J.M. Dell
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- Advanced Semiconductor Detectors and Materials 94
- Photonic and Optical Devices 51
- Advanced MEMS and NEMS Technologies 50
- Chalcogenide Semiconductor Thin Films 44
- Semiconductor materials and devices 38
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- Semiconductor Quantum Structures and Devices 60
- Mechanical and Optical Resonators 26
- Condensed Matter Physics top 5%
- Instrumentation top 5%
- Mechanics of Materials top 2%
- Metal and Thin Film Mechanics 26
- Co-authors
- L. FaraoneC.A. MuscaJ. AntoszewskiK.J. WinchesterAdrian KeatingMariusz MartyniukHan HuangGiacinta Parish
- Cited by
- Electrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsCondensed Matter Physics
- Journals
- Journal of Electronic Materials (36 papers)Journal of Applied Physics (18 papers)Journal of Microelectromechanical Systems (13 papers)
- Partner nations
- AustraliaUnited StatesPoland
In The Last Decade
J.M. Dell
225 papers receiving 2.7k citations
Peers
Comparison fields: 5 of 74
- Electrical and Electronic Engineering 2.1k
- Atomic and Molecular Physics, and Optics 1.1k
- Condensed Matter Physics 390
- Instrumentation 89
- Mechanics of Materials 495
Countries citing papers authored by J.M. Dell
This map shows the geographic impact of J.M. Dell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Dell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Dell more than expected).
Fields of papers citing papers by J.M. Dell
This network shows the impact of papers produced by J.M. Dell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Dell. The network helps show where J.M. Dell may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.M. Dell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 0 | |
| 3 | 2024 | 0 | |
| 4 | 2023 | 2 | |
| 5 | 2015 | 4 | |
| 6 | 2014 | 41 | |
| 7 | 2014 | 0 | |
| 8 | 2011 | 7 | |
| 9 | 2010 | 12 | |
| 10 | 2009 | 5 | |
| 11 | 2008 | 3 | |
| 12 | 2006 | 6 | |
| 13 | Effect of Deposition Conditions on Mechanical Properties of Low-Temperature PECVD Silicon Nitride Films | 2005 | 1 |
| 14 | 2005 | 26 | |
| 15 | 2005 | 9 | |
| 16 | 2005 | 5 | |
| 17 | 2005 | 1 | |
| 18 | Characterization of mechanical properties of silicon nitride thin films for MEMS devices by nanoindentation | 2005 | 8 |
| 19 | 1999 | 2 | |
| 20 | 1997 | 42 |
About J.M. Dell
J.M. Dell is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Instrumentation, Condensed Matter Physics and Mechanics of Materials, having authored 255 papers that have together received 2.8k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (94 papers), Semiconductor Quantum Structures and Devices (60 papers), Photonic and Optical Devices (51 papers), Advanced MEMS and NEMS Technologies (50 papers), Chalcogenide Semiconductor Thin Films (44 papers), Semiconductor materials and devices (38 papers), Mechanical and Optical Resonators (26 papers) and Metal and Thin Film Mechanics (26 papers). The work is most often cited by research in Electrical and Electronic Engineering (2.1k citations), Atomic and Molecular Physics, and Optics (1.1k citations), Condensed Matter Physics (390 citations), Instrumentation (89 citations) and Mechanics of Materials (495 citations). J.M. Dell has collaborated with scholars based in Australia, United States and Poland. Frequent co-authors include L. Faraone, C.A. Musca, J. Antoszewski, K.J. Winchester, Adrian Keating, Mariusz Martyniuk, Han Huang, Giacinta Parish, Yinong Liu and Brett Nener. Their work appears in journals such as Journal of Electronic Materials, Journal of Applied Physics, Journal of Microelectromechanical Systems, Applied Physics Letters and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.