J.M. Blanco
Impact in
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- Surface and Thin Film Phenomena
- Advanced Chemical Physics Studies
- Quantum and electron transport phenomena
- Force Microscopy Techniques and Applications
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- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Advanced Chemical Physics Studies 9
- Surface and Thin Film Phenomena 4
- Semiconductor Quantum Structures and Devices 3
- Semiconductor materials and interfaces 2
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- Electron and X-Ray Spectroscopy Techniques 2
- Co-authors
- F. FlóresRúben PérezJosé OrtegaR. MonrealCésar GonzálezPavel Jelı́nekV.A. EsaulovE. C. Goldberg
In The Last Decade
J.M. Blanco
15 papers receiving 401 citations
Peers
Comparison fields: 5 of 38
- Atomic and Molecular Physics, and Optics 277
- Surfaces, Coatings and Films 38
- Condensed Matter Physics 52
- Materials Chemistry 167
- Structural Biology 5
Countries citing papers authored by J.M. Blanco
This map shows the geographic impact of J.M. Blanco's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Blanco with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Blanco more than expected).
Fields of papers citing papers by J.M. Blanco
This network shows the impact of papers produced by J.M. Blanco. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Blanco. The network helps show where J.M. Blanco may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.M. Blanco, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2021 | 2 | |
| 2 | 2019 | 5 | |
| 3 | 2007 | 20 | |
| 4 | 2006 | 32 | |
| 5 | 2006 | 92 | |
| 6 | 2005 | 28 | |
| 7 | 2005 | 25 | |
| 8 | 2004 | 79 | |
| 9 | 2004 | 18 | |
| 10 | 2003 | 31 | |
| 11 | 2003 | 12 | |
| 12 | 2002 | 1 | |
| 13 | 2002 | 1 | |
| 14 | 2000 | 50 | |
| 15 | 1989 | 11 |
About J.M. Blanco
J.M. Blanco is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Pharmaceutical Science, Materials Chemistry and Radiation, having authored 15 papers that have together received 407 indexed citations. Recurring topics across this work include Advanced Chemical Physics Studies (9 papers), Surface and Thin Film Phenomena (4 papers), Semiconductor Quantum Structures and Devices (3 papers), Thermodynamic and Structural Properties of Metals and Alloys (2 papers), Semiconductor materials and interfaces (2 papers), Molecular Junctions and Nanostructures (2 papers), Material Dynamics and Properties (2 papers) and Electron and X-Ray Spectroscopy Techniques (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (277 citations), Surfaces, Coatings and Films (38 citations), Condensed Matter Physics (52 citations), Materials Chemistry (167 citations) and Structural Biology (5 citations). J.M. Blanco has collaborated with scholars based in Spain, Germany and Venezuela. Frequent co-authors include F. Flóres, Rúben Pérez, José Ortega, R. Monreal, César González, Pavel Jelı́nek, V.A. Esaulov, E. C. Goldberg, A. Martı́n-Rodero and A. Levy Yeyati. Their work appears in journals such as Physical Review B, Applied Surface Science, Physical review. B, Condensed matter, Materials Research Express and Journal of Physics Condensed Matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.