Jiyong Noh

519 total citations
15 papers, 396 citations indexed

About

Jiyong Noh is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, Jiyong Noh has authored 15 papers receiving a total of 396 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 2 papers in Biomedical Engineering. Recurrent topics in Jiyong Noh's work include Thin-Film Transistor Technologies (11 papers), ZnO doping and properties (7 papers) and Semiconductor materials and devices (5 papers). Jiyong Noh is often cited by papers focused on Thin-Film Transistor Technologies (11 papers), ZnO doping and properties (7 papers) and Semiconductor materials and devices (5 papers). Jiyong Noh collaborates with scholars based in South Korea, United States and Japan. Jiyong Noh's co-authors include Philip D. Rack, Peter K. Liaw, Wojciech Dmowski, T. Egami, Wei Guo, Joo Hyon Noh, Kwon‐Shik Park, Soo‐Young Yoon, Eric Kreit and Jason Heikenfeld and has published in prestigious journals such as Journal of The Electrochemical Society, Scientific Reports and ACS Applied Materials & Interfaces.

In The Last Decade

Jiyong Noh

14 papers receiving 386 citations

Peers

Countries citing papers authored by Jiyong Noh

Since Specialization

Citations

This map shows the geographic impact of Jiyong Noh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jiyong Noh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jiyong Noh more than expected).

Fields of papers citing papers by Jiyong Noh

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jiyong Noh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jiyong Noh. The network helps show where Jiyong Noh may publish in the future.

Co-authorship network of co-authors of Jiyong Noh

This figure shows the co-authorship network connecting the top 25 collaborators of Jiyong Noh. A scholar is included among the top collaborators of Jiyong Noh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jiyong Noh. Jiyong Noh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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15 of 15 papers shown

#	Work	Indexed citations
1	Enhancing InGaZnO transistor current through high-κ dielectrics and interface trap extraction using single-pulse charge pumping 2025 ·Scientific Reports ·(unknown), (unknown), (unknown), (unknown), (unknown), Jiyong Noh, Kwon‐Shik Park, Soo‐Young Yoon, Ji‐Hoon Ahn, Saeroonter Oh	1
2	Modeling and characterization of low frequency noise in self-aligned top-gate coplanar IGZO thin-film transistors 2024 ·Semiconductor Science and Technology ·Suhyeon Lee, (unknown), Dongho Lee, (unknown), (unknown), (unknown), Chan-Yong Jeong, (unknown), Jiyong Noh, (unknown), Sang-Hun Song, (unknown)	0
3	Cation Composition-Dependent Device Performance and Positive Bias Instability of Self-Aligned Oxide Semiconductor Thin-Film Transistors: Including Oxygen and Hydrogen Effect 2022 ·ACS Applied Materials & Interfaces ·Jun Tae Jang, Donguk Kim, (unknown), Jong Uk Bae, Jiyong Noh, Seok‐Woo Lee, Kwon‐Shik Park, (unknown), Soo Young Yoon, Changwook Kim, Yong‐Sung Kim, Saeroonter Oh, (unknown), (unknown)	19
4	Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors 2022 ·Advanced Electronic Materials ·Sungju Choi, Jingyu Park, (unknown), Changwook Kim, (unknown), Saeroonter Oh, (unknown), Jong Uk Bae, Jiyong Noh, (unknown), Kwon‐Shik Park, (unknown), Soo Young Yoon, Hyuck‐In Kwon, Dae Hwan Kim	33
5	Analysis of Drain-Induced Barrier Lowering in InGaZnO Thin-Film Transistors 2022 ·IEEE Transactions on Electron Devices ·(unknown), (unknown), (unknown), (unknown), Changwook Kim, (unknown), Jong Uk Bae, Jiyong Noh, Seok‐Woo Lee, Kwon‐Shik Park, (unknown), Soo‐Young Yoon, Yoon Kim, Dae Hwan Kim	11
6	High-Performance Hexagonal Tellurium Thin-Film Transistor Using Tellurium Oxide as a Crystallization Retarder 2022 ·IEEE Electron Device Letters ·Taikyu Kim, Cheol Hee Choi, Se Eun Kim, Jeong‐Kyu Kim, Jaeman Jang, (unknown), Jiyong Noh, Kwon‐Shik Park, (unknown), Soo‐Young Yoon, Jae Kyeong Jeong	16
7	Density-Dependent Microstructures and Electromechanical Properties of Amorphous InGaZnO₄ Semiconductors: An Ab Initio Study 2022 ·ACS Applied Electronic Materials ·(unknown), Seongil Im, Yong‐Sung Kim, (unknown), Jiyong Noh, Kwon‐Shik Park, (unknown), Soo‐Young Yoon	3
8	P‐14: Effects of Film Density on IGZO Based TFT Device Reliability 2022 ·SID Symposium Digest of Technical Papers ·Jaeyoon Park, Yong‐Sung Kim, (unknown), Sehee Park, (unknown), Jiyong Noh, Kwon‐Shik Park, (unknown), Soo‐Young Yoon	1
9	The Significance on Structural Modulation of Buffer and Gate Insulator for ALD Based InGaZnO TFT Applications 2021 ·IEEE Transactions on Electron Devices ·(unknown), (unknown), (unknown), (unknown), Jaeman Jang, Jiyong Noh, (unknown), (unknown), Soo‐Young Yoon, Woojin Jeon, Jin‐Seong Park	17
10	Study on the Lateral Carrier Diffusion and Source-Drain Series Resistance in Self-Aligned Top-Gate Coplanar InGaZnO Thin-Film Transistors 2019 ·Scientific Reports ·(unknown), Hee-Joong Kim, Dae‐Hwan Kim, (unknown), Sang-Hun Song, In-Tak Cho, Jiyong Noh, Pil Sang Yun, Seok‐Woo Lee, Kwon‐Shik Park, Soo‐Young Yoon, In Byeong Kang, Hyuck‐In Kwon	44
11	P‐2: Novel High Mobility Oxide TFT with Self‐Aligned S/D Regions Formed by Wet‐etch process 2016 ·SID Symposium Digest of Technical Papers ·Kwang Hwan Ji, Jiyong Noh, Pil Sang Yun, Jong Uk Bae, Kwon‐Shik Park, In‐Byeong Kang	13
12	New Application for Indium Gallium Zinc Oxide thin film transistors: A fully integrated Active Matrix Electrowetting Microfluidic Platform 2013 ·Jiyong Noh	1
13	Local Atomic Structure of a High-Entropy Alloy: An X-Ray and Neutron Scattering Study 2012 ·Metallurgical and Materials Transactions A ·Wei Guo, Wojciech Dmowski, Jiyong Noh, Philip D. Rack, Peter K. Liaw, T. Egami	178
14	Toward active-matrix lab-on-a-chip: programmable electrofluidic control enabled by arrayed oxide thin film transistors 2011 ·Lab on a Chip ·Joo Hyon Noh, Jiyong Noh, Eric Kreit, Jason Heikenfeld, Philip D. Rack	41
15	Quantitative Calculation of Oxygen Incorporation in Sputtered IGZO Films and the Impact on Transistor Properties 2011 ·Journal of The Electrochemical Society ·Seyeoul Kwon, Joo Hyon Noh, Jiyong Noh, Philip D. Rack	18

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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