J. Viernow
Impact in
-
- Surface and Thin Film Phenomena
- Semiconductor materials and interfaces
- Magnetic properties of thin films
- Quantum and electron transport phenomena
Papers in
-
- Semiconductor materials and interfaces 5
- Surface and Thin Film Phenomena 4
- Semiconductor Quantum Structures and Devices 3
- Force Microscopy Techniques and Applications 1
- Co-authors
- Dmitri Y. PetrovykhF. K. MenF. J. HimpselJong‐Liang LinF. M. LeibsleА. КиракосянDongjea SeoJ. Wollschläger
- Journals
- Applied Surface Science (2 papers)Applied Physics Letters (2 papers)Physical review. B, Condensed matter (2 papers)Journal of Applied Physics (1 paper)Physical Review Letters (1 paper)
- Partner nations
- United StatesGermanyTaiwan
In The Last Decade
J. Viernow
10 papers receiving 522 citations
Peers
Comparison fields: 5 of 26
- Atomic and Molecular Physics, and Optics 393
- Structural Biology 9
- Condensed Matter Physics 68
- Surfaces, Coatings and Films 35
- Materials Chemistry 193
Countries citing papers authored by J. Viernow
This map shows the geographic impact of J. Viernow's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Viernow with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Viernow more than expected).
Fields of papers citing papers by J. Viernow
This network shows the impact of papers produced by J. Viernow. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Viernow. The network helps show where J. Viernow may publish in the future.
Co-authorship network
The 23 scholars most cited alongside J. Viernow, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2000 | 34 | |
| 2 | 2000 | 12 | |
| 3 | 1999 | 63 | |
| 4 | 1999 | 80 | |
| 5 | 1999 | 35 | |
| 6 | 1999 | 40 | |
| 7 | 1999 | 5 | |
| 8 | 1998 | 119 | |
| 9 | 1998 | 114 | |
| 10 | 1998 | 37 |
About J. Viernow
J. Viernow is a scholar working on General Materials Science, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electrical and Electronic Engineering and Condensed Matter Physics, having authored 10 papers that have together received 539 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (5 papers), Surface and Thin Film Phenomena (4 papers), Semiconductor Quantum Structures and Devices (3 papers), Semiconductor materials and devices (2 papers), Force Microscopy Techniques and Applications (1 paper), Graphene research and applications (1 paper), Photonic and Optical Devices (1 paper) and Copper Interconnects and Reliability (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (393 citations), Structural Biology (9 citations), Condensed Matter Physics (68 citations), Surfaces, Coatings and Films (35 citations) and Materials Chemistry (193 citations). J. Viernow has collaborated with scholars based in United States, Germany and Taiwan. Frequent co-authors include Dmitri Y. Petrovykh, F. K. Men, F. J. Himpsel, Jong‐Liang Lin, F. M. Leibsle, А. Киракосян, Dongjea Seo, J. Wollschläger, Klaus Schröder and H. Pfnür. Their work appears in journals such as Applied Surface Science, Applied Physics Letters, Physical review. B, Condensed matter, Journal of Applied Physics and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.