Jean-Baptiste Kammerer
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- Magnetic Field Sensors Techniques 22
- Electrical and Bioimpedance Tomography 13
- Semiconductor materials and devices 7
- Advancements in Semiconductor Devices and Circuit Design 6
- Silicon Carbide Semiconductor Technologies 6
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- Sensor Technology and Measurement Systems 6
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- Magnetic properties of thin films 7
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- Non-Destructive Testing Techniques 7
Jean-Baptiste Kammerer
39 papers receiving 259 citations
Peers
Comparison fields: 5 of 32
- Electrical and Electronic Engineering 241
- Instrumentation 9
- Computer Networks and Communications 58
- Atomic and Molecular Physics, and Optics 66
- Mechanical Engineering 60
Countries citing papers authored by Jean-Baptiste Kammerer
This map shows the geographic impact of Jean-Baptiste Kammerer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jean-Baptiste Kammerer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jean-Baptiste Kammerer more than expected).
Fields of papers citing papers by Jean-Baptiste Kammerer
This network shows the impact of papers produced by Jean-Baptiste Kammerer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jean-Baptiste Kammerer. The network helps show where Jean-Baptiste Kammerer may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Jean-Baptiste Kammerer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | Transient Measurements of Avalanche Dynamics and Quenching in SPADs | 2024 | 0 |
| 3 | 2023 | 0 | |
| 4 | 2023 | 0 | |
| 5 | 2023 | 1 | |
| 6 | 2022 | 1 | |
| 7 | 2021 | 8 | |
| 8 | 2019 | 6 | |
| 9 | 2019 | 1 | |
| 10 | 2018 | 4 | |
| 11 | 2014 | 2 | |
| 12 | 2014 | 2 | |
| 13 | 2013 | 2 | |
| 14 | 3D electro-thermal simulations of analog ICs carried out with standard CAD tools and Verilog-A | 2011 | 10 |
| 15 | 2011 | 8 | |
| 16 | 2011 | 11 | |
| 17 | 2009 | 2 | |
| 18 | 2009 | 34 | |
| 19 | 2006 | 0 | |
| 20 | 2005 | 15 |
About Jean-Baptiste Kammerer
Jean-Baptiste Kammerer is a scholar working on Instrumentation, Electrical and Electronic Engineering and Biophysics, having authored 44 papers that have together received 274 indexed citations. Recurring topics across this work include Magnetic Field Sensors Techniques (22 papers), Electrical and Bioimpedance Tomography (13 papers), Non-Destructive Testing Techniques (7 papers), Magnetic properties of thin films (7 papers), Semiconductor materials and devices (7 papers), Sensor Technology and Measurement Systems (6 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers) and Silicon Carbide Semiconductor Technologies (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (241 citations), Instrumentation (9 citations) and Computer Networks and Communications (58 citations). Jean-Baptiste Kammerer has collaborated with scholars based in France, Switzerland and Iran. Frequent co-authors include Luc Hébrard, Christophe Lallement, Morgan Madec, Vincent Frick, F. Prégaldiny, P. Alnot, M. Hehn, A. Schuhl, Élodie Breton and Loïc Cuvillon. Their work appears in journals such as Sensors, IEEE Transactions on Electron Devices and Sensors and Actuators A Physical.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.