S. Vandrè
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- Surface and Thin Film Phenomena 12
- Semiconductor materials and interfaces 7
- Advanced Chemical Physics Studies 5
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques 7
- Condensed Matter Physics top 10%
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- Advanced Materials Characterization Techniques 4
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- Graphene research and applications 2
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- Semiconductor materials and devices 4
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- Ion-surface interactions and analysis 3
- Co-authors
- C. PreinesbergerT. KalkaM. Dähne‐PrietschM. DähneS. K. BeckerM. SancrottiA. GoldoniCinzia Cepek
- Cited by
- Atomic and Molecular Physics, and OpticsSurfaces, Coatings and FilmsCondensed Matter Physics
In The Last Decade
S. Vandrè
19 papers receiving 489 citations
Peers
Comparison fields: 5 of 21
- Atomic and Molecular Physics, and Optics 431
- Surfaces, Coatings and Films 58
- Condensed Matter Physics 80
- Biomedical Engineering 118
- Materials Chemistry 120
Countries citing papers authored by S. Vandrè
This map shows the geographic impact of S. Vandrè's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Vandrè with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Vandrè more than expected).
Fields of papers citing papers by S. Vandrè
This network shows the impact of papers produced by S. Vandrè. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Vandrè. The network helps show where S. Vandrè may publish in the future.
Co-authorship network
The 25 scholars most cited alongside S. Vandrè, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 79 | |
| 2 | 2001 | 17 | |
| 3 | 1999 | 23 | |
| 4 | 1999 | 9 | |
| 5 | 1999 | 47 | |
| 6 | 1998 | 137 | |
| 7 | 1998 | 4 | |
| 8 | 1998 | 26 | |
| 9 | 1998 | 8 | |
| 10 | 1998 | 10 | |
| 11 | 1998 | 5 | |
| 12 | 1998 | 9 | |
| 13 | 1998 | 21 | |
| 14 | 1997 | 19 | |
| 15 | 1997 | 23 | |
| 16 | 1997 | 6 | |
| 17 | 1995 | 42 | |
| 18 | 1995 | 5 | |
| 19 | 1995 | 7 |
About S. Vandrè
S. Vandrè is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Computational Mechanics and Electrical and Electronic Engineering, having authored 19 papers that have together received 497 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (12 papers), Semiconductor materials and interfaces (7 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Advanced Chemical Physics Studies (5 papers), Advanced Materials Characterization Techniques (4 papers), Semiconductor materials and devices (4 papers), Ion-surface interactions and analysis (3 papers) and Graphene research and applications (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (431 citations), Surfaces, Coatings and Films (58 citations), Condensed Matter Physics (80 citations), Biomedical Engineering (118 citations) and Materials Chemistry (120 citations). S. Vandrè has collaborated with scholars based in Germany, Italy and France. Frequent co-authors include C. Preinesberger, T. Kalka, M. Dähne‐Prietsch, M. Dähne, S. K. Becker, M. Sancrotti, A. Goldoni, Cinzia Cepek, G. Kaindl and E. Weschke. Their work appears in journals such as Surface Science, Physical review. B, Condensed matter, Journal of Electron Spectroscopy and Related Phenomena, Physical Review Letters and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.