J. van de Ven
- Electrical and Electronic Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Materials Chemistry
- Biomedical Engineering
- Molecular Biology
- Co-authors
- J.L. WeyherL.J. GilingJ. J. KellyJ. E. A. M. van den MeerakkerC. W. HilbersB. J. M. HarmsenJohn J. KellyJ.J.M. Binsma
- Topics
- Semiconductor materials and devices (12 papers)Semiconductor materials and interfaces (4 papers)Thin-Film Transistor Technologies (4 papers)
- Cited by
- Nuclear Energy and EngineeringAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Partner nations
- NetherlandsUnited StatesIndia
In The Last Decade
J. van de Ven
22 papers receiving 656 citations
Peers
Comparison fields: 5 of 53
- Electrical and Electronic Engineering 469
- Atomic and Molecular Physics, and Optics 325
- Materials Chemistry 225
- Biomedical Engineering 154
- Molecular Biology 76
Countries citing papers authored by J. van de Ven
This map shows the geographic impact of J. van de Ven's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. van de Ven with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. van de Ven more than expected).
Fields of papers citing papers by J. van de Ven
This network shows the impact of papers produced by J. van de Ven. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. van de Ven. The network helps show where J. van de Ven may publish in the future.
Co-authorship network of co-authors of J. van de Ven
This figure shows the co-authorship network connecting the top 25 collaborators of J. van de Ven. A scholar is included among the top collaborators of J. van de Ven based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. van de Ven. J. van de Ven is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 11 | |
| 3 | 48 | |
| 4 | 8 | |
| 5 | 5 | |
| 6 | 38 | |
| 7 | 14 | |
| 8 | 11 | |
| 9 | 11 | |
| 10 | 27 | |
| 11 | 38 | |
| 12 | 114 | |
| 13 | 53 | |
| 14 | 72 | |
| 15 | 17 | |
| 16 | 18 | |
| 17 | 1 | |
| 18 | 69 | |
| 19 | 78 | |
| 20 | 1 |
About J. van de Ven
J. van de Ven is a scholar working on Surfaces, Coatings and Films, Metals and Alloys and Electrical and Electronic Engineering, having authored 22 papers that have together received 717 indexed citations. Recurring topics across this work include Semiconductor materials and devices (12 papers), Semiconductor materials and interfaces (4 papers) and Thin-Film Transistor Technologies (4 papers). The work is most often cited by research in Nuclear Energy and Engineering (7 citations), Atomic and Molecular Physics, and Optics (325 citations) and Electrical and Electronic Engineering (469 citations). J. van de Ven has collaborated with scholars based in Netherlands, United States and India. Frequent co-authors include J.L. Weyher, L.J. Giling, J. J. Kelly, J. E. A. M. van den Meerakker, C. W. Hilbers, B. J. M. Harmsen, John J. Kelly and J.J.M. Binsma. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Molecular Biology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.