C.A. Musca
- Instrumentation top 5%
-
- Advanced Semiconductor Detectors and Materials 89
- Chalcogenide Semiconductor Thin Films 31
- Advanced MEMS and NEMS Technologies 16
- Semiconductor materials and devices 16
-
- Semiconductor Quantum Structures and Devices 42
- Mechanics of Materials top 5%
- Thermography and Photoacoustic Techniques 19
- Metal and Thin Film Mechanics 15
- Aerospace Engineering top 5%
- Infrared Target Detection Methodologies 19
- Co-authors
- L. FaraoneJ.M. DellJ. AntoszewskiD.A. RedfernMariusz MartyniukAdrian KeatingK.J. WinchesterRichard H. Sewell
- Cited by
- InstrumentationElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Journals
- Journal of Electronic Materials (29 papers)Journal of Applied Physics (8 papers)Applied Physics Letters (7 papers)
- Partner nations
- AustraliaUnited StatesPoland
In The Last Decade
C.A. Musca
126 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 49
- Instrumentation 89
- Electrical and Electronic Engineering 1.1k
- Atomic and Molecular Physics, and Optics 533
- Mechanics of Materials 267
- Aerospace Engineering 222
Countries citing papers authored by C.A. Musca
This map shows the geographic impact of C.A. Musca's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.A. Musca with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.A. Musca more than expected).
Fields of papers citing papers by C.A. Musca
This network shows the impact of papers produced by C.A. Musca. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.A. Musca. The network helps show where C.A. Musca may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C.A. Musca, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 11 | |
| 2 | 2007 | 16 | |
| 3 | 2007 | 5 | |
| 4 | 2006 | 6 | |
| 5 | 2006 | 0 | |
| 6 | 2006 | 1 | |
| 7 | 2006 | 18 | |
| 8 | 2006 | 0 | |
| 9 | 2005 | 9 | |
| 10 | 2005 | 5 | |
| 11 | 2005 | 1 | |
| 12 | Characterization of mechanical properties of silicon nitride thin films for MEMS devices by nanoindentation | 2005 | 8 |
| 13 | 2005 | 8 | |
| 14 | 2005 | 23 | |
| 15 | Evaluation Of Elastic Modulus And Stress Gradient Of PECVD Silicon Nitride Thin Films | 2004 | 8 |
| 16 | 2003 | 4 | |
| 17 | 2003 | 12 | |
| 18 | 2001 | 25 | |
| 19 | 1999 | 7 | |
| 20 | 1995 | 1 |
About C.A. Musca
C.A. Musca is a scholar working on Instrumentation, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 135 papers that have together received 1.3k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (89 papers), Semiconductor Quantum Structures and Devices (42 papers), Chalcogenide Semiconductor Thin Films (31 papers), Thermography and Photoacoustic Techniques (19 papers), Infrared Target Detection Methodologies (19 papers), Advanced MEMS and NEMS Technologies (16 papers), Semiconductor materials and devices (16 papers) and Metal and Thin Film Mechanics (15 papers). The work is most often cited by research in Instrumentation (89 citations), Electrical and Electronic Engineering (1.1k citations) and Atomic and Molecular Physics, and Optics (533 citations). C.A. Musca has collaborated with scholars based in Australia, United States and Poland. Frequent co-authors include L. Faraone, J.M. Dell, J. Antoszewski, D.A. Redfern, Mariusz Martyniuk, Adrian Keating, K.J. Winchester, Richard H. Sewell, E. P. Smith and Brett Nener. Their work appears in journals such as Journal of Electronic Materials, Journal of Applied Physics, Applied Physics Letters, Semiconductor Science and Technology and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.