Jeffrey Frey

937 total citations
27 papers, 679 citations indexed

About

Jeffrey Frey is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, Jeffrey Frey has authored 27 papers receiving a total of 679 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 3 papers in Surfaces, Coatings and Films. Recurrent topics in Jeffrey Frey's work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers) and Semiconductor materials and interfaces (5 papers). Jeffrey Frey is often cited by papers focused on Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers) and Semiconductor materials and interfaces (5 papers). Jeffrey Frey collaborates with scholars based in United States and Japan. Jeffrey Frey's co-authors include Timothy J. Maloney, Neil Goldsman, R.K. Cook, Lindor Henrickson, P.M. Smith, M. Inoue, F. A. Buot, Charles E. Hunt, D. V. Morgan and Masataka Inoue and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physics Today.

In The Last Decade

Jeffrey Frey

26 papers receiving 627 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jeffrey Frey United States 12 570 347 62 38 34 27 679
G. S. Kino United States 9 273 0.5× 144 0.4× 56 0.9× 50 1.3× 23 0.7× 27 376
R.E. Hayes United States 11 336 0.6× 277 0.8× 70 1.1× 47 1.2× 30 0.9× 37 425
Gideon Yoffe Australia 13 574 1.0× 285 0.8× 25 0.4× 23 0.6× 20 0.6× 50 624
T.M. Quist United States 9 372 0.7× 264 0.8× 66 1.1× 33 0.9× 19 0.6× 14 458
Marshall Wilson United States 12 440 0.8× 158 0.5× 111 1.8× 36 0.9× 32 0.9× 61 632
P.A. Kirkby United Kingdom 15 787 1.4× 548 1.6× 96 1.5× 44 1.2× 40 1.2× 37 869
E.G. Zaidman United States 14 280 0.5× 282 0.8× 93 1.5× 38 1.0× 20 0.6× 40 430
E. Garate United States 15 496 0.9× 522 1.5× 41 0.7× 16 0.4× 20 0.6× 65 718
S. P. Klepner United States 10 443 0.8× 210 0.6× 49 0.8× 70 1.8× 129 3.8× 19 570
J.E. Rowe United States 9 198 0.3× 242 0.7× 63 1.0× 27 0.7× 13 0.4× 55 374

Countries citing papers authored by Jeffrey Frey

Since Specialization
Citations

This map shows the geographic impact of Jeffrey Frey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey Frey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey Frey more than expected).

Fields of papers citing papers by Jeffrey Frey

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeffrey Frey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey Frey. The network helps show where Jeffrey Frey may publish in the future.

Co-authorship network of co-authors of Jeffrey Frey

This figure shows the co-authorship network connecting the top 25 collaborators of Jeffrey Frey. A scholar is included among the top collaborators of Jeffrey Frey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeffrey Frey. Jeffrey Frey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Frey, Jeffrey, et al.. (1994). An Integrated Efficient Method for Deep-Submicron EPROM/Flash Device Simulation Using Energy Transport Model (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD93)). IEICE Transactions on Electronics. 77(2). 166–173. 4 indexed citations
2.
Goldsman, Neil, et al.. (1993). RELY: A physics-based CAD tool for predicting time-dependent hot-electron induced degradation in MOSFET's. Solid-State Electronics. 36(6). 833–841. 7 indexed citations
3.
Henrickson, Lindor, Kazuhiko Hirakawa, Jeffrey Frey, & Toshiaki Ikoma. (1992). Application of the tight-binding Green’s function method to interface roughness in resonant tunneling heterostructures. Journal of Applied Physics. 71(8). 3883–3888. 9 indexed citations
4.
Goldsman, Neil, Lindor Henrickson, & Jeffrey Frey. (1991). A physics-based analytical/numerical solution to the Boltzmann transport equation for use in device simulation. Solid-State Electronics. 34(4). 389–396. 77 indexed citations
5.
Henrickson, Lindor, et al.. (1990). Enhanced reliability in Si MOSFETs with channel lengths under 0.2 micron. Solid-State Electronics. 33(10). 1275–1278. 11 indexed citations
6.
Goldsman, Neil, et al.. (1990). Efficient calculation of ionization coefficients in silicon from the energy distribution function. Journal of Applied Physics. 68(3). 1075–1081. 42 indexed citations
7.
8.
Furuyama, T. & Jeffrey Frey. (1984). A Vertical Capacitor Cell for ULSI DRAM's. Symposium on VLSI Technology. 16–17. 2 indexed citations
9.
Buot, F. A. & Jeffrey Frey. (1983). Effects of velocity overshoot on performance of GaAs devices, with design information. Solid-State Electronics. 26(7). 617–632. 19 indexed citations
10.
Cook, R.K. & Jeffrey Frey. (1982). AN EFFICIENT TECHNIQUE FOR TWO‐DIMENSIONAL SIMULATION OF VELOCITY OVERSHOOT EFFECTS IN Si AND GaAs DEVICES. COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering. 1(2). 65–87. 67 indexed citations
11.
Smith, P.M., Jeffrey Frey, & P. Chatterjee. (1981). High-field transport of holes in silicon. Applied Physics Letters. 39(4). 332–333. 15 indexed citations
12.
Morgan, D. V. & Jeffrey Frey. (1981). Correlation between Schottky barrier heights on compound semiconductors and metal and semiconductor electronegativities. Journal of Applied Physics. 52(9). 5702–5704. 3 indexed citations
13.
Smith, P.M., M. Inoue, & Jeffrey Frey. (1980). Electron velocity in Si and GaAs at very high electric fields. Applied Physics Letters. 37(9). 797–798. 79 indexed citations
14.
Inoue, Masataka & Jeffrey Frey. (1980). Electron-electron interaction and screening effects in hot electron transport in GaAs. Journal of Applied Physics. 51(8). 4234–4239. 13 indexed citations
15.
Frey, Jeffrey & T. Wada. (1979). Mobility, transit time and transconductance in submicrometre-gate-length m.e.s.f.e.t.s. Electronics Letters. 15(1). 26–28. 2 indexed citations
16.
17.
Frey, Jeffrey, et al.. (1978). Transient velocity characteristics of electrons in GaAs with Γ-L-X conduction band ordering. Journal of Applied Physics. 49(7). 4064–4068. 33 indexed citations
18.
Frey, Jeffrey, et al.. (1973). A High-Performance, Low-Cost Digitally Driven SEM System for Materials Studies and Microfabrication. Journal of Vacuum Science and Technology. 10(6). 1012–1015. 5 indexed citations
19.
Bowers, R. & Jeffrey Frey. (1972). Technology Assessment and Microwave Diodes. Scientific American. 226(2). 13–21. 8 indexed citations
20.
Matthews, Daryl & Jeffrey Frey. (1972). Growth of electromagnetic waves on the surface of a negative differential conductance material. Journal of Applied Physics. 43(12). 4981–4988. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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