thin-Film Solar Cells. IEEE Journal of Photovoltaics. 5(6). 1783–1790. 4 indexed citations
6.
Lei, Wen, Renjie Gu, J. Antoszewski, J.M. Dell, & L. Faraone. (2014). GaSb: A New Alternative Substrate for Epitaxial Growth of HgCdTe. Journal of Electronic Materials. 43(8). 2788–2794. 41 indexed citations
7.
Dell, J.M., et al.. (2014). Tailoring Anchor Etching Profiles During MEMS Release Using Microfluidic Sheathed Flow. Journal of Microelectromechanical Systems. 23(4). 918–926.
8.
Liu, Yinong, et al.. (2011). Thermally induced damages of PECVD SiNx thin films. Journal of materials research/Pratt's guide to venture capital sources. 26(19). 2552–2557. 7 indexed citations
9.
Parish, Giacinta, et al.. (2010). Chemical resistance of porous silicon: photolithographic applications. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 8(6). 1847–1850. 12 indexed citations
10.
Huang, Han, et al.. (2009). Nanostructural Characteristics and Mechanical Properties of Low Temperature Plasma Enhanced Chemical Vapor Deposited Silicon Nitride Thin Films. Journal of Nanoscience and Nanotechnology. 9(6). 3734–3741. 5 indexed citations
11.
Milne, Jason, et al.. (2008). Widely tunable Fabry-Perot optical filter using fixed-fixed beam actuators. 66–67. 3 indexed citations
12.
Antoszewski, J., Adrian Keating, K.J. Winchester, et al.. (2006). Tunable Fabry-Perot filters operating in the 3 to 5 μm range for infrared micro-spectrometer applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6186. 618608–618608. 6 indexed citations
13.
Winchester, K.J., Alexandra Suvorova, Yiping Liu, et al.. (2005). Effect of Deposition Conditions on Mechanical Properties of Low-Temperature PECVD Silicon Nitride Films. Thin Solid Films. 1 indexed citations
14.
Liu, Yinong, Xiaozhi Hu, Mark B. Bush, et al.. (2005). Effects of deposition temperature on the mechanical and physical properties of silicon nitride thin films. Journal of Applied Physics. 98(4). 26 indexed citations
15.
Sewell, Richard H., et al.. (2005). Mercury cadmium telluride/cadmium telluride distributed bragg reflectors for use with resonant cavity-enhanced detectors. Journal of Electronic Materials. 34(6). 710–715. 9 indexed citations
16.
Musca, C.A., et al.. (2005). Evaluation of plasma deposited silicon nitride thin films for microsystems technology. Journal of Microelectromechanical Systems. 14(5). 971–977. 5 indexed citations
17.
Redfern, D.A., John A. Thomas, C.A. Musca, J.M. Dell, & L. Faraone. (2005). Diffusion length measurements using laser beam induced current. 463–466. 1 indexed citations
18.
Huang, Han, Xiao Hu, Yinong Liu, et al.. (2005). Characterization of mechanical properties of silicon nitride thin films for MEMS devices by nanoindentation. UWA Profiles and Research Repository (University of Western Australia). 21(1). 13–16. 8 indexed citations
19.
20.
Antoszewski, J., J.M. Dell, L. Faraone, et al.. (1997). Magnetic field dependent Hall data analysis of electron transport in modulation-doped AlGaN/GaN heterostructures. Journal of Applied Physics. 82(6). 2996–3002. 42 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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